ENTRY C1041 20040720 0000C104100000001 SUBENT C1041001 20040720 0000C104100100001 BIB 9 10 C104100100002 INSTITUTE (1USASC ) C104100100003 REFERENCE (J,NIM,149,289,1978) C104100100004 AUTHOR (S.T.Picraux) C104100100005 TITLE Low-concentration oxygen depth profiling by the C104100100006 16O(d,alpha)14N reaction C104100100007 SAMPLE SiO2 target film, 219 Angtroems thick. C104100100008 DETECTOR (SIBAR) Gold barrier silicon detector. C104100100009 MONITOR (8-O-16(D,P)8-O-17,PAR,SIG) C104100100010 MONIT-REF (,G.AMSTEL,J,APH,9,247,1964) C104100100011 HISTORY (20040720C) C104100100012 ENDBIB 10 0 C104100100013 COMMON 2 3 C104100100014 EN-NRM E-LVL-NRM C104100100015 KEV KEV C104100100016 900. 871. C104100100017 ENDCOMMON 3 0 C104100100018 ENDSUBENT 17 0 C104100199999 SUBENT C1041002 20040720 0000C104100200001 BIB 3 6 C104100200002 REACTION (8-O-16(D,A)7-N-14,,DA) C104100200003 ERR-ANALYS (DATA-ERR) Experimental uncertainty. No information C104100200004 on contributions given. C104100200005 (EN-ERR-DIG) Digitizing error in energy. C104100200006 (ERR-DIG) Digitizing error in data. C104100200007 STATUS (CURVE) Scanned from Fig.4 in article at NDS. C104100200008 ENDBIB 6 0 C104100200009 COMMON 3 3 C104100200010 ANG EN-ERR-DIG ERR-DIG C104100200011 ADEG KEV MB/SR C104100200012 160. 0.5 0.03 C104100200013 ENDCOMMON 3 0 C104100200014 DATA 3 11 C104100200015 EN DATA DATA-ERR C104100200016 KEV MB/SR MB/SR C104100200017 840.3 5.61 0.20 C104100200018 869.9 5.82 0.20 C104100200019 900.5 6.02 0.22 C104100200020 930.7 7.21 0.23 C104100200021 959.9 8.32 0.25 C104100200022 975.1 11.02 0.32 C104100200023 987.5 12.52 0.31 C104100200024 990.5 12.05 0.32 C104100200025 1005.1 12.57 0.31 C104100200026 1012.6 11.90 0.35 C104100200027 1019.8 11.39 0.31 C104100200028 ENDDATA 13 0 C104100200029 ENDSUBENT 28 0 C104100299999 ENDENTRY 2 0 C104199999999