ENTRY C0742 20220625 C074200000001 SUBENT C0742001 20220625 20231011 C074200100001 BIB 11 24 C074200100002 TITLE Cross sections for 170 degree backscattering of 4He C074200100003 from oxygen, aluminum and argon for 4He energies C074200100004 between 1.8 and 5.0 MeV C074200100005 AUTHOR (J.A.Leavitt,P.Stoss,D.B.Cooper,J.L.Seerveld, C074200100006 L.C.McIntyre Jr,R.E.Davis,S.Gutierrez,T.M.Reith) C074200100007 REFERENCE (J,NIM/B,15,296,1986) C074200100008 #doi:10.1016/0168-583X(86)90307-1 C074200100009 INSTITUTE (1USAUAZ) C074200100010 (1USAUSA) IBM Corporation, General Products Division, C074200100011 9000 South Rita Road, Tucson, Arizona, 85744, USA. C074200100012 FACILITY (VDG,1USAUAZ) 6 MV Van de Graaff accelerator. C074200100013 SAMPLE Argon-sputtered aluminum-oxide films on pyrolytic C074200100014 graphite substrates. C074200100015 METHOD (BCINT) C074200100016 DETECTOR (SIBAR) Surface barrier detector resolution = 14 keV. C074200100017 MONITOR (2-HE-4(A,EL)2-HE-4,,DA) Beam calibration checked C074200100018 using 31p(alpha,p0)34S resonances at 3.655 and 4.343 C074200100019 MeV.) C074200100020 STATUS (APRVD) Approved by L.McIntyre, 19 December 2000. C074200100021 HISTORY (20001129C) VM C074200100022 (20220625A) BP: Updated entry and DETECTOR, added doi C074200100023 and SAMPLE, digitized data (unobtainable data) per an C074200100024 NRDC decision for data sets that were published before C074200100025 2000 (C32 of WP2022-01) for subentries 2-3,5. C074200100026 ENDBIB 24 0 C074200100027 COMMON 2 3 C074200100028 ANG ANG-ERR C074200100029 ADEG ADEG C074200100030 170.0 0.5 C074200100031 ENDCOMMON 3 0 C074200100032 ENDSUBENT 31 0 C074200199999 SUBENT C0742002 20220625 20231011 C074200200001 BIB 5 10 C074200200002 REACTION (8-O-16(A,EL)8-O-16,,DA,,RTH) C074200200003 SAMPLE Sample 1: Al(39.7+-0.3%), O(60.0+-0.9%) , and Ar(0.4+- C074200200004 0.1%). Thickness in angstroms was 850+-35. Sample 2: C074200200005 Al(36.7+-0.3%), O(57.3+-0.9%), and Ar(6.1+- 0.1%). C074200200006 Thickness in angstroms was 1950+-100. Argon-sputtered C074200200007 aluminium-oxide films. C074200200008 ERR-ANALYS (DATA-ERR) No information on source of uncertainties. C074200200009 STATUS (TABLE) Table 2, page 298 of J,NIM/B,15,296,1986. C074200200010 (COREL,C0091002) data remeasured. C074200200011 HISTORY (20220625A) BP: Added SAMPLE, updated STATUS. C074200200012 ENDBIB 10 0 C074200200013 NOCOMMON 0 0 C074200200014 DATA 3 22 C074200200015 EN DATA DATA-ERR C074200200016 MEV NO-DIM PER-CENT C074200200017 3.45 0.88 2. C074200200018 3.50 0.97 2. C074200200019 3.55 1.02 2. C074200200020 3.60 1.06 2. C074200200021 3.65 1.09 2. C074200200022 3.70 1.12 2. C074200200023 3.75 1.15 2. C074200200024 3.80 1.20 2. C074200200025 3.85 1.28 2. C074200200026 3.90 1.50 2. C074200200027 3.95 1.12 2. C074200200028 4.00 1.21 2. C074200200029 4.10 1.32 2. C074200200030 4.20 1.43 2. C074200200031 4.30 1.62 2. C074200200032 4.40 2.00 5. C074200200033 4.50 2.45 5. C074200200034 4.60 3.20 5. C074200200035 4.70 4.40 5. C074200200036 4.80 6.00 5. C074200200037 4.90 7.80 5. C074200200038 4.95 9.20 5. C074200200039 ENDDATA 24 0 C074200200040 ENDSUBENT 39 0 C074200299999 SUBENT C0742003 20220625 20231011 C074200300001 BIB 5 7 C074200300002 REACTION (13-AL-27(A,EL)13-AL-27,,DA,,RTH) C074200300003 SAMPLE Sample 1: Al(39.7+-0.3%), O(60.0+-0.9%) , and Ar(0.4+- C074200300004 0.1%) . Thickness in angstroms was 850+-35. C074200300005 Argon-sputtered aluminium-oxide films. C074200300006 ERR-ANALYS (DATA-ERR) Experimental errors. C074200300007 STATUS (CURVE) Fig. 2, page 297 of J,NIM/B,15,296,1986. C074200300008 HISTORY (20220625A) BP: Digitized data. C074200300009 ENDBIB 7 0 C074200300010 COMMON 1 3 C074200300011 DATA-ERR C074200300012 PER-CENT C074200300013 4. C074200300014 ENDCOMMON 3 0 C074200300015 DATA 2 35 C074200300016 EN DATA C074200300017 MEV NO-DIM C074200300018 1.844 1.000 C074200300019 1.876 1.022 C074200300020 2.900 1.003 C074200300021 2.941 0.977 C074200300022 2.979 1.022 C074200300023 3.025 1.007 C074200300024 3.098 1.007 C074200300025 3.197 1.007 C074200300026 3.299 1.015 C074200300027 3.497 0.992 C074200300028 3.558 1.022 C074200300029 3.604 0.890 C074200300030 3.657 1.000 C074200300031 3.697 0.962 C074200300032 3.755 1.007 C074200300033 3.817 0.954 C074200300034 3.852 1.079 C074200300035 3.947 0.966 C074200300036 4.102 0.943 C074200300037 4.209 0.932 C074200300038 4.259 0.947 C074200300039 4.308 0.943 C074200300040 4.361 0.935 C074200300041 4.404 1.030 C074200300042 4.465 1.037 C074200300043 4.506 0.815 C074200300044 4.567 0.875 C074200300045 4.605 0.902 C074200300046 4.672 0.585 C074200300047 4.701 0.905 C074200300048 4.765 0.890 C074200300049 4.806 0.924 C074200300050 4.873 1.056 C074200300051 4.960 0.932 C074200300052 5.018 0.902 C074200300053 ENDDATA 37 0 C074200300054 ENDSUBENT 53 0 C074200399999 SUBENT C0742004 20220625 20231011 C074200400001 BIB 5 8 C074200400002 REACTION (18-AR-0(A,EL)18-AR-0,,DA,,RTH) C074200400003 SAMPLE Sample 2: Al(36.7+-0.3%), O(57.3+-0.9%) , and Ar(6.1+- C074200400004 0.1%) . Thickness in angstroms was 1950+-100. C074200400005 Argon-sputtered aluminium-oxide films. C074200400006 ERR-ANALYS (DATA-ERR) Experimental errors. C074200400007 STATUS (CURVE) Fig. 2, page 297 of J,NIM/B,15,296,1986. C074200400008 HISTORY (20220625A) BP: Replaced Sigma database digitized C074200400009 data with the NRDC digitization, added SAMPLE. C074200400010 ENDBIB 8 0 C074200400011 COMMON 1 3 C074200400012 DATA-ERR C074200400013 PER-CENT C074200400014 4. C074200400015 ENDCOMMON 3 0 C074200400016 DATA 2 62 C074200400017 EN DATA C074200400018 MEV NO-DIM C074200400019 1.849 1.004 C074200400020 1.960 1.009 C074200400021 2.054 1.014 C074200400022 2.160 1.000 C074200400023 2.258 0.975 C074200400024 2.365 0.996 C074200400025 2.467 1.016 C074200400026 2.510 1.016 C074200400027 2.566 1.016 C074200400028 2.617 0.996 C074200400029 2.668 1.007 C074200400030 2.707 1.012 C074200400031 2.774 0.992 C074200400032 2.817 1.017 C074200400033 2.869 1.022 C074200400034 2.920 1.017 C074200400035 2.975 1.018 C074200400036 3.022 0.998 C074200400037 3.065 1.038 C074200400038 3.120 1.008 C074200400039 3.172 1.028 C074200400040 3.234 0.964 C074200400041 3.274 1.014 C074200400042 3.325 1.009 C074200400043 3.364 1.004 C074200400044 3.384 1.049 C074200400045 3.408 1.014 C074200400046 3.427 1.014 C074200400047 3.451 1.059 C074200400048 3.478 1.019 C074200400049 3.510 1.014 C074200400050 3.545 1.015 C074200400051 3.577 0.990 C074200400052 3.581 1.035 C074200400053 3.600 1.010 C074200400054 3.628 0.980 C074200400055 3.632 1.025 C074200400056 3.663 1.035 C074200400057 3.695 1.030 C074200400058 3.730 1.015 C074200400059 3.750 0.986 C074200400060 3.778 1.040 C074200400061 3.781 0.961 C074200400062 3.829 0.991 C074200400063 3.880 1.031 C074200400064 3.947 1.051 C074200400065 3.986 1.011 C074200400066 4.033 1.031 C074200400067 4.092 1.012 C074200400068 4.140 1.007 C074200400069 4.179 1.027 C074200400070 4.238 0.978 C074200400071 4.289 0.983 C074200400072 4.340 0.983 C074200400073 4.391 1.013 C074200400074 4.443 0.998 C074200400075 4.490 0.973 C074200400076 4.545 0.964 C074200400077 4.580 0.964 C074200400078 4.647 0.954 C074200400079 4.690 0.969 C074200400080 4.690 1.024 C074200400081 ENDDATA 64 0 C074200400082 ENDSUBENT 81 0 C074200499999 SUBENT C0742005 20220628 20231011 C074200500001 BIB 5 7 C074200500002 REACTION (13-AL-27(A,EL)13-AL-27,,DA,,RTH) C074200500003 SAMPLE Sample 2: Al(36.7+-0.3%), O(57.3+-0.9%) , and Ar(6.1+- C074200500004 0.1%) . Thickness in angstroms was 1950+-100. C074200500005 Argon-sputtered aluminium-oxide films. C074200500006 ERR-ANALYS (DATA-ERR) Experimental errors. C074200500007 STATUS (CURVE) Fig. 2, page 297 of J,NIM/B,15,296,1986. C074200500008 HISTORY (20220625C) BP C074200500009 ENDBIB 7 0 C074200500010 COMMON 1 3 C074200500011 DATA-ERR C074200500012 PER-CENT C074200500013 4. C074200500014 ENDCOMMON 3 0 C074200500015 DATA 2 66 C074200500016 EN DATA C074200500017 MEV NO-DIM C074200500018 1.955 1.007 C074200500019 2.054 1.003 C074200500020 2.158 1.018 C074200500021 2.266 0.996 C074200500022 2.365 1.011 C074200500023 2.472 1.018 C074200500024 2.516 1.007 C074200500025 2.566 1.011 C074200500026 2.621 1.011 C074200500027 2.667 1.003 C074200500028 2.708 1.003 C074200500029 2.772 0.984 C074200500030 2.822 1.022 C074200500031 2.868 1.000 C074200500032 2.868 1.037 C074200500033 2.921 1.026 C074200500034 2.955 1.030 C074200500035 2.985 1.037 C074200500036 3.072 1.015 C074200500037 3.121 1.015 C074200500038 3.171 1.018 C074200500039 3.232 1.015 C074200500040 3.270 1.015 C074200500041 3.331 1.003 C074200500042 3.374 0.996 C074200500043 3.427 0.996 C074200500044 3.476 1.026 C074200500045 3.534 1.011 C074200500046 3.578 0.954 C074200500047 3.604 0.917 C074200500048 3.633 0.981 C074200500049 3.680 0.973 C074200500050 3.729 1.022 C074200500051 3.785 0.996 C074200500052 3.843 0.988 C074200500053 3.878 1.018 C074200500054 3.886 0.977 C074200500055 3.901 1.037 C074200500056 3.933 1.022 C074200500057 3.950 1.003 C074200500058 3.968 1.030 C074200500059 3.988 0.988 C074200500060 3.997 1.056 C074200500061 4.023 1.007 C074200500062 4.035 0.981 C074200500063 4.058 1.003 C074200500064 4.081 0.962 C074200500065 4.102 0.992 C074200500066 4.139 0.951 C074200500067 4.145 1.015 C074200500068 4.180 1.015 C074200500069 4.186 0.947 C074200500070 4.209 1.011 C074200500071 4.224 1.060 C074200500072 4.238 0.966 C074200500073 4.262 1.011 C074200500074 4.288 0.966 C074200500075 4.331 0.894 C074200500076 4.398 0.969 C074200500077 4.448 0.954 C074200500078 4.491 0.871 C074200500079 4.552 0.822 C074200500080 4.648 0.781 C074200500081 4.669 0.607 C074200500082 4.692 0.819 C074200500083 4.695 0.871 C074200500084 ENDDATA 68 0 C074200500085 ENDSUBENT 84 0 C074200599999 ENDENTRY 5 0 C074299999999