ENTRY C2296 20180511 C175C229600000001 SUBENT C2296001 20180511 C175C229600100001 BIB 7 16 C229600100002 TITLE Spallation-Fission Competition in Heaviest Elements; C229600100003 Helium-Ion-Induced Reactions in Plutonium Isotopes C229600100004 AUTHOR (R.A.Glass,R.J.Carr,J.W.Cobble,G.T.Seaborg) C229600100005 REFERENCE (J,PR,104,434,1956) C229600100006 #doi:10.1103/PhysRev.104.434 C229600100007 INSTITUTE (1USABRK,1USAUCX) C229600100008 FACILITY (LINAC,1USABRK) C229600100009 (CYCLO,1USABRK) Bombardments with helium ions of C229600100010 energy up to about 50 MeV and deuterons up to about C229600100011 25-MeV energy are performed on the 60-inch cyclotron C229600100012 of the Crocker Laboratory. C229600100013 METHOD (CHSEP,ACTIV) The method employed consists of C229600100014 cyclotron bombardments of plutonium oxide followed by C229600100015 the chemical isolation and alpha or beta counting of C229600100016 radioactive reaction products. C229600100017 HISTORY (20180511C) BP C229600100018 ENDBIB 16 0 C229600100019 NOCOMMON 0 0 C229600100020 ENDSUBENT 19 0 C229600199999 SUBENT C2296002 20180511 C175C229600200001 BIB 5 13 C229600200002 REACTION (94-PU-238(A,N)96-CM-241,,SIG) C229600200003 SAMPLE (94-PU-238,ENR=0.938) C229600200004 (94-PU-239,ENR=0.058) and small amounts of C229600200005 Pu-240,Pu-241 and Pu-242. C229600200006 ERR-ANALYS (ERR-T) These errors can be combined to give the C229600200007 following average total errors. C229600200008 (ERR-1,1.,5.) integrated beam intensity. C229600200009 (ERR-2) electroplated target density. C229600200010 (ERR-3,20.,25.) disintegration rates for electron- C229600200011 capture-unstable products, due mainly to counting C229600200012 efficiency uncertainties. C229600200013 DECAY-DATA (96-CM-241,35.0D,EC) C229600200014 STATUS (TABLE) Table I, page 438. C229600200015 ENDBIB 13 0 C229600200016 COMMON 2 3 C229600200017 ERR-T ERR-2 C229600200018 PER-CENT PER-CENT C229600200019 25.0 10.0 C229600200020 ENDCOMMON 3 0 C229600200021 DATA 2 6 C229600200022 EN DATA C229600200023 MEV MB C229600200024 25.2 4.6 C229600200025 28.7 7.1 C229600200026 33.0 6.0 C229600200027 36.6 3.1 C229600200028 42.2 2.5 C229600200029 47.4 2.8 C229600200030 ENDDATA 8 0 C229600200031 ENDSUBENT 30 0 C229600299999 SUBENT C2296003 20180511 C175C229600300001 BIB 5 12 C229600300002 REACTION (94-PU-238(A,2N)96-CM-240,,SIG) C229600300003 SAMPLE (94-PU-238,ENR=0.938) C229600300004 (94-PU-239,ENR=0.058) and small amounts of C229600300005 Pu-240,Pu-241 and Pu-242. C229600300006 ERR-ANALYS (ERR-T) These errors can be combined to give the C229600300007 following average total errors. C229600300008 (ERR-1,1.,5.) integrated beam intensity. C229600300009 (ERR-2) electroplated target density. C229600300010 (ERR-3) disintegration rates for alpha particle- C229600300011 emitting spallation products. C229600300012 DECAY-DATA (96-CM-240,27.0D,A) C229600300013 STATUS (TABLE) Table I, page 438. C229600300014 ENDBIB 12 0 C229600300015 COMMON 3 3 C229600300016 ERR-T ERR-2 ERR-3 C229600300017 PER-CENT PER-CENT PER-CENT C229600300018 15.0 10.0 10.0 C229600300019 ENDCOMMON 3 0 C229600300020 DATA 2 7 C229600300021 EN DATA C229600300022 MEV MB C229600300023 25.2 15.0 C229600300024 28.7 14.0 C229600300025 30.2 9.9 C229600300026 33.0 8.9 C229600300027 36.6 4.7 C229600300028 42.2 4.3 C229600300029 47.4 3.5 C229600300030 ENDDATA 9 0 C229600300031 ENDSUBENT 30 0 C229600399999 SUBENT C2296004 20180511 C175C229600400001 BIB 5 13 C229600400002 REACTION (94-PU-238(A,4N)96-CM-238,,SIG) C229600400003 SAMPLE (94-PU-238,ENR=0.938) C229600400004 (94-PU-239,ENR=0.058) and small amounts of C229600400005 Pu-240,Pu-241 and Pu-242. C229600400006 ERR-ANALYS (ERR-T) These errors can be combined to give the C229600400007 following average total errors. C229600400008 (ERR-1,1.,5.) integrated beam intensity. C229600400009 (ERR-2) electroplated target density. C229600400010 (ERR-3,20.,25.) disintegration rates for electron- C229600400011 capture-unstable products, due mainly to counting C229600400012 efficiency uncertainties. C229600400013 DECAY-DATA (96-CM-238,2.5HR,EC) C229600400014 STATUS (TABLE) Table I, page 438. C229600400015 ENDBIB 13 0 C229600400016 COMMON 2 3 C229600400017 ERR-T ERR-2 C229600400018 PER-CENT PER-CENT C229600400019 25.0 10.0 C229600400020 ENDCOMMON 3 0 C229600400021 DATA 2 3 C229600400022 EN DATA C229600400023 MEV MB C229600400024 36.6 0.002 C229600400025 42.2 0.19 C229600400026 47.4 0.26 C229600400027 ENDDATA 5 0 C229600400028 ENDSUBENT 27 0 C229600499999 SUBENT C2296005 20180511 C175C229600500001 BIB 5 13 C229600500002 REACTION (94-PU-238(A,X)95-AM-240,,SIG) C229600500003 SAMPLE (94-PU-238,ENR=0.938) C229600500004 (94-PU-239,ENR=0.058) and small amounts of C229600500005 Pu-240,Pu-241 and Pu-242. C229600500006 ERR-ANALYS (ERR-T) These errors can be combined to give the C229600500007 following average total errors. C229600500008 (ERR-1,1.,5.) integrated beam intensity. C229600500009 (ERR-2) electroplated target density. C229600500010 (ERR-3,20.,25.) disintegration rates for electron- C229600500011 capture-unstable products, due mainly to counting C229600500012 efficiency uncertainties. C229600500013 DECAY-DATA (95-AM-240,51.0HR,EC) C229600500014 STATUS (TABLE) Table I, page 438. C229600500015 ENDBIB 13 0 C229600500016 COMMON 2 3 C229600500017 ERR-T ERR-2 C229600500018 PER-CENT PER-CENT C229600500019 25.0 10.0 C229600500020 ENDCOMMON 3 0 C229600500021 DATA 2 6 C229600500022 EN DATA C229600500023 MEV MB C229600500024 28.7 2.6 C229600500025 30.2 1.9 C229600500026 33.0 3.3 C229600500027 36.6 15.0 C229600500028 42.2 13.0 C229600500029 47.4 8.0 C229600500030 ENDDATA 8 0 C229600500031 ENDSUBENT 30 0 C229600599999 SUBENT C2296006 20180511 C175C229600600001 BIB 5 13 C229600600002 REACTION (94-PU-238(A,X)95-AM-239,CUM,SIG) C229600600003 SAMPLE (94-PU-238,ENR=0.938) C229600600004 (94-PU-239,ENR=0.058) and small amounts of C229600600005 Pu-240,Pu-241 and Pu-242. C229600600006 ERR-ANALYS (ERR-T) These errors can be combined to give the C229600600007 following average total errors. C229600600008 (ERR-1,1.,5.) integrated beam intensity. C229600600009 (ERR-2) electroplated target density. C229600600010 (ERR-3,20.,25.) disintegration rates for electron- C229600600011 capture-unstable products, due mainly to counting C229600600012 efficiency uncertainties. C229600600013 DECAY-DATA (95-AM-239,12.0HR,EC) C229600600014 STATUS (TABLE) Table I, page 438. C229600600015 ENDBIB 13 0 C229600600016 COMMON 2 3 C229600600017 ERR-T ERR-2 C229600600018 PER-CENT PER-CENT C229600600019 25.0 10.0 C229600600020 ENDCOMMON 3 0 C229600600021 DATA 2 6 C229600600022 EN DATA C229600600023 MEV MB C229600600024 28.7 3.0 C229600600025 30.2 5.2 C229600600026 33.0 6.9 C229600600027 36.6 27.0 C229600600028 42.2 22.0 C229600600029 47.4 18.0 C229600600030 ENDDATA 8 0 C229600600031 ENDSUBENT 30 0 C229600699999 SUBENT C2296007 20180511 C175C229600700001 BIB 4 12 C229600700002 REACTION (94-PU-238(A,F)38-SR-91,(CUM),SIG) C229600700003 SAMPLE (94-PU-238,ENR=0.938) C229600700004 (94-PU-239,ENR=0.058) and small amounts of C229600700005 Pu-240,Pu-241 and Pu-242. C229600700006 ERR-ANALYS (ERR-T) These errors can be combined to give the C229600700007 following average total errors. C229600700008 (ERR-1,1.,5.) integrated beam intensity. C229600700009 (ERR-2) electroplated target density. C229600700010 (ERR-3,20.,25.) disintegration rates for negatron- C229600700011 emitting fission products, due mainly to counting C229600700012 correction uncertainties. C229600700013 STATUS (TABLE) Table I, page 438. C229600700014 ENDBIB 12 0 C229600700015 COMMON 2 3 C229600700016 ERR-T ERR-2 C229600700017 PER-CENT PER-CENT C229600700018 25.0 10.0 C229600700019 ENDCOMMON 3 0 C229600700020 DATA 2 5 C229600700021 EN DATA C229600700022 MEV MB C229600700023 28.7 14.0 C229600700024 33.0 17.0 C229600700025 36.6 12.0 C229600700026 42.2 11.0 C229600700027 47.4 29.0 C229600700028 ENDDATA 7 0 C229600700029 ENDSUBENT 28 0 C229600799999 SUBENT C2296008 20180511 C175C229600800001 BIB 4 12 C229600800002 REACTION (94-PU-238(A,F)48-CD-115,(CUM),SIG) M+G C229600800003 SAMPLE (94-PU-238,ENR=0.938) C229600800004 (94-PU-239,ENR=0.058) and small amounts of C229600800005 Pu-240,Pu-241 and Pu-242. C229600800006 ERR-ANALYS (ERR-T) These errors can be combined to give the C229600800007 following average total errors. C229600800008 (ERR-1,1.,5.) integrated beam intensity. C229600800009 (ERR-2) electroplated target density. C229600800010 (ERR-3,20.,25.) disintegration rates for negatron- C229600800011 emitting fission products, due mainly to counting C229600800012 correction uncertainties. C229600800013 STATUS (TABLE) Table I, page 438. C229600800014 ENDBIB 12 0 C229600800015 COMMON 2 3 C229600800016 ERR-T ERR-2 C229600800017 PER-CENT PER-CENT C229600800018 25.0 10.0 C229600800019 ENDCOMMON 3 0 C229600800020 DATA 2 7 C229600800021 EN DATA C229600800022 MEV MB C229600800023 25.2 10.0 C229600800024 28.7 23.0 C229600800025 30.2 28.0 C229600800026 33.0 43.0 C229600800027 36.6 38.0 C229600800028 42.2 43.0 C229600800029 47.4 57.0 C229600800030 ENDDATA 9 0 C229600800031 ENDSUBENT 30 0 C229600899999 SUBENT C2296009 20180511 C175C229600900001 BIB 4 12 C229600900002 REACTION (94-PU-238(A,F)56-BA-140,(CUM),SIG) C229600900003 SAMPLE (94-PU-238,ENR=0.938) C229600900004 (94-PU-239,ENR=0.058) and small amounts of C229600900005 Pu-240,Pu-241 and Pu-242. C229600900006 ERR-ANALYS (ERR-T) These errors can be combined to give the C229600900007 following average total errors. C229600900008 (ERR-1,1.,5.) integrated beam intensity. C229600900009 (ERR-2) electroplated target density. C229600900010 (ERR-3,20.,25.) disintegration rates for negatron- C229600900011 emitting fission products, due mainly to counting C229600900012 correction uncertainties. C229600900013 STATUS (TABLE) Table I, page 438. C229600900014 ENDBIB 12 0 C229600900015 COMMON 2 3 C229600900016 ERR-T ERR-2 C229600900017 PER-CENT PER-CENT C229600900018 25.0 10.0 C229600900019 ENDCOMMON 3 0 C229600900020 DATA 2 7 C229600900021 EN DATA C229600900022 MEV MB C229600900023 25.2 10.0 C229600900024 28.7 12.0 C229600900025 30.2 17.0 C229600900026 33.0 20.0 C229600900027 36.6 22.0 C229600900028 42.2 15.0 C229600900029 47.4 19.0 C229600900030 ENDDATA 9 0 C229600900031 ENDSUBENT 30 0 C229600999999 SUBENT C2296010 20180511 C175C229601000001 BIB 4 12 C229601000002 REACTION (94-PU-238(A,F)58-CE-143,(CUM),SIG) C229601000003 SAMPLE (94-PU-238,ENR=0.938) C229601000004 (94-PU-239,ENR=0.058) and small amounts of C229601000005 Pu-240,Pu-241 and Pu-242. C229601000006 ERR-ANALYS (ERR-T) These errors can be combined to give the C229601000007 following average total errors. C229601000008 (ERR-1,1.,5.) integrated beam intensity. C229601000009 (ERR-2) electroplated target density. C229601000010 (ERR-3,20.,25.) disintegration rates for negatron- C229601000011 emitting fission products, due mainly to counting C229601000012 correction uncertainties. C229601000013 STATUS (TABLE) Table I, page 438. C229601000014 ENDBIB 12 0 C229601000015 COMMON 2 3 C229601000016 ERR-T ERR-2 C229601000017 PER-CENT PER-CENT C229601000018 25.0 10.0 C229601000019 ENDCOMMON 3 0 C229601000020 DATA 2 3 C229601000021 EN DATA C229601000022 MEV MB C229601000023 30.2 25.0 C229601000024 36.6 34.0 C229601000025 42.2 22.0 C229601000026 ENDDATA 5 0 C229601000027 ENDSUBENT 26 0 C229601099999 SUBENT C2296011 20180511 C175C229601100001 BIB 4 12 C229601100002 REACTION (94-PU-238(A,F)60-ND-147,(CUM),SIG) C229601100003 SAMPLE (94-PU-238,ENR=0.938) C229601100004 (94-PU-239,ENR=0.058) and small amounts of C229601100005 Pu-240,Pu-241 and Pu-242. C229601100006 ERR-ANALYS (ERR-T) These errors can be combined to give the C229601100007 following average total errors. C229601100008 (ERR-1,1.,5.) integrated beam intensity. C229601100009 (ERR-2) electroplated target density. C229601100010 (ERR-3,20.,25.) disintegration rates for negatron- C229601100011 emitting fission products, due mainly to counting C229601100012 correction uncertainties. C229601100013 STATUS (TABLE) Table I, page 438. C229601100014 ENDBIB 12 0 C229601100015 COMMON 2 3 C229601100016 ERR-T ERR-2 C229601100017 PER-CENT PER-CENT C229601100018 25.0 10.0 C229601100019 ENDCOMMON 3 0 C229601100020 DATA 2 3 C229601100021 EN DATA C229601100022 MEV MB C229601100023 30.2 17.0 C229601100024 36.6 23.0 C229601100025 42.2 20.0 C229601100026 ENDDATA 5 0 C229601100027 ENDSUBENT 26 0 C229601199999 SUBENT C2296012 20180511 C175C229601200001 BIB 4 12 C229601200002 REACTION (94-PU-238(A,F)63-EU-156,(CUM),SIG) C229601200003 SAMPLE (94-PU-238,ENR=0.938) C229601200004 (94-PU-239,ENR=0.058) and small amounts of C229601200005 Pu-240,Pu-241 and Pu-242. C229601200006 ERR-ANALYS (ERR-T) These errors can be combined to give the C229601200007 following average total errors. C229601200008 (ERR-1,1.,5.) integrated beam intensity. C229601200009 (ERR-2) electroplated target density. C229601200010 (ERR-3,20.,25.) disintegration rates for negatron- C229601200011 emitting fission products, due mainly to counting C229601200012 correction uncertainties. C229601200013 STATUS (TABLE) Table I, page 438. C229601200014 ENDBIB 12 0 C229601200015 COMMON 2 3 C229601200016 ERR-T ERR-2 C229601200017 PER-CENT PER-CENT C229601200018 25.0 10.0 C229601200019 ENDCOMMON 3 0 C229601200020 DATA 2 3 C229601200021 EN DATA C229601200022 MEV MB C229601200023 30.2 2.8 C229601200024 36.6 3.6 C229601200025 42.2 3.7 C229601200026 ENDDATA 5 0 C229601200027 ENDSUBENT 26 0 C229601299999 SUBENT C2296013 20180511 C175C229601300001 BIB 4 12 C229601300002 REACTION (94-PU-238(A,F)65-TB-161,(CUM),SIG) C229601300003 SAMPLE (94-PU-238,ENR=0.938) C229601300004 (94-PU-239,ENR=0.058) and small amounts of C229601300005 Pu-240,Pu-241 and Pu-242. C229601300006 ERR-ANALYS (ERR-T) These errors can be combined to give the C229601300007 following average total errors. C229601300008 (ERR-1,1.,5.) integrated beam intensity. C229601300009 (ERR-2) electroplated target density. C229601300010 (ERR-3,20.,25.) disintegration rates for negatron- C229601300011 emitting fission products, due mainly to counting C229601300012 correction uncertainties. C229601300013 STATUS (TABLE) Table I, page 438. C229601300014 ENDBIB 12 0 C229601300015 COMMON 2 3 C229601300016 ERR-T ERR-2 C229601300017 PER-CENT PER-CENT C229601300018 25.0 10.0 C229601300019 ENDCOMMON 3 0 C229601300020 DATA 2 3 C229601300021 EN DATA C229601300022 MEV MB C229601300023 30.2 0.48 C229601300024 36.6 1.9 C229601300025 42.2 1.0 C229601300026 ENDDATA 5 0 C229601300027 ENDSUBENT 26 0 C229601399999 SUBENT C2296014 20180511 C175C229601400001 BIB 6 14 C229601400002 REACTION (94-PU-239(A,N)96-CM-242,,SIG) C229601400003 SAMPLE (94-PU-239,ENR=0.99) C229601400004 ERR-ANALYS (ERR-T) These errors can be combined to give the C229601400005 following average total errors. C229601400006 (ERR-1,1.,5.) integrated beam intensity. C229601400007 (ERR-2) electroplated target density. C229601400008 (ERR-3) disintegration rates for alpha particle- C229601400009 emitting spallation products. C229601400010 FLAG (1.) Value thus indicated has been adjusted to the C229601400011 (alpha,n) excitation function and serves as a basis C229601400012 for estimating all other cross sections, otherwise C229601400013 only of relative significance, at this energy. C229601400014 DECAY-DATA (96-CM-242,162.0D,A) C229601400015 STATUS (TABLE) Table II, page 439. C229601400016 ENDBIB 14 0 C229601400017 COMMON 3 3 C229601400018 ERR-T ERR-2 ERR-3 C229601400019 PER-CENT PER-CENT PER-CENT C229601400020 15.0 10.0 10.0 C229601400021 ENDCOMMON 3 0 C229601400022 DATA 3 12 C229601400023 EN DATA FLAG C229601400024 MEV MB NO-DIM C229601400025 20.2 1.1 C229601400026 24.5 0.84 C229601400027 26.8 1.1 1. C229601400028 27.5 1.3 C229601400029 34.0 2.4 C229601400030 38.0 2.2 C229601400031 39.2 1.8 C229601400032 40.7 0.97 C229601400033 43.8 1.5 1. C229601400034 44.3 1.6 1. C229601400035 46.0 2.6 C229601400036 47.5 0.82 C229601400037 ENDDATA 14 0 C229601400038 ENDSUBENT 37 0 C229601499999 SUBENT C2296015 20180511 C175C229601500001 BIB 5 11 C229601500002 REACTION (94-PU-239(A,2N)96-CM-241,,SIG) C229601500003 SAMPLE (94-PU-239,ENR=0.99) C229601500004 ERR-ANALYS (ERR-T) These errors can be combined to give the C229601500005 following average total errors. C229601500006 (ERR-1,1.,5.) integrated beam intensity. C229601500007 (ERR-2) electroplated target density. C229601500008 (ERR-3,20.,25.) disintegration rates for electron- C229601500009 capture-unstable products, due mainly to counting C229601500010 efficiency uncertainties. C229601500011 DECAY-DATA (96-CM-241,35.0D,EC) C229601500012 STATUS (TABLE) Table II, page 439. C229601500013 ENDBIB 11 0 C229601500014 COMMON 2 3 C229601500015 ERR-T ERR-2 C229601500016 PER-CENT PER-CENT C229601500017 25.0 10.0 C229601500018 ENDCOMMON 3 0 C229601500019 DATA 2 11 C229601500020 EN DATA C229601500021 MEV MB C229601500022 24.5 6.7 C229601500023 26.8 9.8 C229601500024 27.5 12.0 C229601500025 34.0 9.5 C229601500026 38.0 9.0 C229601500027 39.2 8.1 C229601500028 40.7 7.3 C229601500029 43.8 7.5 C229601500030 44.3 5.8 C229601500031 46.0 4.2 C229601500032 47.5 4.6 C229601500033 ENDDATA 13 0 C229601500034 ENDSUBENT 33 0 C229601599999 SUBENT C2296016 20180511 C175C229601600001 BIB 5 10 C229601600002 REACTION (94-PU-239(A,3N)96-CM-240,,SIG) C229601600003 SAMPLE (94-PU-239,ENR=0.99) C229601600004 ERR-ANALYS (ERR-T) These errors can be combined to give the C229601600005 following average total errors. C229601600006 (ERR-1,1.,5.) integrated beam intensity. C229601600007 (ERR-2) electroplated target density. C229601600008 (ERR-3) disintegration rates for alpha particle- C229601600009 emitting spallation products. C229601600010 DECAY-DATA (96-CM-240,27.0D,A) C229601600011 STATUS (TABLE) Table II, page 439. C229601600012 ENDBIB 10 0 C229601600013 COMMON 3 3 C229601600014 ERR-T ERR-2 ERR-3 C229601600015 PER-CENT PER-CENT PER-CENT C229601600016 15.0 10.0 10.0 C229601600017 ENDCOMMON 3 0 C229601600018 DATA 2 11 C229601600019 EN DATA C229601600020 MEV MB C229601600021 24.5 0.00001 C229601600022 26.8 1.2 C229601600023 27.5 0.86 C229601600024 34.0 3.5 C229601600025 38.0 4.5 C229601600026 39.2 3.6 C229601600027 40.7 2.3 C229601600028 43.8 2.7 C229601600029 44.3 3.0 C229601600030 46.0 2.1 C229601600031 47.5 1.9 C229601600032 ENDDATA 13 0 C229601600033 ENDSUBENT 32 0 C229601699999 SUBENT C2296017 20180511 C175C229601700001 BIB 5 11 C229601700002 REACTION (94-PU-239(A,4N)96-CM-239,,SIG) C229601700003 SAMPLE (94-PU-239,ENR=0.99) C229601700004 ERR-ANALYS (ERR-T) These errors can be combined to give the C229601700005 following average total errors. C229601700006 (ERR-1,1.,5.) integrated beam intensity. C229601700007 (ERR-2) electroplated target density. C229601700008 (ERR-3,20.,25.) disintegration rates for electron- C229601700009 capture-unstable products, due mainly to counting C229601700010 efficiency uncertainties. C229601700011 DECAY-DATA (96-CM-239,3.0HR,EC) C229601700012 STATUS (TABLE) Table II, page 439. C229601700013 ENDBIB 11 0 C229601700014 COMMON 2 3 C229601700015 ERR-T ERR-2 C229601700016 PER-CENT PER-CENT C229601700017 25.0 10.0 C229601700018 ENDCOMMON 3 0 C229601700019 DATA 2 2 C229601700020 EN DATA C229601700021 MEV MB C229601700022 40.7 0.8 C229601700023 47.5 0.6 C229601700024 ENDDATA 4 0 C229601700025 ENDSUBENT 24 0 C229601799999 SUBENT C2296018 20180511 C175C229601800001 BIB 5 11 C229601800002 REACTION (94-PU-239(A,5N)96-CM-238,,SIG) C229601800003 SAMPLE (94-PU-239,ENR=0.99) C229601800004 ERR-ANALYS (ERR-T) These errors can be combined to give the C229601800005 following average total errors. C229601800006 (ERR-1,1.,5.) integrated beam intensity. C229601800007 (ERR-2) electroplated target density. C229601800008 (ERR-3,20.,25.) disintegration rates for electron- C229601800009 capture-unstable products, due mainly to counting C229601800010 efficiency uncertainties. C229601800011 DECAY-DATA (96-CM-238,2.5HR,EC) C229601800012 STATUS (TABLE) Table II, page 439. C229601800013 ENDBIB 11 0 C229601800014 COMMON 2 3 C229601800015 ERR-T ERR-2 C229601800016 PER-CENT PER-CENT C229601800017 25.0 10.0 C229601800018 ENDCOMMON 3 0 C229601800019 DATA 2 1 C229601800020 EN DATA C229601800021 MEV MB C229601800022 46.0 0.004 C229601800023 ENDDATA 3 0 C229601800024 ENDSUBENT 23 0 C229601899999 SUBENT C2296019 20180511 C175C229601900001 BIB 5 13 C229601900002 REACTION (94-PU-239(A,P)95-AM-242-G,,SIG) C229601900003 SAMPLE (94-PU-239,ENR=0.99) C229601900004 ERR-ANALYS (ERR-T) These errors can be combined to give the C229601900005 following average total errors. C229601900006 (ERR-1,1.,5.) integrated beam intensity. C229601900007 (ERR-2) electroplated target density. C229601900008 (ERR-3,20.,25.) disintegration rates for electron- C229601900009 capture-unstable products, due mainly to counting C229601900010 efficiency uncertainties. C229601900011 DECAY-DATA (95-AM-242-G,16.0HR,B-) C229601900012 Note by compiler: The 16hr Am242 activity is designatedC229601900013 by authors as Am242m. C229601900014 STATUS (TABLE) Table II, page 439. C229601900015 ENDBIB 13 0 C229601900016 COMMON 2 3 C229601900017 ERR-T ERR-2 C229601900018 PER-CENT PER-CENT C229601900019 25.0 10.0 C229601900020 ENDCOMMON 3 0 C229601900021 DATA 2 9 C229601900022 EN DATA C229601900023 MEV MB C229601900024 20.2 0.030 C229601900025 24.5 0.58 C229601900026 26.8 0.72 C229601900027 27.5 0.29 C229601900028 34.0 1.3 C229601900029 38.0 0.96 C229601900030 39.2 0.58 C229601900031 40.7 1.1 C229601900032 47.5 0.56 C229601900033 ENDDATA 11 0 C229601900034 ENDSUBENT 33 0 C229601999999 SUBENT C2296020 20180511 C175C229602000001 BIB 5 11 C229602000002 REACTION (94-PU-239(A,X)95-AM-240,,SIG) C229602000003 SAMPLE (94-PU-239,ENR=0.99) C229602000004 ERR-ANALYS (ERR-T) These errors can be combined to give the C229602000005 following average total errors. C229602000006 (ERR-1,1.,5.) integrated beam intensity. C229602000007 (ERR-2) electroplated target density. C229602000008 (ERR-3,20.,25.) disintegration rates for electron- C229602000009 capture-unstable products, due mainly to counting C229602000010 efficiency uncertainties. C229602000011 DECAY-DATA (95-AM-240,51.0HR,EC) C229602000012 STATUS (TABLE) Table II, page 439. C229602000013 ENDBIB 11 0 C229602000014 COMMON 2 3 C229602000015 ERR-T ERR-2 C229602000016 PER-CENT PER-CENT C229602000017 25.0 10.0 C229602000018 ENDCOMMON 3 0 C229602000019 DATA 2 8 C229602000020 EN DATA C229602000021 MEV MB C229602000022 26.8 0.30 C229602000023 34.0 5.2 C229602000024 38.0 7.7 C229602000025 39.2 9.6 C229602000026 40.7 1.4 C229602000027 43.8 15.0 C229602000028 46.0 13.0 C229602000029 47.5 17.0 C229602000030 ENDDATA 10 0 C229602000031 ENDSUBENT 30 0 C229602099999 SUBENT C2296021 20180511 C175C229602100001 BIB 5 11 C229602100002 REACTION (94-PU-239(A,X)95-AM-239,,SIG) C229602100003 SAMPLE (94-PU-239,ENR=0.99) C229602100004 ERR-ANALYS (ERR-T) These errors can be combined to give the C229602100005 following average total errors. C229602100006 (ERR-1,1.,5.) integrated beam intensity. C229602100007 (ERR-2) electroplated target density. C229602100008 (ERR-3,20.,25.) disintegration rates for electron- C229602100009 capture-unstable products, due mainly to counting C229602100010 efficiency uncertainties. C229602100011 DECAY-DATA (95-AM-239,12.0HR,EC) C229602100012 STATUS (TABLE) Table II, page 439. C229602100013 ENDBIB 11 0 C229602100014 COMMON 2 3 C229602100015 ERR-T ERR-2 C229602100016 PER-CENT PER-CENT C229602100017 25.0 10.0 C229602100018 ENDCOMMON 3 0 C229602100019 DATA 2 4 C229602100020 EN DATA-MAX C229602100021 MEV MB C229602100022 38.0 0.3 C229602100023 39.2 0.4 C229602100024 46.0 0.4 C229602100025 47.5 0.3 C229602100026 ENDDATA 6 0 C229602100027 ENDSUBENT 26 0 C229602199999 SUBENT C2296022 20180514 C175C229602200001 BIB 5 11 C229602200002 REACTION (94-PU-239(A,F)35-BR-82,,SIG) C229602200003 SAMPLE (94-PU-239,ENR=0.99) C229602200004 ERR-ANALYS (ERR-T) These errors can be combined to give the C229602200005 following average total errors. C229602200006 (ERR-1,1.,5.) integrated beam intensity. C229602200007 (ERR-2) electroplated target density. C229602200008 (ERR-3,20.,25.) disintegration rates for negatron- C229602200009 emitting fission products, due mainly to counting C229602200010 correction uncertainties. C229602200011 FLAG (1.) Product is a shielded nuclide. C229602200012 STATUS (TABLE) Table II, page 439. C229602200013 ENDBIB 11 0 C229602200014 COMMON 2 3 C229602200015 ERR-T ERR-2 C229602200016 PER-CENT PER-CENT C229602200017 25.0 10.0 C229602200018 ENDCOMMON 3 0 C229602200019 DATA 3 1 C229602200020 EN DATA FLAG C229602200021 MEV MB NO-DIM C229602200022 24.0 0.5 1. C229602200023 ENDDATA 3 0 C229602200024 ENDSUBENT 23 0 C229602299999 SUBENT C2296023 20180514 C175C229602300001 BIB 4 10 C229602300002 REACTION (94-PU-239(A,F)35-BR-83,(CUM),SIG) C229602300003 SAMPLE (94-PU-239,ENR=0.99) C229602300004 ERR-ANALYS (ERR-T) These errors can be combined to give the C229602300005 following average total errors. C229602300006 (ERR-1,1.,5.) integrated beam intensity. C229602300007 (ERR-2) electroplated target density. C229602300008 (ERR-3,20.,25.) disintegration rates for negatron- C229602300009 emitting fission products, due mainly to counting C229602300010 correction uncertainties. C229602300011 STATUS (TABLE) Table II, page 439. C229602300012 ENDBIB 10 0 C229602300013 COMMON 2 3 C229602300014 ERR-T ERR-2 C229602300015 PER-CENT PER-CENT C229602300016 25.0 10.0 C229602300017 ENDCOMMON 3 0 C229602300018 DATA 2 1 C229602300019 EN DATA C229602300020 MEV MB C229602300021 24.0 0.23 C229602300022 ENDDATA 3 0 C229602300023 ENDSUBENT 22 0 C229602399999 SUBENT C2296024 20180514 C175C229602400001 BIB 5 12 C229602400002 REACTION (94-PU-239(A,F)38-SR-89,(CUM),SIG) C229602400003 SAMPLE (94-PU-239,ENR=0.99) C229602400004 ERR-ANALYS (ERR-T) These errors can be combined to give the C229602400005 following average total errors. C229602400006 (ERR-1,1.,5.) integrated beam intensity. C229602400007 (ERR-2) electroplated target density. C229602400008 (ERR-3,20.,25.) disintegration rates for negatron- C229602400009 emitting fission products, due mainly to counting C229602400010 correction uncertainties. C229602400011 FLAG (1.) Value indicated is an average of two C229602400012 determinations. C229602400013 STATUS (TABLE) Table II, page 439. C229602400014 ENDBIB 12 0 C229602400015 COMMON 2 3 C229602400016 ERR-T ERR-2 C229602400017 PER-CENT PER-CENT C229602400018 25.0 10.0 C229602400019 ENDCOMMON 3 0 C229602400020 DATA 3 10 C229602400021 EN DATA FLAG C229602400022 MEV MB NO-DIM C229602400023 20.2 0.06 C229602400024 24.0 0.95 C229602400025 24.5 2.0 C229602400026 27.5 3.4 C229602400027 34.0 4.3 C229602400028 38.0 15.0 1. C229602400029 40.7 9.5 C229602400030 43.8 16.0 C229602400031 46.0 14.0 C229602400032 47.5 15.0 C229602400033 ENDDATA 12 0 C229602400034 ENDSUBENT 33 0 C229602499999 SUBENT C2296025 20180514 C175C229602500001 BIB 5 12 C229602500002 REACTION (94-PU-239(A,F)38-SR-91,(CUM),SIG) C229602500003 SAMPLE (94-PU-239,ENR=0.99) C229602500004 ERR-ANALYS (ERR-T) These errors can be combined to give the C229602500005 following average total errors. C229602500006 (ERR-1,1.,5.) integrated beam intensity. C229602500007 (ERR-2) electroplated target density. C229602500008 (ERR-3,20.,25.) disintegration rates for negatron- C229602500009 emitting fission products, due mainly to counting C229602500010 correction uncertainties. C229602500011 FLAG (1.) Value indicated is an average of two C229602500012 determinations. C229602500013 STATUS (TABLE) Table II, page 439. C229602500014 ENDBIB 12 0 C229602500015 COMMON 2 3 C229602500016 ERR-T ERR-2 C229602500017 PER-CENT PER-CENT C229602500018 25.0 10.0 C229602500019 ENDCOMMON 3 0 C229602500020 DATA 3 9 C229602500021 EN DATA FLAG C229602500022 MEV MB NO-DIM C229602500023 20.2 0.11 C229602500024 24.0 2.1 C229602500025 24.5 3.5 C229602500026 34.0 5.4 C229602500027 38.0 14.0 1. C229602500028 40.7 15.0 C229602500029 43.8 26.0 C229602500030 46.0 17.0 C229602500031 47.5 34.0 C229602500032 ENDDATA 11 0 C229602500033 ENDSUBENT 32 0 C229602599999 SUBENT C2296026 20180514 C175C229602600001 BIB 4 10 C229602600002 REACTION (94-PU-239(A,F)38-SR-92,(CUM),SIG) C229602600003 SAMPLE (94-PU-239,ENR=0.99) C229602600004 ERR-ANALYS (ERR-T) These errors can be combined to give the C229602600005 following average total errors. C229602600006 (ERR-1,1.,5.) integrated beam intensity. C229602600007 (ERR-2) electroplated target density. C229602600008 (ERR-3,20.,25.) disintegration rates for negatron- C229602600009 emitting fission products, due mainly to counting C229602600010 correction uncertainties. C229602600011 STATUS (TABLE) Table II, page 439. C229602600012 ENDBIB 10 0 C229602600013 COMMON 2 3 C229602600014 ERR-T ERR-2 C229602600015 PER-CENT PER-CENT C229602600016 25.0 10.0 C229602600017 ENDCOMMON 3 0 C229602600018 DATA 2 7 C229602600019 EN DATA C229602600020 MEV MB C229602600021 20.2 0.13 C229602600022 24.0 1.4 C229602600023 34.0 6.2 C229602600024 38.0 13.0 C229602600025 40.7 13.0 C229602600026 46.0 17.0 C229602600027 47.5 21.0 C229602600028 ENDDATA 9 0 C229602600029 ENDSUBENT 28 0 C229602699999 SUBENT C2296027 20180514 C175C229602700001 BIB 4 10 C229602700002 REACTION (94-PU-239(A,F)44-RU-105,(CUM),SIG) C229602700003 SAMPLE (94-PU-239,ENR=0.99) C229602700004 ERR-ANALYS (ERR-T) These errors can be combined to give the C229602700005 following average total errors. C229602700006 (ERR-1,1.,5.) integrated beam intensity. C229602700007 (ERR-2) electroplated target density. C229602700008 (ERR-3,20.,25.) disintegration rates for negatron- C229602700009 emitting fission products, due mainly to counting C229602700010 correction uncertainties. C229602700011 STATUS (TABLE) Table II, page 439. C229602700012 ENDBIB 10 0 C229602700013 COMMON 2 3 C229602700014 ERR-T ERR-2 C229602700015 PER-CENT PER-CENT C229602700016 25.0 10.0 C229602700017 ENDCOMMON 3 0 C229602700018 DATA 2 1 C229602700019 EN DATA C229602700020 MEV MB C229602700021 34.0 8.6 C229602700022 ENDDATA 3 0 C229602700023 ENDSUBENT 22 0 C229602799999 SUBENT C2296028 20180514 C175C229602800001 BIB 5 12 C229602800002 REACTION (94-PU-239(A,F)48-CD-115,(CUM),SIG) M+G C229602800003 SAMPLE (94-PU-239,ENR=0.99) C229602800004 ERR-ANALYS (ERR-T) These errors can be combined to give the C229602800005 following average total errors. C229602800006 (ERR-1,1.,5.) integrated beam intensity. C229602800007 (ERR-2) electroplated target density. C229602800008 (ERR-3,20.,25.) disintegration rates for negatron- C229602800009 emitting fission products, due mainly to counting C229602800010 correction uncertainties. C229602800011 FLAG (1.) Value interpolated from graph of peak-to-valley C229602800012 ratio of yield curves vs energy. C229602800013 STATUS (TABLE) Table II, page 439. C229602800014 ENDBIB 12 0 C229602800015 COMMON 2 3 C229602800016 ERR-T ERR-2 C229602800017 PER-CENT PER-CENT C229602800018 25.0 10.0 C229602800019 ENDCOMMON 3 0 C229602800020 DATA 3 9 C229602800021 EN DATA FLAG C229602800022 MEV MB NO-DIM C229602800023 20.2 0.048 C229602800024 24.0 0.7 1. C229602800025 24.5 1.4 C229602800026 27.5 2.6 C229602800027 34.0 5.3 C229602800028 38.0 9.0 C229602800029 40.7 38.0 C229602800030 43.8 68.0 C229602800031 46.0 55.0 C229602800032 ENDDATA 11 0 C229602800033 ENDSUBENT 32 0 C229602899999 SUBENT C2296029 20180514 C175C229602900001 BIB 4 10 C229602900002 REACTION (94-PU-239(A,F)48-CD-117,(CUM),SIG) C229602900003 SAMPLE (94-PU-239,ENR=0.99) C229602900004 ERR-ANALYS (ERR-T) These errors can be combined to give the C229602900005 following average total errors. C229602900006 (ERR-1,1.,5.) integrated beam intensity. C229602900007 (ERR-2) electroplated target density. C229602900008 (ERR-3,20.,25.) disintegration rates for negatron- C229602900009 emitting fission products, due mainly to counting C229602900010 correction uncertainties. C229602900011 STATUS (TABLE) Table II, page 439. C229602900012 ENDBIB 10 0 C229602900013 COMMON 2 3 C229602900014 ERR-T ERR-2 C229602900015 PER-CENT PER-CENT C229602900016 25.0 10.0 C229602900017 ENDCOMMON 3 0 C229602900018 DATA 2 6 C229602900019 EN DATA C229602900020 MEV MB C229602900021 20.2 0.04 C229602900022 34.0 6.2 C229602900023 38.0 18.0 C229602900024 40.7 23.0 C229602900025 46.0 48.0 C229602900026 47.5 85.0 C229602900027 ENDDATA 8 0 C229602900028 ENDSUBENT 27 0 C229602999999 SUBENT C2296030 20180514 C175C229603000001 BIB 4 10 C229603000002 REACTION (94-PU-239(A,F)53-I-131,(CUM),SIG) C229603000003 SAMPLE (94-PU-239,ENR=0.99) C229603000004 ERR-ANALYS (ERR-T) These errors can be combined to give the C229603000005 following average total errors. C229603000006 (ERR-1,1.,5.) integrated beam intensity. C229603000007 (ERR-2) electroplated target density. C229603000008 (ERR-3,20.,25.) disintegration rates for negatron- C229603000009 emitting fission products, due mainly to counting C229603000010 correction uncertainties. C229603000011 STATUS (TABLE) Table II, page 439. C229603000012 ENDBIB 10 0 C229603000013 COMMON 2 3 C229603000014 ERR-T ERR-2 C229603000015 PER-CENT PER-CENT C229603000016 25.0 10.0 C229603000017 ENDCOMMON 3 0 C229603000018 DATA 2 1 C229603000019 EN DATA C229603000020 MEV MB C229603000021 24.0 1.6 C229603000022 ENDDATA 3 0 C229603000023 ENDSUBENT 22 0 C229603099999 SUBENT C2296031 20180514 C175C229603100001 BIB 4 10 C229603100002 REACTION (94-PU-239(A,F)53-I-133,(CUM),SIG) C229603100003 SAMPLE (94-PU-239,ENR=0.99) C229603100004 ERR-ANALYS (ERR-T) These errors can be combined to give the C229603100005 following average total errors. C229603100006 (ERR-1,1.,5.) integrated beam intensity. C229603100007 (ERR-2) electroplated target density. C229603100008 (ERR-3,20.,25.) disintegration rates for negatron- C229603100009 emitting fission products, due mainly to counting C229603100010 correction uncertainties. C229603100011 STATUS (TABLE) Table II, page 439. C229603100012 ENDBIB 10 0 C229603100013 COMMON 2 3 C229603100014 ERR-T ERR-2 C229603100015 PER-CENT PER-CENT C229603100016 25.0 10.0 C229603100017 ENDCOMMON 3 0 C229603100018 DATA 2 1 C229603100019 EN DATA C229603100020 MEV MB C229603100021 24.0 2.1 C229603100022 ENDDATA 3 0 C229603100023 ENDSUBENT 22 0 C229603199999 SUBENT C2296032 20180514 C175C229603200001 BIB 4 10 C229603200002 REACTION (94-PU-239(A,F)56-BA-139,(CUM),SIG) C229603200003 SAMPLE (94-PU-239,ENR=0.99) C229603200004 ERR-ANALYS (ERR-T) These errors can be combined to give the C229603200005 following average total errors. C229603200006 (ERR-1,1.,5.) integrated beam intensity. C229603200007 (ERR-2) electroplated target density. C229603200008 (ERR-3,20.,25.) disintegration rates for negatron- C229603200009 emitting fission products, due mainly to counting C229603200010 correction uncertainties. C229603200011 STATUS (TABLE) Table II, page 439. C229603200012 ENDBIB 10 0 C229603200013 COMMON 2 3 C229603200014 ERR-T ERR-2 C229603200015 PER-CENT PER-CENT C229603200016 25.0 10.0 C229603200017 ENDCOMMON 3 0 C229603200018 DATA 2 6 C229603200019 EN DATA C229603200020 MEV MB C229603200021 20.2 0.29 C229603200022 24.5 5.4 C229603200023 27.5 5.7 C229603200024 40.7 16.0 C229603200025 46.0 20.0 C229603200026 47.5 21.0 C229603200027 ENDDATA 8 0 C229603200028 ENDSUBENT 27 0 C229603299999 SUBENT C2296033 20180514 C175C229603300001 BIB 5 12 C229603300002 REACTION (94-PU-239(A,F)56-BA-140,(CUM),SIG) C229603300003 SAMPLE (94-PU-239,ENR=0.99) C229603300004 ERR-ANALYS (ERR-T) These errors can be combined to give the C229603300005 following average total errors. C229603300006 (ERR-1,1.,5.) integrated beam intensity. C229603300007 (ERR-2) electroplated target density. C229603300008 (ERR-3,20.,25.) disintegration rates for negatron- C229603300009 emitting fission products, due mainly to counting C229603300010 correction uncertainties. C229603300011 FLAG (1.) Value indicated is an average of two C229603300012 determinations. C229603300013 STATUS (TABLE) Table II, page 439. C229603300014 ENDBIB 12 0 C229603300015 COMMON 2 3 C229603300016 ERR-T ERR-2 C229603300017 PER-CENT PER-CENT C229603300018 25.0 10.0 C229603300019 ENDCOMMON 3 0 C229603300020 DATA 3 10 C229603300021 EN DATA FLAG C229603300022 MEV MB NO-DIM C229603300023 20.2 0.19 C229603300024 24.0 3.1 C229603300025 24.5 4.5 C229603300026 27.5 6.3 C229603300027 34.0 12.0 1. C229603300028 38.0 16.0 1. C229603300029 40.7 9.5 C229603300030 43.8 19.0 C229603300031 46.0 18.0 C229603300032 47.5 18.0 C229603300033 ENDDATA 12 0 C229603300034 ENDSUBENT 33 0 C229603399999 SUBENT C2296034 20180514 C175C229603400001 BIB 4 10 C229603400002 REACTION (94-PU-239(A,F)58-CE-143,(CUM),SIG) C229603400003 SAMPLE (94-PU-239,ENR=0.99) C229603400004 ERR-ANALYS (ERR-T) These errors can be combined to give the C229603400005 following average total errors. C229603400006 (ERR-1,1.,5.) integrated beam intensity. C229603400007 (ERR-2) electroplated target density. C229603400008 (ERR-3,20.,25.) disintegration rates for negatron- C229603400009 emitting fission products, due mainly to counting C229603400010 correction uncertainties. C229603400011 STATUS (TABLE) Table II, page 439. C229603400012 ENDBIB 10 0 C229603400013 COMMON 2 3 C229603400014 ERR-T ERR-2 C229603400015 PER-CENT PER-CENT C229603400016 25.0 10.0 C229603400017 ENDCOMMON 3 0 C229603400018 DATA 2 2 C229603400019 EN DATA C229603400020 MEV MB C229603400021 24.0 3.0 C229603400022 34.0 11.0 C229603400023 ENDDATA 4 0 C229603400024 ENDSUBENT 23 0 C229603499999 SUBENT C2296035 20180514 C175C229603500001 BIB 4 10 C229603500002 REACTION (94-PU-239(A,F)58-CE-145,(CUM),SIG) C229603500003 SAMPLE (94-PU-239,ENR=0.99) C229603500004 ERR-ANALYS (ERR-T) These errors can be combined to give the C229603500005 following average total errors. C229603500006 (ERR-1,1.,5.) integrated beam intensity. C229603500007 (ERR-2) electroplated target density. C229603500008 (ERR-3,20.,25.) disintegration rates for negatron- C229603500009 emitting fission products, due mainly to counting C229603500010 correction uncertainties. C229603500011 STATUS (TABLE) Table II, page 439. C229603500012 ENDBIB 10 0 C229603500013 COMMON 2 3 C229603500014 ERR-T ERR-2 C229603500015 PER-CENT PER-CENT C229603500016 25.0 10.0 C229603500017 ENDCOMMON 3 0 C229603500018 DATA 2 1 C229603500019 EN DATA C229603500020 MEV MB C229603500021 34.0 14.0 C229603500022 ENDDATA 3 0 C229603500023 ENDSUBENT 22 0 C229603599999 SUBENT C2296036 20180514 C175C229603600001 BIB 4 10 C229603600002 REACTION (94-PU-239(A,F)60-ND-147,(CUM),SIG) C229603600003 SAMPLE (94-PU-239,ENR=0.99) C229603600004 ERR-ANALYS (ERR-T) These errors can be combined to give the C229603600005 following average total errors. C229603600006 (ERR-1,1.,5.) integrated beam intensity. C229603600007 (ERR-2) electroplated target density. C229603600008 (ERR-3,20.,25.) disintegration rates for negatron- C229603600009 emitting fission products, due mainly to counting C229603600010 correction uncertainties. C229603600011 STATUS (TABLE) Table II, page 439. C229603600012 ENDBIB 10 0 C229603600013 COMMON 2 3 C229603600014 ERR-T ERR-2 C229603600015 PER-CENT PER-CENT C229603600016 25.0 10.0 C229603600017 ENDCOMMON 3 0 C229603600018 DATA 2 1 C229603600019 EN DATA C229603600020 MEV MB C229603600021 46.0 12.0 C229603600022 ENDDATA 3 0 C229603600023 ENDSUBENT 22 0 C229603699999 SUBENT C2296037 20180514 C175C229603700001 BIB 4 10 C229603700002 REACTION (94-PU-239(A,F)63-EU-156,(CUM),SIG) C229603700003 SAMPLE (94-PU-239,ENR=0.99) C229603700004 ERR-ANALYS (ERR-T) These errors can be combined to give the C229603700005 following average total errors. C229603700006 (ERR-1,1.,5.) integrated beam intensity. C229603700007 (ERR-2) electroplated target density. C229603700008 (ERR-3,20.,25.) disintegration rates for negatron- C229603700009 emitting fission products, due mainly to counting C229603700010 correction uncertainties. C229603700011 STATUS (TABLE) Table II, page 439. C229603700012 ENDBIB 10 0 C229603700013 COMMON 2 3 C229603700014 ERR-T ERR-2 C229603700015 PER-CENT PER-CENT C229603700016 25.0 10.0 C229603700017 ENDCOMMON 3 0 C229603700018 DATA 2 3 C229603700019 EN DATA C229603700020 MEV MB C229603700021 24.0 0.32 C229603700022 34.0 0.7 C229603700023 46.0 2.9 C229603700024 ENDDATA 5 0 C229603700025 ENDSUBENT 24 0 C229603799999 SUBENT C2296038 20180514 C175C229603800001 BIB 4 10 C229603800002 REACTION (94-PU-239(A,F)63-EU-157,(CUM),SIG) C229603800003 SAMPLE (94-PU-239,ENR=0.99) C229603800004 ERR-ANALYS (ERR-T) These errors can be combined to give the C229603800005 following average total errors. C229603800006 (ERR-1,1.,5.) integrated beam intensity. C229603800007 (ERR-2) electroplated target density. C229603800008 (ERR-3,20.,25.) disintegration rates for negatron- C229603800009 emitting fission products, due mainly to counting C229603800010 correction uncertainties. C229603800011 STATUS (TABLE) Table II, page 439. C229603800012 ENDBIB 10 0 C229603800013 COMMON 2 3 C229603800014 ERR-T ERR-2 C229603800015 PER-CENT PER-CENT C229603800016 25.0 10.0 C229603800017 ENDCOMMON 3 0 C229603800018 DATA 2 2 C229603800019 EN DATA C229603800020 MEV MB C229603800021 24.0 0.30 C229603800022 46.0 2.3 C229603800023 ENDDATA 4 0 C229603800024 ENDSUBENT 23 0 C229603899999 SUBENT C2296039 20180515 C175C229603900001 BIB 4 10 C229603900002 REACTION (94-PU-239(A,F)65-TB-161,(CUM),SIG) C229603900003 SAMPLE (94-PU-239,ENR=0.99) C229603900004 ERR-ANALYS (ERR-T) These errors can be combined to give the C229603900005 following average total errors. C229603900006 (ERR-1,1.,5.) integrated beam intensity. C229603900007 (ERR-2) electroplated target density. C229603900008 (ERR-3,20.,25.) disintegration rates for negatron- C229603900009 emitting fission products, due mainly to counting C229603900010 correction uncertainties. C229603900011 STATUS (TABLE) Table II, page 439. C229603900012 ENDBIB 10 0 C229603900013 COMMON 2 3 C229603900014 ERR-T ERR-2 C229603900015 PER-CENT PER-CENT C229603900016 25.0 10.0 C229603900017 ENDCOMMON 3 0 C229603900018 DATA 2 1 C229603900019 EN DATA C229603900020 MEV MB C229603900021 46.0 1.9 C229603900022 ENDDATA 3 0 C229603900023 ENDSUBENT 22 0 C229603999999 SUBENT C2296040 20180515 C175C229604000001 BIB 6 24 C229604000002 REACTION (94-PU-242(A,X)96-CM-244,CUM,SIG) C229604000003 Small contribution of (alpha,3n) reaction. C229604000004 SAMPLE (94-PU-242,ENR=0.378) C229604000005 (94-PU-238,ENR=0.586) C229604000006 (94-PU-239,ENR=0.034) and small amounts of Pu240 and C229604000007 Pu241. C229604000008 ERR-ANALYS (ERR-T) These errors can be combined to give the C229604000009 following average total errors. C229604000010 (ERR-1,1.,5.) integrated beam intensity. C229604000011 (ERR-2) electroplated target density. C229604000012 (ERR-3) disintegration rates for alpha particle- C229604000013 emitting spallation products. C229604000014 COMMENT -- Absolute cross sections were determined by C229604000015 referring relative cross sections to C229604000016 Pu238(alpha,2n)Cm240 reaction cross sections, since C229604000017 targets were 58.6% Pu238. C229604000018 -- Product and consequently cross section are for the C229604000019 sum of the (alpha,2n) and (alpha,pn) reaction. Cross C229604000020 sections also include small contributions from the C229604000021 (alpha,3n) reactions at the higher energies. C229604000022 -- Compiler's comment: corrected energy from 28.8 to C229604000023 38.8 MeV. C229604000024 MONITOR (94-PU-238(A,2N)96-CM-240,,SIG) C229604000025 STATUS (TABLE) Table III, page 439. C229604000026 ENDBIB 24 0 C229604000027 COMMON 3 3 C229604000028 ERR-T ERR-2 ERR-3 C229604000029 PER-CENT PER-CENT PER-CENT C229604000030 15.0 10.0 10.0 C229604000031 ENDCOMMON 3 0 C229604000032 DATA 2 7 C229604000033 EN DATA C229604000034 MEV MB C229604000035 23.6 103.0 C229604000036 25.9 116.0 C229604000037 27.1 70.0 C229604000038 28.5 68.0 C229604000039 32.8 30.0 C229604000040 38.8 24.0 C229604000041 43.5 35.0 C229604000042 ENDDATA 9 0 C229604000043 ENDSUBENT 42 0 C229604099999 SUBENT C2296041 20180515 C175C229604100001 BIB 7 20 C229604100002 REACTION (94-PU-242(A,4N)96-CM-242,,SIG) C229604100003 SAMPLE (94-PU-242,ENR=0.378) C229604100004 (94-PU-238,ENR=0.586) C229604100005 (94-PU-239,ENR=0.034) and small amounts of Pu240 and C229604100006 Pu241. C229604100007 ERR-ANALYS (ERR-T) These errors can be combined to give the C229604100008 following average total errors. C229604100009 (ERR-1,1.,5.) integrated beam intensity. C229604100010 (ERR-2) electroplated target density. C229604100011 (ERR-3) disintegration rates for alpha particle- C229604100012 emitting spallation products. C229604100013 DECAY-DATA (96-CM-242,162.0D,A) C229604100014 COMMENT -- Absolute cross sections were determined by referringC229604100015 relative cross sections to Pu238(alpha,2n)Cm240 C229604100016 reaction cross sections, since targets were 58.6% C229604100017 Pu238. C229604100018 -- Compiler's comment: corrected energy from 28.8 to C229604100019 38.8 MeV. C229604100020 MONITOR (94-PU-238(A,2N)96-CM-240,,SIG) C229604100021 STATUS (TABLE) Table III, page 439. C229604100022 ENDBIB 20 0 C229604100023 COMMON 3 3 C229604100024 ERR-T ERR-2 ERR-3 C229604100025 PER-CENT PER-CENT PER-CENT C229604100026 15.0 10.0 10.0 C229604100027 ENDCOMMON 3 0 C229604100028 DATA 2 3 C229604100029 EN DATA C229604100030 MEV MB C229604100031 32.8 1.8 C229604100032 38.8 8.8 C229604100033 43.5 8.3 C229604100034 ENDDATA 5 0 C229604100035 ENDSUBENT 34 0 C229604199999 SUBENT C2296042 20180515 C175C229604200001 BIB 6 15 C229604200002 REACTION (94-PU-238(A,N)96-CM-241,,SIG) C229604200003 SAMPLE (94-PU-238,ENR=0.938) C229604200004 (94-PU-239,ENR=0.058) and small amounts of C229604200005 Pu-240,Pu-241 and Pu-242. C229604200006 ERR-ANALYS (ERR-T) These errors can be combined to give the C229604200007 following average total errors. C229604200008 (ERR-1,1.,5.) integrated beam intensity. C229604200009 (ERR-2) electroplated target density. C229604200010 (ERR-3,20.,25.) disintegration rates for electron- C229604200011 capture-unstable products, due mainly to counting C229604200012 efficiency uncertainties. C229604200013 DECAY-DATA (96-CM-241,35.0D,EC) C229604200014 COMMENT -- Compiler's comment: corrected energy from 28.8 to C229604200015 38.8 MeV. C229604200016 STATUS (TABLE) Table III, page 439. C229604200017 ENDBIB 15 0 C229604200018 COMMON 2 3 C229604200019 ERR-T ERR-2 C229604200020 PER-CENT PER-CENT C229604200021 25.0 10.0 C229604200022 ENDCOMMON 3 0 C229604200023 DATA 2 7 C229604200024 EN DATA C229604200025 MEV MB C229604200026 23.6 6.8 C229604200027 25.9 8.2 C229604200028 27.1 6.5 C229604200029 28.5 7.8 C229604200030 32.8 6.2 C229604200031 38.8 2.9 C229604200032 43.5 2.8 C229604200033 ENDDATA 9 0 C229604200034 ENDSUBENT 33 0 C229604299999 ENDENTRY 42 0 C229699999999