ENTRY C1804 20111002 C110C180400000001 SUBENT C1804001 20111002 C110C180400100001 BIB 11 46 C180400100002 TITLE Resonance strength in 22Ne(p,gamma)23Na from depth C180400100003 profiling in aluminum C180400100004 AUTHOR (R.Longland,C.Iliadis,J.M.Cesaratto,A.E.Champagne, C180400100005 S.Daigle, J.R.Newton,R.Fitzgerald) C180400100006 INSTITUTE (1USANCA,1USATNL,1USANIS) C180400100007 REFERENCE (J,PR/C,81,055804,2010) C180400100008 FACILITY (VDG,1USATNL) Experiment performed at the 1-MV Van de C180400100009 Graaff accelerator at the Triangle Universities C180400100010 Nuclear Laboratory C180400100011 SAMPLE Sample was a 1mm thick aluminum sheet (99% purity) C180400100012 with implanted layer of 22Ne. The ion implanter C180400100013 accelerated neon ions from a pressurized natural C180400100014 neon (9.25% +- 0.03% molar fraction of 22Ne) gas C180400100015 bottle to an energy of 100 keV. A 90 deg analyzing C180400100016 magnet (with a quoted selectivity of 1/100) was used C180400100017 to mass separate the 22Ne ions. The incident dose of C180400100018 22Ne was estimated by integrating the beam current C180400100019 on the backing, assuming singly charged incident C180400100020 22Ne ions. The beam current on the backing amounted C180400100021 to about 20 mu-A on average. The total accumulated C180400100022 charge was 0.26 C (corresponding to 1.6E+18 incident C180400100023 22Ne ions) over a circular implantation region of C180400100024 2.5 cm in diameter. C180400100025 DETECTOR (HPGE) Capture gamma rays from the excited compound C180400100026 nuclei (28Si and 23Na) were detected using a 135% C180400100027 relative efficiency HPGe detector. The detector was C180400100028 located at 55 deg with respect to the beam direction C180400100029 at a distance of 3.0 cm from the center of the target. C180400100030 METHOD Depth profiling technique was used to determine depth C180400100031 profile of 22Na ions implanted in surface layer of C180400100032 27Al. Analysing the resonance gamma ray yield of C180400100033 22Na(p,g) resonance at 479 keV and 27Al(p,g) resonance C180400100034 at 406 keV, the strength of 22Na(p,g) resonance was C180400100035 determined relatively to the strength of 27Al(p,g) C180400100036 resonance. C180400100037 CORRECTION Corrected for contributions from 27Al(p,gamma) C180400100038 resonances at 326 keV and 447 keV. C180400100039 ERR-ANALYS (ERR-T) Total uncertainty C180400100040 (ERR-1) Uncertainty in reference strength C180400100041 (ERR-2) Uncertainty in relative detection efficiencies C180400100042 (ERR-3) Uncertainty in branching ratios C180400100043 (ERR-4) Uncertainty in stopping powers (Al) C180400100044 (ERR-5) Uncertainty in stopping powers (Si) C180400100045 (ERR-6) Uncertainty in fitting procedure C180400100046 HISTORY (20100702C) Compiled by S.H. C180400100047 (20110924A) OS. BIB corrections C180400100048 ENDBIB 46 0 C180400100049 COMMON 6 3 C180400100050 ERR-1 ERR-2 ERR-3 ERR-4 ERR-5 ERR-6 C180400100051 PER-CENT PER-CENT PER-CENT PER-CENT PER-CENT PER-CENT C180400100052 6.0 2.0 5.0 2.0 1.0 5.0 C180400100053 ENDCOMMON 3 0 C180400100054 ENDSUBENT 53 0 C180400199999 SUBENT C1804002 20100702 C101C180400200001 BIB 4 4 C180400200002 REACTION (10-NE-22(P,G),,WID/STR) C180400200003 STATUS (TABLE) Data taken from text p. 6 of the reference C180400200004 MONITOR (13-AL-27(P,G),,WID/STR) C180400200005 MONIT-REF (C0564005,D.C.Powell+,J,NP/A,644,263,1998) C180400200006 ENDBIB 4 0 C180400200007 COMMON 1 3 C180400200008 EN-RES-NRM C180400200009 KEV C180400200010 405.5 C180400200011 ENDCOMMON 3 0 C180400200012 DATA 5 1 C180400200013 EN-RES DATA ERR-T MONIT MONIT-ERR C180400200014 KEV EV EV EV EV C180400200015 479.3 0.524 0.051 8.63E-03 5.2E-04 C180400200016 ENDDATA 3 0 C180400200017 ENDSUBENT 16 0 C180400299999 ENDENTRY 2 0 C180499999999