ENTRY D0106 20040211 0000D010600000001 SUBENT D0106001 20040211 0000D010600100001 BIB 10 12 D010600100002 TITLE Use of the nuclear reaction 16O(d,a)14N in the D010600100003 microanalysis of oxide surface layers D010600100004 AUTHOR (A.Turos,L.Wielunski,A.Barcz) D010600100005 INSTITUTE (3POLWWA) D010600100006 REFERENCE (J,NIM,111,605,1973) D010600100007 FACILITY (VDG) D010600100008 SAMPLE 6000 Angstr. thick SiO2 surface layer on silicon. D010600100009 DETECTOR (SIBAR) D010600100010 ERR-ANALYS (EN-ERR-DIG) Digitizing error D010600100011 (ERR-DIG) Digitizing error D010600100012 STATUS (CURVE)Curves from the article D010600100013 HISTORY (20040211C) SD D010600100014 ENDBIB 12 0 D010600100015 COMMON 4 3 D010600100016 EN-RSL ANG EN-ERR-DIG ERR-DIG D010600100017 KEV ADEG KEV MB/SR D010600100018 25. 145. 0.2 0.01 D010600100019 ENDCOMMON 3 0 D010600100020 ENDSUBENT 19 0 D010600199999 SUBENT D0106002 20040211 0000D010600200001 BIB 1 1 D010600200002 REACTION (8-O-16(D,A)7-N-14,,DA) D010600200003 ENDBIB 1 0 D010600200004 NOCOMMON 0 0 D010600200005 DATA 2 21 D010600200006 EN DATA D010600200007 KEV MB/SR D010600200008 760.18 2.9264 D010600200009 769.92 3.6714 D010600200010 775.13 4.0141 D010600200011 780.34 4.4252 D010600200012 784.55 4.5711 D010600200013 790.13 4.2044 D010600200014 795.18 4.5129 D010600200015 800.04 4.9923 D010600200016 809.81 5.2160 D010600200017 820.26 5.4056 D010600200018 825.14 5.5004 D010600200019 830.03 5.6806 D010600200020 839.81 5.6650 D010600200021 849.75 5.9144 D010600200022 860.03 6.1126 D010600200023 875.20 6.1918 D010600200024 889.19 6.4418 D010600200025 899.65 6.5032 D010600200026 914.98 6.7449 D010600200027 925.41 7.2593 D010600200028 950.17 7.9383 D010600200029 ENDDATA 23 0 D010600200030 ENDSUBENT 29 0 D010600299999 ENDENTRY 2 0 D010699999999