ENTRY C2155 20150518 C151C215500000001 SUBENT C2155001 20150518 C151C215500100001 BIB 10 45 C215500100002 TITLE High-intensity-beam study of 17-O(p,gamma)18F and C215500100003 thermonuclear reaction rates for 17-O + p C215500100004 AUTHOR (M.Q.Buckner,C.Iliadis,K.J.Kelly,L.N.Downen, C215500100005 A.E.Champagne,J.M.Cesaratto,C.Howard,R.Longland) C215500100006 INSTITUTE (1USANCA,1USATNL,1USANCS) C215500100007 REFERENCE (J,PR/C,91,015812,2015) C215500100008 FACILITY (VDG,1USATNL) Experiment performed using JN Van de C215500100009 Graaff accelerator at the Laboratory for Experimental C215500100010 Nuclear Astrophysics (LENA), which is part of the C215500100011 Triangle Universities Nuclear Laboratory C215500100012 (CCW,1USATNL) At low energies LENA ECRIS electron C215500100013 cyclotron resonance ion source was used for C215500100014 measurements. C215500100015 SAMPLE (8-O-16,ENR=0.116) C215500100016 (8-O-17,ENR=0.877) C215500100017 (8-O-18,ENR=0.007) Targets of 17-O were prepared by C215500100018 anodizing 0.5-mm-thick tantalum backings in 17-O C215500100019 enriched water.The targets withstood beam charge C215500100020 accumulations up to 55 C at a beam intensity of 2.0 C215500100021 mA without any degradation in the maximum height of C215500100022 the yield curves. The width of the yield curves (i.e., C215500100023 the target thickness) reduced noticeably because of C215500100024 target sputtering (at a rate of 0.07-0.22 keV/C, C215500100025 depending on the target and the beam intensity). C215500100026 Targets were discarded when the thickness degraded by C215500100027 more than 25%, which typically occurred at charge C215500100028 accumulations of 30 C. C215500100029 DETECTOR (HPGE) The LENA gamma-gamma coincidence spectrometer C215500100030 consists of an 135% HPGe detector oriented at 0deg C215500100031 with respect to the beam axis. The distance between C215500100032 the HPGe detector and the target midpoint was 1.1 cm C215500100033 and covered a large solid angle. C215500100034 (NAICR) HPGe detector was surrounded by a 16-segment C215500100035 NaI(Tl) annulus, which provided almost 4Pi solid C215500100036 angle coverage. C215500100037 (SCIN) Plastic scintillator paddles of 5 cm thickness C215500100038 covered the two counters on five sides and suppressed C215500100039 cosmic-ray muon events. C215500100040 METHOD (COINC) Coincidence between HPGe and NaI(Tl) crystal C215500100041 was required. Timing gate was set sufficiently wide C215500100042 to 500 ns because of the long mean lifetime of the C215500100043 Ex = 1121-keV level in 18F. C215500100044 CORRECTION Data corrected for degradation of target thickness C215500100045 caused by intense proton beam. C215500100046 HISTORY (20150518C) Compiled by S.H. C215500100047 ENDBIB 45 0 C215500100048 NOCOMMON 0 0 C215500100049 ENDSUBENT 48 0 C215500199999 SUBENT C2155002 20150518 C151C215500200001 BIB 3 3 C215500200002 REACTION (8-O-17(P,G)9-F-18,,SIG,,SFC) C215500200003 STATUS (TABLE) Data taken from tab. 3 of the reference C215500200004 ERR-ANALYS (DATA-ERR) No information given C215500200005 ENDBIB 3 0 C215500200006 NOCOMMON 0 0 C215500200007 DATA 4 6 C215500200008 EN-CM EN-RSL DATA DATA-ERR C215500200009 KEV KEV B*KEV B*KEV C215500200010 160.1 1.0 5.2 0.6 C215500200011 174.5 1.5 4.9 0.6 C215500200012 228.1 1.9 6.0 0.5 C215500200013 255.1 1.3 6.1 0.5 C215500200014 276.4 1.9 6.7 0.5 C215500200015 300.7 1.6 6.9 0.5 C215500200016 ENDDATA 8 0 C215500200017 ENDSUBENT 16 0 C215500299999 SUBENT C2155003 20150518 C151C215500300001 BIB 4 7 C215500300002 REACTION (8-O-17(P,G),,WID/STR) C215500300003 STATUS (TABLE) Data taken from tab. 2 of the reference C215500300004 FLAG (1.) Data obtained from coincidence measurement C215500300005 (2.) Data obtained from singles measurement C215500300006 (3.) Mean value C215500300007 ERR-ANALYS (DATA-ERR) Total uncertainty. Systematic and C215500300008 statistical uncertainties added in quadrature. C215500300009 ENDBIB 7 0 C215500300010 NOCOMMON 0 0 C215500300011 DATA 4 6 C215500300012 EN-RES-CM DATA DATA-ERR FLAG C215500300013 KEV MILLI-EV MILLI-EV NO-DIM C215500300014 183.0 1.89 0.14 1. C215500300015 183.0 1.82 0.13 2. C215500300016 183.0 1.86 0.13 3. C215500300017 489.0 12.9 0.9 1. C215500300018 489.0 14.5 1.0 2. C215500300019 489.0 13.7 1.0 3. C215500300020 ENDDATA 8 0 C215500300021 ENDSUBENT 20 0 C215500399999 ENDENTRY 3 0 C215599999999