ENTRY C0934 20030917 0000C093400000001 SUBENT C0934001 20030917 0000C093400100001 BIB 14 21 C093400100002 INSTITUTE (1USABRK) C093400100003 REFERENCE (R,UCRL-17732,196708) Thesis. C093400100004 AUTHOR (N.F.Mangelson) C093400100005 TITLE The (3He,p) and (alpha,d) Two-Nucleon Stripping C093400100006 Reactions on 12C and 16O C093400100007 FACILITY (CYCLO,1USABRK) C093400100008 INC-SPECT Energy given for center of gass cell. C093400100009 SAMPLE Self-supporting carbon foil, 280 microg/cm2 thickness. C093400100010 Oxygen impurity 1-2%; <2% impurity from elements C093400100011 other than O and H. C093400100012 METHOD (BCINT) C093400100013 (EDE) C093400100014 DETECTOR (TELES,SILI,SOLST) Phosphorus-diffused silicon dE C093400100015 detector; lithium-drifted silicon E detector. C093400100016 MONITOR Beam energy determined using Al foils and range-energy C093400100017 tables of Williamson and Boujot. C093400100018 CORRECTION Corrected for background. C093400100019 REL-REF (R,,WILLIAMSON+,R,CEA-2189,1962) C093400100020 STATUS Data taken from tables in thesis. C093400100021 (COREL,C0933001) C093400100022 HISTORY (20030917C) VM C093400100023 ENDBIB 21 0 C093400100024 COMMON 1 3 C093400100025 EN C093400100026 MEV C093400100027 20.1 C093400100028 ENDCOMMON 3 0 C093400100029 ENDSUBENT 28 0 C093400199999 SUBENT C0934002 20030917 0000C093400200001 BIB 2 6 C093400200002 REACTION (6-C-12(HE3,EL)6-C-12,,DA) C093400200003 ERR-ANALYS (ERR-S) Statistical uncertainty. C093400200004 Additional uncertainties include error in: C093400200005 . beam integration (3%), C093400200006 . target thickness (10%), C093400200007 . dead time and other electronics (2%). C093400200008 ENDBIB 6 0 C093400200009 NOCOMMON 0 0 C093400200010 DATA 3 26 C093400200011 ANG-CM DATA-CM ERR-S C093400200012 ADEG MB/SR MB/SR C093400200013 10.6 6387. 12. C093400200014 13.1 3453. 8. C093400200015 15.6 2050. 5. C093400200016 18.1 1272. 4. C093400200017 20.6 681. 2. C093400200018 23.1 368. 1. C093400200019 25.3 174. 0.5 C093400200020 26.8 104. 0.5 C093400200021 26.8 108. 0.7 C093400200022 28.0 64.1 0.3 C093400200023 30.5 23.4 0.2 C093400200024 33.0 14.5 0.1 C093400200025 35.4 16.6 0.1 C093400200026 37.9 19.5 0.1 C093400200027 40.3 19.9 0.1 C093400200028 42.8 17.4 0.1 C093400200029 45.1 12.9 0.1 C093400200030 47.6 8.26 0.08 C093400200031 49.9 4.95 0.05 C093400200032 52.9 2.85 0.06 C093400200033 55.9 2.84 0.05 C093400200034 58.8 3.95 0.05 C093400200035 61.7 5.09 0.06 C093400200036 65.8 5.47 0.05 C093400200037 70.4 3.99 0.05 C093400200038 75.4 1.80 0.03 C093400200039 ENDDATA 28 0 C093400200040 ENDSUBENT 39 0 C093400299999 SUBENT C0934003 20030917 0000C093400300001 BIB 2 6 C093400300002 REACTION (6-C-12(HE3,INL)6-C-12,PAR,DA) C093400300003 ERR-ANALYS (ERR-S) Statistical uncertainty. C093400300004 Additional uncertainties include error in: C093400300005 . beam integration (3%), C093400300006 . target thickness (10%), C093400300007 . dead time and other electronics (2%). C093400300008 ENDBIB 6 0 C093400300009 COMMON 1 3 C093400300010 E C093400300011 MEV C093400300012 4.433 C093400300013 ENDCOMMON 3 0 C093400300014 DATA 3 26 C093400300015 ANG-CM DATA-CM ERR-S C093400300016 ADEG MB/SR MB/SR C093400300017 11.0 2.3 0.2 C093400300018 13.6 2.4 0.2 C093400300019 16.2 3.4 0.2 C093400300020 18.8 5.1 0.2 C093400300021 21.3 5.0 0.1 C093400300022 23.9 4.7 0.1 C093400300023 26.2 4.6 0.1 C093400300024 27.7 4.7 0.1 C093400300025 27.7 4.9 0.1 C093400300026 29.0 4.7 0.1 C093400300027 31.6 4.3 0.05 C093400300028 34.1 3.9 0.05 C093400300029 36.6 3.2 0.05 C093400300030 39.2 2.6 0.05 C093400300031 41.7 2.2 0.05 C093400300032 44.2 2.2 0.05 C093400300033 46.7 2.0 0.05 C093400300034 49.1 2.0 0.05 C093400300035 51.6 2.0 0.05 C093400300036 54.7 1.9 0.01 C093400300037 57.7 1.7 0.01 C093400300038 60.7 1.5 0.05 C093400300039 63.7 1.5 0.05 C093400300040 67.9 1.6 0.05 C093400300041 72.6 1.8 0.05 C093400300042 77.8 2.5 0.05 C093400300043 ENDDATA 28 0 C093400300044 ENDSUBENT 43 0 C093400399999 ENDENTRY 3 0 C093499999999