ENTRY C1742 20140422 C141C174200000001 SUBENT C1742001 20140422 C141C174200100001 BIB 11 35 C174200100002 TITLE Measurements of proton-induced reaction cross sections C174200100003 on 120Te for the astrophysical p process C174200100004 AUTHOR (R.T.Guray,N.Ozkan,C.Yalcyn,A.Palumbo,R.deBoer, C174200100005 J.Gorres,P.J.Leblanc,S.O'Brien,E.Strandberg,W.P.Tan, C174200100006 M.Wiescher,Zs.Fulop,E.Somorjai,H.Y.Lee,J.P.Greene) C174200100007 INSTITUTE (1USANOT,2TUKKOC,1USAANL,3HUNDEB) C174200100008 REFERENCE (J,PR/C,80,035804,2009) C174200100009 (C,2008MACKIN,,(097),2008) Preliminary data C174200100010 FACILITY (VDGT,1USANOT) Experiment performed using FN Tandem C174200100011 Van de Graaff accelerator at the University of Notre C174200100012 Dame C174200100013 SAMPLE (52-TE-120,ENR=0.994) 120Te enriched to 99.4% C174200100014 evaporated on aluminum and carbon backing foils. C174200100015 Thickness of 120Te layer was 128 and 456 mu-g/cm2 C174200100016 evaporated on 20 mu-g/cm2 carbon and 1500 mu-g/cm2 C174200100017 aluminum backing, respectively. C174200100018 DETECTOR (HPGE)Induced activity determined by by two Clover C174200100019 HPGe detectors placed face to face in close geometry C174200100020 with 4.9 mm gap between two detectors. C174200100021 (SIBAR) Si surface barrier detector at an angle of C174200100022 135deg with respected to the beam direction was used C174200100023 to monitor the target performance during irradiation. C174200100024 METHOD (ACTIV,GSPEC) C174200100025 ERR-ANALYS (ERR-T) Total uncertainty C174200100026 (ERR-S,0.2,11.0) Statistical uncertainty C174200100027 (ERR-1,1.9,2.4) Systematic uncertainty due to detector C174200100028 efficiency C174200100029 (ERR-2,0.2,33.0) Systematic uncertainty in decay data C174200100030 (ERR-3) Systematic uncertainty in sample thickness C174200100031 STATUS (APRVD) Approved by author A.P., January 2013 C174200100032 HISTORY (20090924C) Compiled by S.H. C174200100033 (20110924A) OS. BIB corrections C174200100034 (20121129A) S.H. Corrected values of S-factors C174200100035 in subs 2,4 C174200100036 (20140422A) SD: Energy values corrected in Subent 3. C174200100037 ENDBIB 35 0 C174200100038 COMMON 1 3 C174200100039 ERR-3 C174200100040 PER-CENT C174200100041 9.0 C174200100042 ENDCOMMON 3 0 C174200100043 ENDSUBENT 42 0 C174200199999 SUBENT C1742002 20130118 C127C174200200001 BIB 4 6 C174200200002 REACTION 1(52-TE-120(P,G)53-I-121,,SIG) C174200200003 2(52-TE-120(P,G)53-I-121,,SIG,,SFC) C174200200004 DECAY-DATA (53-I-121,2.12HR,DG,0.53208,0.061) C174200200005 STATUS (TABLE) Data taken from tab.2 of the main reference C174200200006 HISTORY (20121129A) S.H. Corrected order of magnitude C174200200007 of S-factor (DATA2), replaced EN by EN-CM C174200200008 ENDBIB 6 0 C174200200009 NOCOMMON 0 0 C174200200010 DATA 6 14 C174200200011 EN-CM EN-ERR DATA 1ERR-T 1DATA 2ERR-T 2C174200200012 MEV MEV MB MB B*KEV B*KEV C174200200013 2.467 0.013 0.0023 0.0003 7.62E+11 1.08E+11C174200200014 2.963 0.012 0.030 0.003 7.15E+11 0.73E+11C174200200015 3.460 0.011 0.194 0.019 5.91E+11 0.58E+11C174200200016 3.468 0.003 0.200 0.020 6.01E+11 0.51E+11C174200200017 3.958 0.010 0.706 0.069 4.16E+11 0.41E+11C174200200018 4.454 0.009 2.55 0.25 3.89E+11 0.38E+11C174200200019 4.950 0.008 5.68 0.56 2.77E+11 0.27E+11C174200200020 4.956 0.003 5.63 0.55 2.75E+11 0.22E+11C174200200021 5.452 0.002 18.7 1.8 3.43E+11 0.34E+11C174200200022 5.942 0.008 34.3 3.3 2.71E+11 0.27E+11C174200200023 6.444 0.002 46.5 4.5 1.74E+11 0.17E+11C174200200024 6.940 0.002 23.2 2.3 0.45E+11 0.04E+11C174200200025 7.436 0.002 21.8 2.2 0.24E+11 0.02E+11C174200200026 7.932 0.002 16.5 1.7 0.10E+11 0.01E+11C174200200027 ENDDATA 16 0 C174200200028 ENDSUBENT 27 0 C174200299999 SUBENT C1742003 20140422 C141C174200300001 BIB 4 6 C174200300002 REACTION 1(52-TE-120(P,N)53-I-120-G,,SIG) C174200300003 2(52-TE-120(P,N)53-I-120-M,,SIG) C174200300004 DECAY-DATA (53-I-120-M,53.0MIN,DG,0.6545,0.021) C174200300005 (53-I-120-G,81.6MIN,DG,1.523,0.109) C174200300006 STATUS (TABLE) Data taken from tab. 4 of the PR/C,80,035804 C174200300007 HISTORY (20140422A) SD: Elab (EN) values replaced with Eeff,cm C174200300008 ENDBIB 6 0 C174200300009 COMMON 1 3 C174200300010 EN-ERR C174200300011 MEV C174200300012 0.002 C174200300013 ENDCOMMON 3 0 C174200300014 DATA 5 4 C174200300015 EN-CM DATA 1ERR-T 1DATA 2ERR-T 2 C174200300016 MEV MB MB MB MB C174200300017 6.444 19.1 2.0 1.53 0.66 C174200300018 6.940 65.4 6.8 7.2 3.0 C174200300019 7.436 123.0 13.0 10.8 4.5 C174200300020 7.932 160.0 16.0 18.1 7.50 C174200300021 ENDDATA 6 0 C174200300022 ENDSUBENT 21 0 C174200399999 SUBENT C1742004 20130118 C127C174200400001 BIB 3 6 C174200400002 REACTION 1(52-TE-120(P,N)53-I-120,,SIG) C174200400003 2(52-TE-120(P,N)53-I-120,,SIG,,SFC) C174200400004 STATUS (TABLE) Data taken from tab. 3 of the main reference C174200400005 (DEP,C1742003) C174200400006 HISTORY (20121129A) S.H. Corrected order of magnitude C174200400007 of S-factor (DATA2), replaced EN by EN-CM C174200400008 ENDBIB 6 0 C174200400009 NOCOMMON 0 0 C174200400010 DATA 6 4 C174200400011 EN-CM EN-ERR DATA 1ERR-T 1DATA 2ERR-T 2C174200400012 MEV MEV MB MB B*KEV B*KEV C174200400013 6.444 0.002 20.6 2.1 0.77E+11 0.08E+11C174200400014 6.940 0.002 72.6 7.5 1.41E+11 0.14E+11C174200400015 7.436 0.002 133.0 13.0 1.44E+11 0.14E+11C174200400016 7.932 0.002 178.0 18.0 1.12E+11 0.11E+11C174200400017 ENDDATA 6 0 C174200400018 ENDSUBENT 17 0 C174200499999 ENDENTRY 4 0 C174299999999