ENTRY C0192 20070501 C079C019200000001 SUBENT C0192001 20070501 C079C019200100001 BIB 7 10 C019200100002 INSTITUTE (1CANCRC) C019200100003 REFERENCE (J,NIM,218,141,1983) C019200100004 AUTHOR (J.A.Davies,T.E.Jackman,H.Plattner,I.Bubb) C019200100005 TITLE Absolute calibration of 14N(d,alpha) and 154(d,p) C019200100006 reactions for surface science C019200100007 METHOD Frozen gas technique C019200100008 STATUS Data taken from article. C019200100009 HISTORY (19981102C) C019200100010 (20051031C) DR Unit of EN corrected (MeV -> keV) C019200100011 (20061122A) DR LVL-NUMB corrected in subentry 3 C019200100012 ENDBIB 10 0 C019200100013 COMMON 2 3 C019200100014 EN ANG C019200100015 KEV ADEG C019200100016 972. 150. C019200100017 ENDCOMMON 3 0 C019200100018 ENDSUBENT 17 0 C019200199999 SUBENT C0192002 19981102 0000C019200200001 BIB 3 4 C019200200002 REACTION (8-O-16(D,P)8-O-17,PAR,DA) C019200200003 SAMPLE Ta2O5 sample and silicon wafer implanted with bismuth. C019200200004 MONITOR (83-BI-209(A,EL)83-BI-209,,DA) C019200200005 From ratio of 16O(d,p)/209Bi(a,el) = 760+-15. C019200200006 ENDBIB 4 0 C019200200007 NOCOMMON 0 0 C019200200008 DATA 5 1 C019200200009 E-LVL DATA DATA-ERR2 EN-NRM MONIT C019200200010 MEV MB/SR MB/SR MEV MB/SR C019200200011 0.87 13.2 0.3 2.0 1.007 +04 C019200200012 ENDDATA 3 0 C019200200013 ENDSUBENT 12 0 C019200299999 SUBENT C0192003 20070501 C079C019200300001 BIB 6 11 C019200300002 REACTION (7-N-14(D,A)6-C-12,PAR,DA) C019200300003 SAMPLE N2O, NO and NH3 samples. C019200300004 Typical frozen gas thickness 2-5 x 10-17 mol/cm2. C019200300005 DETECTOR (SOLST) ORTEC surface barrier detector for N2O targets.C019200300006 (SOLST) Depletion depth detector for NO and NH3 C019200300007 targets. C019200300008 MONITOR (8-O-16(D,P)8-O-17,PAR,DA) C019200300009 CORRECTION Corrected for small 14N peak near 17O peak in monitor C019200300010 reaction. C019200300011 ERR-ANALYS (DATA-ERR1) Total uncertainty C019200300012 (DATA-ERR2) No information on source of uncertainties. C019200300013 ENDBIB 11 0 C019200300014 COMMON 4 3 C019200300015 DATA-ERR1 E-LVL-NRM MONIT MONIT-ERR C019200300016 PER-CENT MEV MB/SR MB/SR C019200300017 3. 0.87 13.3 0.3 C019200300018 ENDCOMMON 3 0 C019200300019 DATA 3 2 C019200300020 LVL-NUMB DATA DATA-ERR2 C019200300021 NO-DIM MB/SR MB/SR C019200300022 1. 1.59 0.02 C019200300023 0. 0.107 0.002 C019200300024 ENDDATA 4 0 C019200300025 ENDSUBENT 24 0 C019200399999 SUBENT C0192004 19981102 0000C019200400001 BIB 6 12 C019200400002 REACTION (7-N-14(D,P)7-N-15,PAR,DA) C019200400003 SAMPLE N2O, NO and NH3 samples. C019200400004 Typical frozen gas thickness 2-5 x 10-17 mol/cm2. C019200400005 DETECTOR (SOLST) ORTEC surface barrier detector for N2O targets.C019200400006 (SOLST) Depletion depth detector for NO and NH3 C019200400007 targets. C019200400008 MONITOR (8-O-16(D,P)8-O-17,PAR,DA) C019200400009 Normalized to 16O(d,p)17O p1 cross section =13.3+-0.3 C019200400010 CORRECTION Corrected for small 14N peak near 17O peak in monitor C019200400011 reaction. C019200400012 ERR-ANALYS (DATA-ERR1) Total uncertainty C019200400013 (DATA-ERR2) No information on source of uncertainties. C019200400014 ENDBIB 12 0 C019200400015 COMMON 4 3 C019200400016 DATA-ERR1 E-LVL-NRM MONIT MONIT-ERR C019200400017 PER-CENT MEV MB/SR MB/SR C019200400018 3. 0.87 13.3 0.3 C019200400019 ENDCOMMON 3 0 C019200400020 DATA 4 5 C019200400021 LVL-NUMB LVL-NUMB DATA DATA-ERR2 C019200400022 NO-DIM NO-DIM MB/SR MB/SR C019200400023 0. 0.430 0.012 C019200400024 1. 2. 1.034 0.030 C019200400025 4. 1.124 0.030 C019200400026 5. 6.07 0.15 C019200400027 6. 0.76 0.05 C019200400028 ENDDATA 7 0 C019200400029 ENDSUBENT 28 0 C019200499999 ENDENTRY 4 0 C019299999999