ENTRY C1552 20111229 C114C155200000001 SUBENT C1552001 20111229 C114C155200100001 BIB 11 28 C155200100002 INSTITUTE (1USAWIS) C155200100003 REFERENCE (J,NP/A,349,445,1980) C155200100004 AUTHOR (J.A.Bieszk,L.D.Knutson) C155200100005 TITLE Determination of the D2 parameter for (d,3He) C155200100006 reactions C155200100007 FACILITY (VDGT,1USAWIS) The University of Wisconsin Lamb-shift C155200100008 polarized ion source C155200100009 REL-REF (M,,N.Rohrig+,J,NP/A,206,225,1973) - similar method C155200100010 used to measure the tensor analyzing powers C155200100011 (I,,T.B.Clegg+,C,70MADISON,,835,1971) - Lamb-shift C155200100012 polarized ion source description C155200100013 (I,,K.Stephenson+,J,NIM,169,483,1980) - polarimeter C155200100014 description C155200100015 SAMPLE (29-CU-63,ENR=0.9987) The target was a 2.06 mg/cm2 C155200100016 metallic Cu foil enriched to 99.87% in 63Cu. C155200100017 DETECTOR (TELES) At 9 MeV two telescopes with thin (30 microm) C155200100018 dE detectors were used while at 12 MeV we used four C155200100019 counter telescopes with 60 microm thick dE detectors. C155200100020 METHOD (EDE) Reaction products were detected by dE-E counter C155200100021 telescopes located to one side of the incident beam. C155200100022 ERR-ANALYS The error bars shown in subsequent figures include the C155200100023 contributions from statistics, from uncertainties in C155200100024 the background subtraction and from the statistical C155200100025 uncertainty in the determination of the beam C155200100026 polarizations. C155200100027 HISTORY (20070430C) DR C155200100028 (20111229A) SD: BIB updated. MONITOR was added. C155200100029 REACTION code in Subents 007-011 corrected. C155200100030 ENDBIB 28 0 C155200100031 NOCOMMON 0 0 C155200100032 ENDSUBENT 31 0 C155200199999 SUBENT C1552002 20111229 C114C155200200001 BIB 3 4 C155200200002 REACTION (29-CU-63(D,EL)29-CU-63,,DA,,RTH) C155200200003 ERR-ANALYS (DATA-ERR) The uncertainty in the overall C155200200004 normalization estimated to be 10%. C155200200005 STATUS (CURVE) Data taken from Fig. 2 of NP/A,349,445,1980 C155200200006 ENDBIB 4 0 C155200200007 COMMON 1 3 C155200200008 DATA-ERR C155200200009 PER-CENT C155200200010 10. C155200200011 ENDCOMMON 3 0 C155200200012 DATA 3 46 C155200200013 EN ANG-CM DATA C155200200014 MEV ADEG NO-DIM C155200200015 9. 5.434E+00 1.006E+00 C155200200016 9. 2.798E+01 7.506E-01 C155200200017 9. 3.418E+01 6.102E-01 C155200200018 9. 4.035E+01 5.204E-01 C155200200019 9. 4.651E+01 4.770E-01 C155200200020 9. 5.263E+01 4.698E-01 C155200200021 9. 5.920E+01 4.170E-01 C155200200022 9. 6.535E+01 3.884E-01 C155200200023 9. 7.190E+01 3.676E-01 C155200200024 9. 7.723E+01 3.478E-01 C155200200025 9. 8.337E+01 3.213E-01 C155200200026 9. 8.912E+01 2.898E-01 C155200200027 9. 9.570E+01 2.552E-01 C155200200028 9. 1.018E+02 2.358E-01 C155200200029 9. 1.080E+02 2.379E-01 C155200200030 9. 1.133E+02 2.419E-01 C155200200031 9. 1.194E+02 2.440E-01 C155200200032 9. 1.255E+02 2.347E-01 C155200200033 9. 1.313E+02 2.185E-01 C155200200034 9. 1.374E+02 2.003E-01 C155200200035 9. 1.436E+02 1.807E-01 C155200200036 9. 1.493E+02 1.823E-01 C155200200037 9. 1.554E+02 1.767E-01 C155200200038 9. 1.611E+02 1.885E-01 C155200200039 9. 1.676E+02 1.948E-01 C155200200040 12. 4.485E+00 1.006E+00 C155200200041 12. 5.446E+01 2.396E-01 C155200200042 12. 6.059E+01 2.248E-01 C155200200043 12. 6.668E+01 2.682E-01 C155200200044 12. 7.278E+01 2.837E-01 C155200200045 12. 7.893E+01 2.362E-01 C155200200046 12. 8.428E+01 1.703E-01 C155200200047 12. 9.044E+01 1.298E-01 C155200200048 12. 9.656E+01 1.278E-01 C155200200049 12. 1.031E+02 1.453E-01 C155200200050 12. 1.083E+02 1.587E-01 C155200200051 12. 1.145E+02 1.575E-01 C155200200052 12. 1.206E+02 1.386E-01 C155200200053 12. 1.268E+02 1.127E-01 C155200200054 12. 1.329E+02 9.532E-02 C155200200055 12. 1.382E+02 8.664E-02 C155200200056 12. 1.447E+02 8.598E-02 C155200200057 12. 1.500E+02 9.242E-02 C155200200058 12. 1.557E+02 9.935E-02 C155200200059 12. 1.614E+02 1.059E-01 C155200200060 12. 1.675E+02 1.051E-01 C155200200061 ENDDATA 48 0 C155200200062 ENDSUBENT 61 0 C155200299999 SUBENT C1552003 20070430 C080C155200300001 BIB 3 5 C155200300002 REACTION (29-CU-63(D,EL)29-CU-63,,POL/DA,,VAP) C155200300003 ERR-ANALYS (ERR-SYS) In addition to the displayed errors, C155200300004 all of the analyzing power measurements are subject C155200300005 to an uncertainty of 2% at 9 MeV and 4% at 12 MeV. C155200300006 STATUS (CURVE) Data taken from Fig. 2 C155200300007 ENDBIB 5 0 C155200300008 NOCOMMON 0 0 C155200300009 DATA 4 44 C155200300010 EN ANG-CM DATA ERR-SYS C155200300011 MEV ADEG NO-DIM PER-CENT C155200300012 9. 2.898E+01 -1.608E-02 2. C155200300013 9. 3.591E+01 -1.494E-02 2. C155200300014 9. 4.205E+01 -1.997E-02 2. C155200300015 9. 4.818E+01 -2.295E-02 2. C155200300016 9. 5.425E+01 -4.339E-03 2. C155200300017 9. 6.034E+01 7.072E-03 2. C155200300018 9. 6.648E+01 -1.608E-05 2. C155200300019 9. 7.224E+01 -1.944E-02 2. C155200300020 9. 7.886E+01 -5.017E-02 2. C155200300021 9. 8.499E+01 -5.417E-02 2. C155200300022 9. 9.064E+01 -3.146E-02 2. C155200300023 9. 9.666E+01 7.702E-03 2. C155200300024 9. 1.018E+02 4.890E-02 2. C155200300025 9. 1.084E+02 3.668E-02 2. C155200300026 9. 1.150E+02 -2.024E-04 2. C155200300027 9. 1.205E+02 -3.917E-02 2. C155200300028 9. 1.267E+02 -7.400E-02 2. C155200300029 9. 1.328E+02 -7.595E-02 2. C155200300030 9. 1.384E+02 -5.324E-02 2. C155200300031 9. 1.440E+02 2.355E-03 2. C155200300032 9. 1.491E+02 6.720E-02 2. C155200300033 9. 1.560E+02 1.074E-01 2. C155200300034 9. 1.617E+02 1.126E-01 2. C155200300035 9. 1.674E+02 1.045E-01 2. C155200300036 12. 5.368E+01 1.102E-02 4. C155200300037 12. 6.057E+01 3.780E-02 4. C155200300038 12. 6.714E+01 1.880E-03 4. C155200300039 12. 7.251E+01 -4.947E-02 4. C155200300040 12. 7.868E+01 -9.156E-02 4. C155200300041 12. 8.523E+01 -1.100E-01 4. C155200300042 12. 9.043E+01 -3.287E-02 4. C155200300043 12. 9.680E+01 8.435E-02 4. C155200300044 12. 1.033E+02 1.070E-01 4. C155200300045 12. 1.087E+02 3.305E-02 4. C155200300046 12. 1.145E+02 -7.276E-02 4. C155200300047 12. 1.212E+02 -1.786E-01 4. C155200300048 12. 1.269E+02 -1.991E-01 4. C155200300049 12. 1.325E+02 -8.392E-02 4. C155200300050 12. 1.380E+02 5.693E-02 4. C155200300051 12. 1.432E+02 1.176E-01 4. C155200300052 12. 1.498E+02 6.011E-02 4. C155200300053 12. 1.557E+02 -3.954E-02 4. C155200300054 12. 1.623E+02 -1.371E-01 4. C155200300055 12. 1.680E+02 -1.453E-01 4. C155200300056 ENDDATA 46 0 C155200300057 ENDSUBENT 56 0 C155200399999 SUBENT C1552004 20070430 C080C155200400001 BIB 3 5 C155200400002 REACTION (29-CU-63(D,EL)29-CU-63,21,POL/DA,,TAP) C155200400003 ERR-ANALYS (ERR-SYS) In addition to the displayed errors, C155200400004 all of the analyzing power measurements are subject C155200400005 to an uncertainty of 2% at 9 MeV and 4% at 12 MeV. C155200400006 STATUS (CURVE) Data taken from Fig. 2 C155200400007 ENDBIB 5 0 C155200400008 NOCOMMON 0 0 C155200400009 DATA 4 40 C155200400010 EN ANG-CM DATA ERR-SYS C155200400011 MEV ADEG NO-DIM PER-CENT C155200400012 9. 5.891E+01 -2.192E-02 2. C155200400013 9. 6.504E+01 -2.120E-02 2. C155200400014 9. 7.158E+01 -1.848E-02 2. C155200400015 9. 7.734E+01 -1.267E-02 2. C155200400016 9. 8.347E+01 -1.094E-02 2. C155200400017 9. 8.953E+01 -1.834E-02 2. C155200400018 9. 9.517E+01 -2.775E-02 2. C155200400019 9. 1.012E+02 -3.718E-02 2. C155200400020 9. 1.073E+02 -3.545E-02 2. C155200400021 9. 1.131E+02 -3.066E-02 2. C155200400022 9. 1.189E+02 -2.282E-02 2. C155200400023 9. 1.246E+02 -1.904E-02 2. C155200400024 9. 1.311E+02 -1.834E-02 2. C155200400025 9. 1.368E+02 -1.964E-02 2. C155200400026 9. 1.429E+02 -1.994E-02 2. C155200400027 9. 1.486E+02 -2.123E-02 2. C155200400028 9. 1.548E+02 -2.254E-02 2. C155200400029 9. 1.601E+02 -1.468E-02 2. C155200400030 9. 1.662E+02 -1.498E-02 2. C155200400031 9. 1.719E+02 -2.439E-02 2. C155200400032 12. 5.984E+01 -3.779E-02 4. C155200400033 12. 6.653E+01 -3.100E-02 4. C155200400034 12. 7.289E+01 -1.202E-02 4. C155200400035 12. 7.910E+01 -1.232E-02 4. C155200400036 12. 8.567E+01 -1.974E-02 4. C155200400037 12. 9.086E+01 -4.334E-02 4. C155200400038 12. 9.655E+01 -5.681E-02 4. C155200400039 12. 1.028E+02 -5.203E-02 4. C155200400040 12. 1.092E+02 -3.306E-02 4. C155200400041 12. 1.146E+02 -2.926E-02 4. C155200400042 12. 1.212E+02 -2.450E-02 4. C155200400043 12. 1.270E+02 -2.884E-02 4. C155200400044 12. 1.324E+02 -2.301E-02 4. C155200400045 12. 1.391E+02 -2.130E-02 4. C155200400046 12. 1.447E+02 -4.086E-02 4. C155200400047 12. 1.505E+02 -3.911E-02 4. C155200400048 12. 1.568E+02 -3.129E-02 4. C155200400049 12. 1.623E+02 -1.734E-02 4. C155200400050 12. 1.683E+02 3.686E-03 4. C155200400051 12. 1.737E+02 7.485E-03 4. C155200400052 ENDDATA 42 0 C155200400053 ENDSUBENT 52 0 C155200499999 SUBENT C1552005 20070430 C080C155200500001 BIB 3 5 C155200500002 REACTION (29-CU-63(D,EL)29-CU-63,20,POL/DA,,TAP) C155200500003 ERR-ANALYS (ERR-SYS) In addition to the displayed errors, C155200500004 all of the analyzing power measurements are subject C155200500005 to an uncertainty of 2% at 9 MeV and 4% at 12 MeV. C155200500006 STATUS (CURVE) Data taken from Fig. 2 C155200500007 ENDBIB 5 0 C155200500008 NOCOMMON 0 0 C155200500009 DATA 4 40 C155200500010 EN ANG-CM DATA ERR-SYS C155200500011 MEV ADEG NO-DIM PER-CENT C155200500012 9. 6.107E+01 4.916E-03 2. C155200500013 9. 6.719E+01 4.616E-03 2. C155200500014 9. 7.364E+01 -5.908E-03 2. C155200500015 9. 7.965E+01 -1.947E-02 2. C155200500016 9. 8.536E+01 -1.873E-02 2. C155200500017 9. 9.144E+01 -2.414E-02 2. C155200500018 9. 9.718E+01 -2.033E-02 2. C155200500019 9. 1.038E+02 -1.147E-02 2. C155200500020 9. 1.100E+02 -2.590E-03 2. C155200500021 9. 1.161E+02 3.232E-03 2. C155200500022 9. 1.218E+02 -3.171E-03 2. C155200500023 9. 1.273E+02 -2.794E-02 2. C155200500024 9. 1.328E+02 -5.373E-02 2. C155200500025 9. 1.387E+02 -8.260E-02 2. C155200500026 9. 1.444E+02 -8.390E-02 2. C155200500027 9. 1.505E+02 -8.318E-02 2. C155200500028 9. 1.569E+02 -4.879E-02 2. C155200500029 9. 1.630E+02 -2.133E-03 2. C155200500030 9. 1.685E+02 1.801E-02 2. C155200500031 9. 1.751E+02 3.300E-02 2. C155200500032 12. 6.299E+01 3.203E-03 4. C155200500033 12. 6.924E+01 8.005E-03 4. C155200500034 12. 7.528E+01 -1.372E-02 4. C155200500035 12. 8.091E+01 -3.441E-02 4. C155200500036 12. 8.704E+01 -4.491E-02 4. C155200500037 12. 9.272E+01 -5.948E-02 4. C155200500038 12. 9.867E+01 -4.139E-02 4. C155200500039 12. 1.048E+02 -1.881E-03 4. C155200500040 12. 1.112E+02 2.639E-02 4. C155200500041 12. 1.173E+02 4.660E-03 4. C155200500042 12. 1.231E+02 -4.360E-02 4. C155200500043 12. 1.284E+02 -1.020E-01 4. C155200500044 12. 1.342E+02 -1.503E-01 4. C155200500045 12. 1.407E+02 -1.230E-01 4. C155200500046 12. 1.466E+02 2.218E-03 4. C155200500047 12. 1.533E+02 1.050E-01 4. C155200500048 12. 1.592E+02 1.170E-01 4. C155200500049 12. 1.652E+02 3.909E-02 4. C155200500050 12. 1.699E+02 -8.873E-02 4. C155200500051 12. 1.741E+02 -1.931E-01 4. C155200500052 ENDDATA 42 0 C155200500053 ENDSUBENT 52 0 C155200599999 SUBENT C1552006 20070430 C080C155200600001 BIB 3 5 C155200600002 REACTION (29-CU-63(D,EL)29-CU-63,22,POL/DA,,TAP) C155200600003 ERR-ANALYS (ERR-SYS) In addition to the displayed errors, C155200600004 all of the analyzing power measurements are subject C155200600005 to an uncertainty of 2% at 9 MeV and 4% at 12 MeV. C155200600006 STATUS (CURVE) Data taken from Fig. 2 C155200600007 ENDBIB 5 0 C155200600008 NOCOMMON 0 0 C155200600009 DATA 4 40 C155200600010 EN ANG-CM DATA ERR-SYS C155200600011 MEV ADEG NO-DIM PER-CENT C155200600012 9. 5.609E+01 -5.954E-03 2. C155200600013 9. 6.218E+01 -9.381E-03 2. C155200600014 9. 6.787E+01 -1.175E-02 2. C155200600015 9. 7.437E+01 -1.519E-02 2. C155200600016 9. 8.039E+01 -2.902E-02 2. C155200600017 9. 8.611E+01 -2.723E-02 2. C155200600018 9. 9.223E+01 -2.753E-02 2. C155200600019 9. 9.850E+01 -7.038E-03 2. C155200600020 9. 1.044E+02 1.348E-02 2. C155200600021 9. 1.110E+02 2.147E-02 2. C155200600022 9. 1.162E+02 9.765E-03 2. C155200600023 9. 1.221E+02 -9.263E-03 2. C155200600024 9. 1.281E+02 -3.349E-02 2. C155200600025 9. 1.336E+02 -5.770E-02 2. C155200600026 9. 1.396E+02 -6.944E-02 2. C155200600027 9. 1.450E+02 -5.931E-02 2. C155200600028 9. 1.516E+02 -5.028E-02 2. C155200600029 9. 1.574E+02 -3.808E-02 2. C155200600030 9. 1.632E+02 -2.381E-02 2. C155200600031 9. 1.686E+02 -1.679E-02 2. C155200600032 12. 6.824E+01 -2.640E-02 4. C155200600033 12. 7.527E+01 -1.109E-02 4. C155200600034 12. 8.309E+01 -1.869E-02 4. C155200600035 12. 8.986E+01 -3.146E-02 4. C155200600036 12. 9.706E+01 -5.257E-02 4. C155200600037 12. 1.044E+02 -5.807E-02 4. C155200600038 12. 1.116E+02 -2.716E-02 4. C155200600039 12. 1.193E+02 1.206E-02 4. C155200600040 12. 1.263E+02 2.009E-02 4. C155200600041 12. 1.331E+02 7.326E-03 4. C155200600042 12. 1.397E+02 -2.832E-02 4. C155200600043 12. 1.461E+02 -7.749E-02 4. C155200600044 12. 1.527E+02 -1.069E-01 4. C155200600045 12. 1.599E+02 -7.598E-02 4. C155200600046 12. 1.681E+02 1.628E-02 4. C155200600047 12. 1.765E+02 1.241E-01 4. C155200600048 12. 1.838E+02 1.623E-01 4. C155200600049 12. 1.905E+02 1.402E-01 4. C155200600050 12. 1.964E+02 8.898E-02 4. C155200600051 12. 2.033E+02 3.563E-02 4. C155200600052 ENDDATA 42 0 C155200600053 ENDSUBENT 52 0 C155200699999 SUBENT C1552007 20111229 C114C155200700001 BIB 5 12 C155200700002 REACTION (29-CU-63(D,HE3)28-NI-62,PAR,DA) C155200700003 MONITOR (29-CU-63(D,EL)29-CU-63,,DA,,RTH) C155200700004 To obtain absolute cross sections, an optical-model C155200700005 calculation was used to determine the elastic C155200700006 scattering cross section at the monitor detector angle.C155200700007 This procedure is reasonably accurate since the monitorC155200700008 cross section differs only slightly (i.e. by about 2% C155200700009 at Ed = 9 MeV and 12% at Ed = 12 MeV) from Rutherford. C155200700010 ERR-ANALYS (DATA-ERR) The uncertainty in the overall C155200700011 normalization estimated to be 10%. C155200700012 STATUS (CURVE) Data taken from Fig. 3 of NP/A,349,445,1980 C155200700013 HISTORY (20111229A) SD: REACTION code corrected: SF5=PAR added.C155200700014 ENDBIB 12 0 C155200700015 COMMON 2 3 C155200700016 DATA-ERR E-LVL C155200700017 PER-CENT MEV C155200700018 10. 0.0 C155200700019 ENDCOMMON 3 0 C155200700020 DATA 3 40 C155200700021 EN ANG-CM DATA-CM C155200700022 MEV ADEG MU-B/SR C155200700023 9. 5.505E+01 4.121E+01 C155200700024 9. 6.090E+01 4.175E+01 C155200700025 9. 6.753E+01 4.380E+01 C155200700026 9. 7.338E+01 4.555E+01 C155200700027 9. 7.963E+01 4.555E+01 C155200700028 9. 8.587E+01 4.635E+01 C155200700029 9. 9.211E+01 4.418E+01 C155200700030 9. 9.718E+01 4.267E+01 C155200700031 9. 1.034E+02 4.248E+01 C155200700032 9. 1.089E+02 3.997E+01 C155200700033 9. 1.143E+02 3.777E+01 C155200700034 9. 1.202E+02 3.477E+01 C155200700035 9. 1.264E+02 3.432E+01 C155200700036 9. 1.327E+02 3.417E+01 C155200700037 9. 1.385E+02 3.272E+01 C155200700038 9. 1.448E+02 3.160E+01 C155200700039 9. 1.502E+02 3.119E+01 C155200700040 9. 1.561E+02 3.132E+01 C155200700041 9. 1.619E+02 3.092E+01 C155200700042 9. 1.678E+02 2.973E+01 C155200700043 12. 5.729E+01 2.052E+02 C155200700044 12. 6.364E+01 1.738E+02 C155200700045 12. 6.998E+01 1.472E+02 C155200700046 12. 7.555E+01 1.214E+02 C155200700047 12. 8.187E+01 1.093E+02 C155200700048 12. 8.702E+01 9.590E+01 C155200700049 12. 9.373E+01 8.489E+01 C155200700050 12. 1.005E+02 7.065E+01 C155200700051 12. 1.060E+02 6.035E+01 C155200700052 12. 1.120E+02 4.890E+01 C155200700053 12. 1.179E+02 4.215E+01 C155200700054 12. 1.243E+02 3.831E+01 C155200700055 12. 1.301E+02 3.671E+01 C155200700056 12. 1.364E+02 3.426E+01 C155200700057 12. 1.420E+02 3.005E+01 C155200700058 12. 1.479E+02 2.707E+01 C155200700059 12. 1.538E+02 2.461E+01 C155200700060 12. 1.594E+02 2.236E+01 C155200700061 12. 1.648E+02 2.180E+01 C155200700062 12. 1.711E+02 2.203E+01 C155200700063 ENDDATA 42 0 C155200700064 ENDSUBENT 63 0 C155200799999 SUBENT C1552008 20111229 C114C155200800001 BIB 4 7 C155200800002 REACTION (29-CU-63(D,HE3)28-NI-62,20/PAR,POL/DA,,TAP) C155200800003 ERR-ANALYS (ERR-SYS) In addition to the displayed errors, C155200800004 all of the analyzing power measurements are subject C155200800005 to an uncertainty of 2% at 9 MeV and 4% at 12 MeV. C155200800006 (ERR-S) Statistical uncertainty C155200800007 STATUS (CURVE) Data taken from Fig. 3 of NP/A,349,445,1980 C155200800008 HISTORY (20111229A) SD: REACTION code corrected: SF5=PAR added.C155200800009 ENDBIB 7 0 C155200800010 COMMON 1 3 C155200800011 E-LVL C155200800012 MEV C155200800013 0.0 C155200800014 ENDCOMMON 3 0 C155200800015 DATA 5 40 C155200800016 EN ANG-CM DATA ERR-S ERR-SYS C155200800017 MEV ADEG NO-DIM NO-DIM PER-CENT C155200800018 9. 5.622E+01 1.774E-01 2.452E-02 2. C155200800019 9. 6.168E+01 1.566E-01 3.018E-02 2. C155200800020 9. 6.831E+01 1.434E-01 2.641E-02 2. C155200800021 9. 7.455E+01 1.453E-01 2.830E-02 2. C155200800022 9. 7.962E+01 8.871E-02 2.641E-02 2. C155200800023 9. 8.587E+01 5.098E-02 2.641E-02 2. C155200800024 9. 9.172E+01 3.778E-02 3.207E-02 2. C155200800025 9. 9.835E+01 2.080E-02 3.018E-02 2. C155200800026 9. 1.038E+02 -9.617E-02 3.207E-02 2. C155200800027 9. 1.097E+02 -8.862E-02 4.339E-02 2. C155200800028 9. 1.159E+02 -7.730E-02 3.584E-02 2. C155200800029 9. 1.218E+02 -1.264E-01 5.094E-02 2. C155200800030 9. 1.280E+02 -2.131E-01 3.962E-02 2. C155200800031 9. 1.338E+02 -2.886E-01 2.830E-02 2. C155200800032 9. 1.397E+02 -2.320E-01 3.584E-02 2. C155200800033 9. 1.456E+02 -2.546E-01 3.207E-02 2. C155200800034 9. 1.518E+02 -2.773E-01 3.773E-02 2. C155200800035 9. 1.573E+02 -2.395E-01 2.830E-02 2. C155200800036 9. 1.631E+02 -2.867E-01 4.150E-02 2. C155200800037 9. 1.690E+02 -2.697E-01 3.584E-02 2. C155200800038 12. 5.633E+01 1.755E-01 2.830E-02 4. C155200800039 12. 6.221E+01 8.305E-02 2.830E-02 4. C155200800040 12. 6.848E+01 1.396E-01 3.584E-02 4. C155200800041 12. 7.436E+01 6.041E-02 3.584E-02 4. C155200800042 12. 8.064E+01 3.778E-02 3.207E-02 4. C155200800043 12. 8.652E+01 3.818E-03 3.962E-02 4. C155200800044 12. 9.240E+01 -7.353E-02 3.396E-02 4. C155200800045 12. 9.867E+01 -1.018E-01 4.150E-02 4. C155200800046 12. 1.049E+02 -1.490E-01 3.396E-02 4. C155200800047 12. 1.108E+02 -9.994E-02 3.962E-02 4. C155200800048 12. 1.175E+02 -1.962E-01 4.150E-02 4. C155200800049 12. 1.234E+02 -2.320E-01 4.150E-02 4. C155200800050 12. 1.289E+02 -2.829E-01 3.396E-02 4. C155200800051 12. 1.347E+02 -2.810E-01 3.396E-02 4. C155200800052 12. 1.410E+02 -3.339E-01 3.773E-02 4. C155200800053 12. 1.469E+02 -3.169E-01 3.962E-02 4. C155200800054 12. 1.524E+02 -2.867E-01 3.584E-02 4. C155200800055 12. 1.587E+02 -3.546E-01 3.584E-02 4. C155200800056 12. 1.641E+02 -3.226E-01 3.584E-02 4. C155200800057 12. 1.700E+02 -3.546E-01 3.396E-02 4. C155200800058 ENDDATA 42 0 C155200800059 ENDSUBENT 58 0 C155200899999 SUBENT C1552009 20111229 C114C155200900001 BIB 4 7 C155200900002 REACTION (29-CU-63(D,HE3)28-NI-62,22/PAR,POL/DA,,TAP) C155200900003 ERR-ANALYS (ERR-SYS) In addition to the displayed errors, C155200900004 all of the analyzing power measurements are subject C155200900005 to an uncertainty of 2% at 9 MeV and 4% at 12 MeV. C155200900006 (ERR-S) Statistical uncertainty C155200900007 STATUS (CURVE) Data taken from Fig. 3 of NP/A,349,445,1980 C155200900008 HISTORY (20111229A) SD: REACTION code corrected: SF5=PAR added.C155200900009 ENDBIB 7 0 C155200900010 COMMON 1 3 C155200900011 E-LVL C155200900012 MEV C155200900013 0.0 C155200900014 ENDCOMMON 3 0 C155200900015 DATA 5 40 C155200900016 EN ANG-CM DATA ERR-S ERR-SYS C155200900017 MEV ADEG NO-DIM NO-DIM PER-CENT C155200900018 9. 5.571E+01 -9.163E-02 1.719E-02 2. C155200900019 9. 6.196E+01 -7.832E-02 2.292E-02 2. C155200900020 9. 6.782E+01 -6.882E-02 2.102E-02 2. C155200900021 9. 7.404E+01 -1.033E-01 2.293E-02 2. C155200900022 9. 8.029E+01 -8.995E-02 1.910E-02 2. C155200900023 9. 8.613E+01 -1.282E-01 2.102E-02 2. C155200900024 9. 9.238E+01 -1.225E-01 1.910E-02 2. C155200900025 9. 9.864E+01 -7.867E-02 2.483E-02 2. C155200900026 9. 1.045E+02 -6.726E-02 2.292E-02 2. C155200900027 9. 1.103E+02 -8.833E-02 3.056E-02 2. C155200900028 9. 1.162E+02 -5.209E-02 2.293E-02 2. C155200900029 9. 1.221E+02 -3.878E-02 3.056E-02 2. C155200900030 9. 1.283E+02 1.083E-02 2.674E-02 2. C155200900031 9. 1.342E+02 -1.406E-02 2.292E-02 2. C155200900032 9. 1.400E+02 -1.603E-02 2.865E-02 2. C155200900033 9. 1.455E+02 -1.990E-02 2.484E-02 2. C155200900034 9. 1.513E+02 -8.513E-04 2.292E-02 2. C155200900035 9. 1.572E+02 -1.619E-02 2.293E-02 2. C155200900036 9. 1.630E+02 -8.605E-03 2.292E-02 2. C155200900037 9. 1.693E+02 1.617E-02 2.292E-02 2. C155200900038 12. 5.537E+01 -1.583E-01 2.483E-02 4. C155200900039 12. 6.123E+01 -1.049E-01 2.484E-02 4. C155200900040 12. 6.783E+01 -1.374E-01 2.483E-02 4. C155200900041 12. 7.329E+01 -1.184E-01 2.866E-02 4. C155200900042 12. 8.030E+01 -1.165E-01 2.865E-02 4. C155200900043 12. 8.575E+01 -9.747E-02 2.865E-02 4. C155200900044 12. 9.160E+01 -6.887E-02 2.674E-02 4. C155200900045 12. 9.821E+01 -8.804E-02 3.629E-02 4. C155200900046 12. 1.041E+02 -4.416E-02 2.674E-02 4. C155200900047 12. 1.099E+02 -8.433E-02 2.674E-02 4. C155200900048 12. 1.158E+02 -2.708E-02 3.057E-02 4. C155200900049 12. 1.212E+02 -4.432E-02 3.248E-02 4. C155200900050 12. 1.274E+02 -4.438E-02 2.675E-02 4. C155200900051 12. 1.337E+02 -4.253E-02 2.483E-02 4. C155200900052 12. 1.391E+02 -2.539E-02 2.483E-02 4. C155200900053 12. 1.453E+02 -3.501E-02 3.057E-02 4. C155200900054 12. 1.508E+02 -1.213E-02 3.057E-02 4. C155200900055 12. 1.570E+02 1.646E-02 2.674E-02 4. C155200900056 12. 1.621E+02 -6.512E-03 2.674E-02 4. C155200900057 12. 1.687E+02 1.444E-02 3.056E-02 4. C155200900058 ENDDATA 42 0 C155200900059 ENDSUBENT 58 0 C155200999999 SUBENT C1552010 20111229 C114C155201000001 BIB 4 7 C155201000002 REACTION (29-CU-63(D,HE3)28-NI-62,21/PAR,POL/DA,,TAP) C155201000003 ERR-ANALYS (ERR-SYS) In addition to the displayed errors, C155201000004 all of the analyzing power measurements are subject C155201000005 to an uncertainty of 2% at 9 MeV and 4% at 12 MeV. C155201000006 (ERR-S) Statistical uncertainty C155201000007 STATUS (CURVE) Data taken from Fig. 3 of NP/A,349,445,1980 C155201000008 HISTORY (20111229A) SD: REACTION code corrected: SF5=PAR added.C155201000009 ENDBIB 7 0 C155201000010 COMMON 1 3 C155201000011 E-LVL C155201000012 MEV C155201000013 0.0 C155201000014 ENDCOMMON 3 0 C155201000015 DATA 5 40 C155201000016 EN ANG-CM DATA ERR-S ERR-SYS C155201000017 MEV ADEG NO-DIM NO-DIM PER-CENT C155201000018 9. 5.027E+01 -2.418E-02 2.429E-02 2. C155201000019 9. 5.666E+01 -6.474E-02 2.059E-02 2. C155201000020 9. 6.270E+01 -1.128E-01 2.613E-02 2. C155201000021 9. 6.866E+01 -1.441E-01 2.235E-02 2. C155201000022 9. 7.491E+01 -1.454E-01 1.869E-02 2. C155201000023 9. 8.135E+01 -1.972E-01 2.062E-02 2. C155201000024 9. 8.751E+01 -1.761E-01 2.249E-02 2. C155201000025 9. 9.341E+01 -1.887E-01 1.862E-02 2. C155201000026 9. 9.886E+01 -1.863E-01 2.419E-02 2. C155201000027 9. 1.051E+02 -1.876E-01 2.616E-02 2. C155201000028 9. 1.114E+02 -2.077E-01 2.246E-02 2. C155201000029 9. 1.172E+02 -1.959E-01 2.616E-02 2. C155201000030 9. 1.227E+02 -1.899E-01 2.616E-02 2. C155201000031 9. 1.285E+02 -1.763E-01 2.429E-02 2. C155201000032 9. 1.346E+02 -1.477E-01 2.806E-02 2. C155201000033 9. 1.403E+02 -1.173E-01 2.059E-02 2. C155201000034 9. 1.458E+02 -1.075E-01 2.242E-02 2. C155201000035 9. 1.515E+02 -8.829E-02 2.239E-02 2. C155201000036 9. 1.572E+02 -3.733E-02 2.242E-02 2. C155201000037 9. 1.631E+02 -5.738E-02 2.616E-02 2. C155201000038 12. 5.062E+01 -9.074E-02 1.688E-02 4. C155201000039 12. 5.640E+01 -7.341E-02 1.498E-02 4. C155201000040 12. 6.241E+01 -1.178E-01 1.872E-02 4. C155201000041 12. 6.884E+01 -1.714E-01 2.059E-02 4. C155201000042 12. 7.509E+01 -1.783E-01 2.239E-02 4. C155201000043 12. 8.106E+01 -2.115E-01 2.239E-02 4. C155201000044 12. 8.663E+01 -1.399E-01 2.616E-02 4. C155201000045 12. 9.357E+01 -2.253E-01 2.796E-02 4. C155201000046 12. 9.903E+01 -2.286E-01 2.052E-02 4. C155201000047 12. 1.051E+02 -1.813E-01 2.059E-02 4. C155201000048 12. 1.110E+02 -1.976E-01 2.990E-02 4. C155201000049 12. 1.163E+02 -1.617E-01 2.806E-02 4. C155201000050 12. 1.225E+02 -1.537E-01 2.239E-02 4. C155201000051 12. 1.284E+02 -1.569E-01 2.239E-02 4. C155201000052 12. 1.343E+02 -8.534E-02 2.429E-02 4. C155201000053 12. 1.405E+02 -7.545E-02 2.429E-02 4. C155201000054 12. 1.460E+02 -9.367E-02 2.429E-02 4. C155201000055 12. 1.517E+02 -5.766E-02 2.990E-02 4. C155201000056 12. 1.571E+02 -3.289E-02 2.619E-02 4. C155201000057 12. 1.628E+02 1.246E-02 2.803E-02 4. C155201000058 ENDDATA 42 0 C155201000059 ENDSUBENT 58 0 C155201099999 SUBENT C1552011 20111229 C114C155201100001 BIB 4 7 C155201100002 REACTION (29-CU-63(D,HE3)28-NI-62,PAR,POL/DA,,VAP) C155201100003 ERR-ANALYS (ERR-SYS) In addition to the displayed errors, C155201100004 all of the analyzing power measurements are subject C155201100005 to an uncertainty of 2% at 9 MeV and 4% at 12 MeV. C155201100006 (ERR-S) Statistical uncertainty C155201100007 STATUS (CURVE) Data taken from Fig. 3 of NP/A,349,445,1980 C155201100008 HISTORY (20111229A) SD: REACTION code corrected: SF5=PAR added.C155201100009 ENDBIB 7 0 C155201100010 COMMON 3 3 C155201100011 EN ERR-SYS E-LVL C155201100012 MEV PER-CENT MEV C155201100013 12. 4. 0.0 C155201100014 ENDCOMMON 3 0 C155201100015 DATA 3 20 C155201100016 ANG-CM DATA ERR-S C155201100017 ADEG NO-DIM NO-DIM C155201100018 5.468E+01 -1.011E-01 1.878E-02 C155201100019 6.093E+01 -1.080E-01 2.438E-02 C155201100020 6.666E+01 -7.935E-02 1.690E-02 C155201100021 7.277E+01 -4.689E-02 2.434E-02 C155201100022 7.868E+01 -6.515E-02 2.253E-02 C155201100023 8.483E+01 -4.395E-02 2.250E-02 C155201100024 9.128E+01 -1.016E-01 2.253E-02 C155201100025 9.701E+01 -7.482E-02 2.632E-02 C155201100026 1.031E+02 -4.799E-02 2.059E-02 C155201100027 1.087E+02 2.200E-02 2.813E-02 C155201100028 1.152E+02 -4.881E-02 2.629E-02 C155201100029 1.210E+02 -2.389E-02 2.626E-02 C155201100030 1.268E+02 -2.714E-02 3.373E-02 C155201100031 1.327E+02 -4.541E-02 2.629E-02 C155201100032 1.386E+02 -5.992E-02 3.943E-02 C155201100033 1.443E+02 -2.185E-02 3.940E-02 C155201100034 1.500E+02 2.560E-02 4.319E-02 C155201100035 1.557E+02 4.865E-02 4.312E-02 C155201100036 1.615E+02 -2.787E-02 4.510E-02 C155201100037 1.670E+02 6.090E-02 4.316E-02 C155201100038 ENDDATA 22 0 C155201100039 ENDSUBENT 38 0 C155201199999 ENDENTRY 11 0 C155299999999