ENTRY D4428 20240130 D442800000001 SUBENT D4428001 20240130 20240513 D442800100001 BIB 10 37 D442800100002 TITLE Precise resonance parameter measurement in the D442800100003 12C(p,a)13N astrophysically important reaction D442800100004 AUTHOR (L.Csedreki,Gy.Gyurky,T.Szucs) D442800100005 INSTITUTE (3HUNDEB) D442800100006 REFERENCE (J,NP/A,1037,122705,2023) D442800100007 #doi:10.1016/j.nuclphysa.2023.122705 D442800100008 FACILITY (VDGT,3HUNDEB) D442800100009 SAMPLE Solid state targets were prepared using electron beam D442800100010 evaporation of natural carbon onto 0.5 mm thick D442800100011 tantalum backings. Two carbon targets were used with D442800100012 thicknesses of 1.8+-0.1 and 2.4+-0.1 keV at Ep=1747 keVD442800100013 determined by the yield curve analysis of the D442800100014 Ep=1747 keV resonance of 13C(p,g)14N, correspond to a D442800100015 surface density of carbon atoms of D442800100016 (5.7+-0.3)*10e17 and (7.7+-0.4)*10e17 atom/cm2, D442800100017 respectively. D442800100018 DETECTOR (HPGE) D442800100019 METHOD Targets were irradiated in a Faraday-type target D442800100020 chamber with proton beam of 0.5 - 4.0 uA. Three HPGE D442800100021 detector were placed around the targetat 0, 90 and 112 D442800100022 degrees. Angular distribution was studied using two D442800100023 detectors at at 55 and 90 degree positions. D442800100024 Dead time was kept below 2%. D442800100025 Reaction yield curves in the vicinity of the Ep=460 andD442800100026 1700 keV resonances were measured with energy steps of D442800100027 2-50 keV. D442800100028 The experimental yields measured at E projectile energyD442800100029 were fitted with a single Breit-Wigner formula. D442800100030 A simplified R-matrix analysis was also performed to D442800100031 extract resonance energies and widths. D442800100032 The energy of the primary beam vas determined to a D442800100033 precision of better than 1 keV. D442800100034 ERR-ANALYS (ERR-1) stopping power (5%) D442800100035 (ERR-2) target thickness (5%) D442800100036 (ERR-3) peak area (5%) D442800100037 (ERR-4) detector efficiency (12%) D442800100038 HISTORY (20240130C) st D442800100039 ENDBIB 37 0 D442800100040 COMMON 4 3 D442800100041 ERR-1 ERR-2 ERR-3 ERR-4 D442800100042 PER-CENT PER-CENT PER-CENT PER-CENT D442800100043 5. 5. 5. 12. D442800100044 ENDCOMMON 3 0 D442800100045 ENDSUBENT 44 0 D442800199999 SUBENT D4428002 20240130 20240513 D442800200001 BIB 4 6 D442800200002 REACTION (6-C-12(P,G)7-N-13,,MLT/DA,,TT/CH/MSC) D442800200003 Thin target gamma yield at the given angle in counts, D442800200004 data were normalized to 1 micro-Coulomb charge. D442800200005 SAMPLE Target thickness was 4.3 and 5.7 keV at Ep=460 keV D442800200006 ERR-ANALYS (ERR-S) statistical uncertainty D442800200007 STATUS (TABLE) Numerical data were provided by author. D442800200008 ENDBIB 6 0 D442800200009 COMMON 2 3 D442800200010 ANG EN-ERR D442800200011 ADEG KEV D442800200012 0.0 0.3 D442800200013 ENDCOMMON 3 0 D442800200014 DATA 3 24 D442800200015 EN DATA ERR-S D442800200016 KEV ARB-UNITS ARB-UNITS D442800200017 349.0 0.032 0.006 D442800200018 398.9 0.139 0.008 D442800200019 422.5 0.393 0.020 D442800200020 432.3 0.628 0.029 D442800200021 442.1 1.137 0.049 D442800200022 446.1 1.488 0.069 D442800200023 450.0 1.741 0.084 D442800200024 452.0 1.948 0.084 D442800200025 453.9 2.199 0.098 D442800200026 455.9 2.171 0.100 D442800200027 457.8 2.245 0.104 D442800200028 459.8 2.388 0.108 D442800200029 461.8 2.327 0.095 D442800200030 463.7 2.284 0.101 D442800200031 465.7 2.220 0.097 D442800200032 467.7 2.002 0.090 D442800200033 469.6 1.912 0.088 D442800200034 471.6 1.748 0.072 D442800200035 475.5 1.475 0.070 D442800200036 477.5 1.392 0.057 D442800200037 481.4 1.036 0.051 D442800200038 491.2 0.668 0.034 D442800200039 501.1 0.477 0.025 D442800200040 520.7 0.255 0.015 D442800200041 ENDDATA 26 0 D442800200042 ENDSUBENT 41 0 D442800299999 SUBENT D4428003 20240130 20240513 D442800300001 BIB 4 6 D442800300002 REACTION (6-C-12(P,G)7-N-13,,MLT/DA,,TT/CH/MSC) D442800300003 Thin target gamma yield at the given angle in counts, D442800300004 data were normalized to 1 micro-Coulomb charge. D442800300005 SAMPLE Target thickness was 4.3 and 5.7 keV at Ep=460 keV D442800300006 ERR-ANALYS (ERR-S) statistical uncertainty D442800300007 STATUS (TABLE) Numerical data were provided by author. D442800300008 ENDBIB 6 0 D442800300009 COMMON 2 3 D442800300010 ANG EN-ERR D442800300011 ADEG KEV D442800300012 90.0 0.3 D442800300013 ENDCOMMON 3 0 D442800300014 DATA 3 24 D442800300015 EN DATA ERR-S D442800300016 KEV ARB-UNITS ARB-UNITS D442800300017 349.0 0.008 0.005 D442800300018 398.9 0.049 0.004 D442800300019 422.5 0.133 0.011 D442800300020 432.3 0.232 0.015 D442800300021 442.1 0.420 0.025 D442800300022 446.1 0.541 0.036 D442800300023 450.0 0.594 0.043 D442800300024 452.0 0.662 0.040 D442800300025 453.9 0.682 0.043 D442800300026 455.9 0.873 0.054 D442800300027 457.8 0.823 0.053 D442800300028 459.8 0.757 0.049 D442800300029 461.8 0.785 0.043 D442800300030 463.7 0.824 0.051 D442800300031 465.7 0.762 0.045 D442800300032 467.7 0.694 0.045 D442800300033 469.6 0.649 0.043 D442800300034 471.6 0.603 0.034 D442800300035 475.5 0.555 0.036 D442800300036 477.5 0.446 0.026 D442800300037 481.4 0.335 0.025 D442800300038 491.2 0.237 0.018 D442800300039 501.1 0.176 0.014 D442800300040 520.7 0.089 0.008 D442800300041 ENDDATA 26 0 D442800300042 ENDSUBENT 41 0 D442800399999 SUBENT D4428004 20240130 20240513 D442800400001 BIB 4 6 D442800400002 REACTION (6-C-12(P,G)7-N-13,,MLT/DA,,TT/CH/MSC) D442800400003 Thin target gamma yield at the given angle in counts, D442800400004 data were normalized to 1 micro-Coulomb charge. D442800400005 SAMPLE Target thickness was 4.3 and 5.7 keV at Ep=460 keV D442800400006 ERR-ANALYS (ERR-S) statistical uncertainty D442800400007 STATUS (TABLE) Numerical data were provided by author. D442800400008 ENDBIB 6 0 D442800400009 COMMON 2 3 D442800400010 ANG EN-ERR D442800400011 ADEG KEV D442800400012 121.0 0.3 D442800400013 ENDCOMMON 3 0 D442800400014 DATA 3 24 D442800400015 EN DATA ERR-S D442800400016 KEV ARB-UNITS ARB-UNITS D442800400017 349.0 0.012 0.006 D442800400018 398.9 0.068 0.005 D442800400019 422.5 0.190 0.013 D442800400020 432.3 0.319 0.019 D442800400021 442.1 0.544 0.029 D442800400022 446.1 0.636 0.039 D442800400023 450.0 0.868 0.054 D442800400024 452.0 0.876 0.049 D442800400025 453.9 0.899 0.052 D442800400026 455.9 1.089 0.063 D442800400027 457.8 1.150 0.064 D442800400028 459.8 1.158 0.065 D442800400029 461.8 1.159 0.056 D442800400030 463.7 1.101 0.061 D442800400031 465.7 1.066 0.058 D442800400032 467.7 0.985 0.055 D442800400033 469.6 0.852 0.051 D442800400034 471.6 0.802 0.041 D442800400035 475.5 0.689 0.041 D442800400036 477.5 0.669 0.033 D442800400037 481.4 0.535 0.033 D442800400038 491.2 0.330 0.021 D442800400039 501.1 0.225 0.016 D442800400040 520.7 0.142 0.010 D442800400041 ENDDATA 26 0 D442800400042 ENDSUBENT 41 0 D442800499999 SUBENT D4428005 20240130 20240513 D442800500001 BIB 4 6 D442800500002 REACTION (6-C-12(P,G)7-N-13,,MLT/DA,,TT/CH/MSC) D442800500003 Thin target gamma yield at the given angle in counts, D442800500004 data were normalized to 1 micro-Coulomb charge. D442800500005 SAMPLE Target thickness was 1.8 and 2.4 keV at Ep=1700 keV D442800500006 ERR-ANALYS (ERR-S) statistical uncertainty D442800500007 STATUS (TABLE) Numerical data were provided by author. D442800500008 ENDBIB 6 0 D442800500009 COMMON 2 3 D442800500010 ANG EN-ERR D442800500011 ADEG KEV D442800500012 0.0 0.4 D442800500013 ENDCOMMON 3 0 D442800500014 DATA 3 33 D442800500015 EN DATA ERR-S D442800500016 KEV ARB-UNITS ARB-UNITS D442800500017 1561.9 0.037 0.003 D442800500018 1581.5 0.045 0.005 D442800500019 1601.2 0.054 0.006 D442800500020 1611.0 0.070 0.006 D442800500021 1620.8 0.085 0.007 D442800500022 1630.6 0.097 0.007 D442800500023 1640.4 0.124 0.009 D442800500024 1648.3 0.139 0.009 D442800500025 1654.2 0.186 0.010 D442800500026 1660.1 0.198 0.013 D442800500027 1666.0 0.224 0.013 D442800500028 1669.9 0.250 0.015 D442800500029 1675.8 0.283 0.015 D442800500030 1679.7 0.304 0.016 D442800500031 1683.7 0.309 0.014 D442800500032 1687.6 0.299 0.018 D442800500033 1690.5 0.324 0.016 D442800500034 1693.5 0.253 0.017 D442800500035 1695.4 0.272 0.017 D442800500036 1699.4 0.215 0.013 D442800500037 1699.4 0.230 0.014 D442800500038 1703.3 0.204 0.012 D442800500039 1706.2 0.171 0.011 D442800500040 1709.2 0.186 0.011 D442800500041 1713.1 0.135 0.010 D442800500042 1719.0 0.132 0.008 D442800500043 1728.8 0.057 0.006 D442800500044 1739.6 0.053 0.005 D442800500045 1742.6 0.053 0.006 D442800500046 1746.5 0.030 0.006 D442800500047 1752.4 0.032 0.006 D442800500048 1762.2 0.010 0.005 D442800500049 1778.0 0.003 0.004 D442800500050 ENDDATA 35 0 D442800500051 ENDSUBENT 50 0 D442800599999 SUBENT D4428006 20240130 20240513 D442800600001 BIB 4 6 D442800600002 REACTION (6-C-12(P,G)7-N-13,,MLT/DA,,TT/CH/MSC) D442800600003 Thin target gamma yield at the given angle in counts, D442800600004 data were normalized to 1 micro-Coulomb charge. D442800600005 SAMPLE Target thickness was 1.8 and 2.4 keV at Ep=1700 keV D442800600006 ERR-ANALYS (ERR-S) statistical uncertainty D442800600007 STATUS (TABLE) Numerical data were provided by author. D442800600008 ENDBIB 6 0 D442800600009 COMMON 2 3 D442800600010 ANG EN-ERR D442800600011 ADEG KEV D442800600012 90.0 0.4 D442800600013 ENDCOMMON 3 0 D442800600014 DATA 3 33 D442800600015 EN DATA ERR-S D442800600016 KEV ARB-UNITS ARB-UNITS D442800600017 1561.9 0.021 0.002 D442800600018 1581.5 0.024 0.003 D442800600019 1601.2 0.039 0.003 D442800600020 1611.0 0.037 0.003 D442800600021 1620.8 0.057 0.004 D442800600022 1630.6 0.079 0.004 D442800600023 1640.4 0.090 0.005 D442800600024 1648.3 0.126 0.007 D442800600025 1654.2 0.155 0.007 D442800600026 1660.1 0.175 0.010 D442800600027 1666.0 0.237 0.011 D442800600028 1669.9 0.259 0.012 D442800600029 1675.8 0.296 0.013 D442800600030 1679.7 0.304 0.013 D442800600031 1683.7 0.342 0.014 D442800600032 1687.6 0.365 0.017 D442800600033 1690.5 0.332 0.014 D442800600034 1693.5 0.324 0.015 D442800600035 1695.4 0.337 0.016 D442800600036 1699.4 0.299 0.012 D442800600037 1699.4 0.331 0.014 D442800600038 1703.3 0.296 0.012 D442800600039 1709.2 0.241 0.011 D442800600040 1713.1 0.198 0.009 D442800600041 1719.0 0.176 0.008 D442800600042 1728.8 0.124 0.006 D442800600043 1739.6 0.086 0.007 D442800600044 1739.6 0.088 0.004 D442800600045 1742.6 0.084 0.005 D442800600046 1746.5 0.077 0.005 D442800600047 1752.4 0.060 0.004 D442800600048 1762.2 0.051 0.003 D442800600049 1778.0 0.036 0.002 D442800600050 ENDDATA 35 0 D442800600051 ENDSUBENT 50 0 D442800699999 SUBENT D4428007 20240130 20240513 D442800700001 BIB 4 6 D442800700002 REACTION (6-C-12(P,G)7-N-13,,MLT/DA,,TT/CH/MSC) D442800700003 Thin target gamma yield at the given angle in counts, D442800700004 data were normalized to 1 micro-Coulomb charge. D442800700005 SAMPLE Target thickness was 1.8 and 2.4 keV at Ep=1700 keV D442800700006 ERR-ANALYS (ERR-S) statistical uncertainty D442800700007 STATUS (TABLE) Numerical data were provided by author. D442800700008 ENDBIB 6 0 D442800700009 COMMON 2 3 D442800700010 ANG EN-ERR D442800700011 ADEG KEV D442800700012 121.0 0.4 D442800700013 ENDCOMMON 3 0 D442800700014 DATA 3 34 D442800700015 EN DATA ERR-S D442800700016 KEV ARB-UNITS ARB-UNITS D442800700017 1561.9 0.022 0.002 D442800700018 1581.5 0.026 0.003 D442800700019 1601.2 0.038 0.003 D442800700020 1611.0 0.043 0.003 D442800700021 1620.8 0.057 0.004 D442800700022 1630.6 0.067 0.004 D442800700023 1640.4 0.086 0.005 D442800700024 1648.3 0.118 0.006 D442800700025 1654.2 0.141 0.007 D442800700026 1660.1 0.170 0.010 D442800700027 1666.0 0.210 0.010 D442800700028 1669.9 0.245 0.012 D442800700029 1675.8 0.289 0.013 D442800700030 1679.7 0.324 0.014 D442800700031 1683.7 0.339 0.014 D442800700032 1687.6 0.346 0.017 D442800700033 1690.5 0.319 0.014 D442800700034 1693.5 0.343 0.016 D442800700035 1695.4 0.344 0.017 D442800700036 1699.4 0.297 0.013 D442800700037 1699.4 0.303 0.013 D442800700038 1703.3 0.284 0.012 D442800700039 1706.2 0.249 0.011 D442800700040 1709.2 0.249 0.011 D442800700041 1713.1 0.197 0.010 D442800700042 1719.0 0.180 0.008 D442800700043 1728.8 0.115 0.006 D442800700044 1739.6 0.082 0.008 D442800700045 1739.6 0.098 0.005 D442800700046 1742.6 0.080 0.005 D442800700047 1746.5 0.071 0.005 D442800700048 1752.4 0.062 0.004 D442800700049 1762.2 0.048 0.004 D442800700050 1778.0 0.038 0.002 D442800700051 ENDDATA 36 0 D442800700052 ENDSUBENT 51 0 D442800799999 SUBENT D4428008 20240130 20240513 D442800800001 BIB 4 6 D442800800002 REACTION (6-C-12(P,G)7-N-13,,MLT/DA,,TT/CH/MSC) D442800800003 Thin target gamma yield at the given angles in counts, D442800800004 data were normalized to 1 micro-Coulomb charge. D442800800005 SAMPLE Target thickness was 4.3 and 5.7 keV at Ep=460 keV D442800800006 ERR-ANALYS (ERR-S) statistical uncertainty D442800800007 STATUS (TABLE) Numerical data were provided by author. D442800800008 ENDBIB 6 0 D442800800009 COMMON 1 3 D442800800010 EN D442800800011 KEV D442800800012 460. D442800800013 ENDCOMMON 3 0 D442800800014 DATA 4 4 D442800800015 ANG-CM ANG-RSL-FW DATA ERR-S D442800800016 ADEG ADEG ARB-UNITS ARB-UNITS D442800800017 0. 27. 459.35 20.70 D442800800018 58.9 16.7 486.72 48.67 D442800800019 94.5 16.7 463.87 18.14 D442800800020 116.2 25. 482.03 40.18 D442800800021 ENDDATA 6 0 D442800800022 ENDSUBENT 21 0 D442800899999 SUBENT D4428009 20240130 20240513 D442800900001 BIB 4 6 D442800900002 REACTION (6-C-12(P,G)7-N-13,,MLT/DA,,TT/CH/MSC) D442800900003 Thin target gamma yield at the given angles in counts, D442800900004 data were normalized to 1 micro-Coulomb charge. D442800900005 SAMPLE Target thickness was 1.8 and 2.4 keV at Ep=1700 keV D442800900006 ERR-ANALYS (ERR-S) statistical uncertainty D442800900007 STATUS (TABLE) Numerical data were provided by author. D442800900008 ENDBIB 6 0 D442800900009 COMMON 1 3 D442800900010 EN D442800900011 KEV D442800900012 1717. D442800900013 ENDCOMMON 3 0 D442800900014 DATA 4 4 D442800900015 ANG-CM ANG-RSL-FW DATA ERR-S D442800900016 ADEG ADEG ARB-UNITS ARB-UNITS D442800900017 0. 27. 459.35 20.70 D442800900018 58.9 16.7 486.72 48.67 D442800900019 94.5 16.7 463.87 18.14 D442800900020 116.2 25. 482.03 40.18 D442800900021 ENDDATA 6 0 D442800900022 ENDSUBENT 21 0 D442800999999 SUBENT D4428010 20240130 20240513 D442801000001 BIB 4 6 D442801000002 REACTION (6-C-12(P,TOT),,WID) D442801000003 SAMPLE Target thickness: D442801000004 . 4.3 and 5.7 keV at Ep=460 keV D442801000005 . 1.8 and 2.4 keV at Ep=1700 keV D442801000006 ERR-ANALYS (DATA-ERR) No information on source of uncertainty D442801000007 STATUS (TABLE,,L.Csedreki,J,NP/A,1037,122705,2023) Text (p.8) D442801000008 ENDBIB 6 0 D442801000009 NOCOMMON 0 0 D442801000010 DATA 4 2 D442801000011 EN-RES EN-RES-ERR DATA DATA-ERR D442801000012 KEV KEV KEV KEV D442801000013 459.8 0.8 38.2 0.5 D442801000014 1685.1 0.7 57.6 0.8 D442801000015 ENDDATA 4 0 D442801000016 ENDSUBENT 15 0 D442801099999 ENDENTRY 10 0 D442899999999