ENTRY D0750 20150608 D101D075000000001 SUBENT D0750001 20150608 D101D075000100001 BIB 13 28 D075000100002 TITLE Fusion of 28Si+28,30Si: Different trends at D075000100003 sub-barrier energies D075000100004 AUTHOR (G.Montagnoli, A.M.Stefanini, H.Esbensen, C.L.Jiang, D075000100005 L.Corradi, S.Courtin, E.Fioretto, J.Grebosz, F.Haas, D075000100006 H.M.Jia, M.Mazzocco, C.Michelagnoli, T.Mijatovic, D075000100007 D.Montanari, C.Parascandolo, F.Scarlassara, E.Strano, D075000100008 S.Szilner, D.Torresi) D075000100009 INSTITUTE (2ITYUPV,2ITYPAD,1USAANL,2FR ULP,3POLIFJ,3CRORBZ) D075000100010 REFERENCE (J,PR/C,90,044608,2014) D075000100011 INC-SOURCE Beam intensity is 15 to 30 pnA. (up to 50 pnA in some D075000100012 cases.) D075000100013 SAMPLE 50 ug/cm2 thick sample on 15 ug/cm2 thick carbon D075000100014 backing D075000100015 METHOD (EDE,TOF) D075000100016 FACILITY (VDGT,2ITYPAD) The XTU Tandem accelerator D075000100017 DETECTOR (TELES,IOCH,SIBAR) D075000100018 (MCPLT) To provide TOF signals. D075000100019 ERR-ANALYS (ERR-1) Due to the geometrical solid-angle D075000100020 uncertainties, the angular distribution D075000100021 integrations, and the transmission D075000100022 measurement. D075000100023 (ERR-S) Statistical uncertainty (2-3%) D075000100024 ADD-RES (COMP) Coupled channel method D075000100025 STATUS (TABLE) Plotted in Fig.1 of Phys.Rev.C90(2014)0044604 D075000100026 (APRVD) Proof-read by Giovanna Montagnoli (2014-12-30) D075000100027 HISTORY (20141203R) Received by e-mail from G.Montagnoli D075000100028 (20141221C) M.Odsuren D075000100029 (20150608A) On. Major revision in 002. D075000100030 ENDBIB 28 0 D075000100031 COMMON 1 3 D075000100032 ERR-1 D075000100033 PER-CENT D075000100034 7. D075000100035 ENDCOMMON 3 0 D075000100036 ENDSUBENT 35 0 D075000199999 SUBENT D0750002 20150608 D101D075000200001 BIB 3 4 D075000200002 REACTION (14-SI-28(14-SI-28,FUS),,SIG,ER) D075000200003 SAMPLE (14-SI-28,ENR=0.9993) Enriched elemental sample D075000200004 HISTORY (20150608R) On. Received four points from G.Montagnoli D075000200005 (20150608A) On. Four points at 37 to 40 MeV added D075000200006 ENDBIB 4 0 D075000200007 NOCOMMON 0 0 D075000200008 DATA 3 25 D075000200009 EN-CM DATA ERR-S D075000200010 MEV MB MB D075000200011 22.769 0.00062580 0.00044250 D075000200012 23.071 0.00080790 0.00046640 D075000200013 23.573 0.0045860 0.0018722 D075000200014 24.076 0.010034 0.0035475 D075000200015 24.577 0.027261 0.0070387 D075000200016 25.080 0.062439 0.010554 D075000200017 25.582 0.16150 0.021207 D075000200018 26.084 0.40000 0.031000 D075000200019 26.587 1.0398 0.073524 D075000200020 27.089 2.9850 0.12000 D075000200021 27.591 6.8934 0.21314 D075000200022 28.093 15.957 0.32000 D075000200023 28.595 31.650 1.0469 D075000200024 29.097 49.240 1.0299 D075000200025 30.101 96.418 1.3426 D075000200026 31.106 145.26 2.2604 D075000200027 32.109 209.26 2.9692 D075000200028 33.113 252.44 3.9648 D075000200029 34.117 306.15 4.5806 D075000200030 35.120 367.21 5.7440 D075000200031 36.124 433.68 5.1252 D075000200032 37.003 506.69 5.5736 D075000200033 38.006 557.26 6.1299 D075000200034 39.010 592.27 6.5150 D075000200035 40.014 627.56 6.9031 D075000200036 ENDDATA 27 0 D075000200037 ENDSUBENT 36 0 D075000299999 SUBENT D0750003 20141225 D097D075000300001 BIB 2 2 D075000300002 REACTION (14-SI-30(14-SI-28,FUS),,SIG,ER) D075000300003 SAMPLE (14-SI-30,ENR=0.965) Enriched SiO2 sample D075000300004 ENDBIB 2 0 D075000300005 NOCOMMON 0 0 D075000300006 DATA 3 7 D075000300007 EN-CM DATA ERR-S D075000300008 MEV MB MB D075000300009 36.360 429.15 6.9074 D075000300010 33.236 278.41 4.3449 D075000300011 30.112 112.50 3.5773 D075000300012 26.988 9.0694 0.93050 D075000300013 25.427 0.30704 0.058025 D075000300014 24.385 0.018558 0.0082992 D075000300015 23.865 0.0044240 0.0025540 D075000300016 ENDDATA 9 0 D075000300017 ENDSUBENT 16 0 D075000399999 ENDENTRY 3 0 D075099999999