ENTRY D6093 20091202 D070D609300000001 SUBENT D6093001 20091202 D070D609300100001 BIB 7 18 D609300100002 TITLE Fission angular distributions for D609300100003 the systems 9Be+232Th, 235U D609300100004 AUTHOR (S.Kailas,R.Vandenbosch,A.Charlop,S.J.Luke, D609300100005 D.Prindle,S.Van Verst) D609300100006 INSTITUTE (3INDTRM,1USAWAU) D609300100007 REFERENCE (J,PR/C,42,(5),2239,1990) D609300100008 FACILITY (VDGT,1USAWAU) The measurements were carried out at D609300100009 9Be energies of 50 and 53 MeV using Tandem/booster D609300100010 accelerator facility at Seattle. D609300100011 DETECTOR (SIBAR) Six silicon surface-barrier detectors ranging D609300100012 in thickness from 20 to 60 micrometre were positioned D609300100013 suitably to cover the angular range from 80 deg to 170 D609300100014 deg. A relative solid-angle calibration of the D609300100015 detectors was obtained using 252Cf source placed at D609300100016 the target site. A monitor detector was positioned at D609300100017 theta ~ 26.5 deg to detect the elastically scattered D609300100018 9Be. D609300100019 HISTORY (20091202C) joseph jeremiah [joeatchen@gmail.com] D609300100020 ENDBIB 18 0 D609300100021 NOCOMMON 0 0 D609300100022 ENDSUBENT 21 0 D609300199999 SUBENT D6093002 20091203 D070D609300200001 BIB 4 8 D609300200002 REACTION (90-TH-232(4-BE-9,F),,DA,FF,RSD) D609300200003 SAMPLE Natural 232Th target of thickness 424 microgram/cm2 D609300200004 on Ni backing of thickness 1 microgram/cm2 D609300200005 were employed for the measurements. D609300200006 ERR-ANALYS (ANG-ERR-D) Digitizing error D609300200007 (ERR-DIG) Digitizing error D609300200008 (DATA-ERR) Nothing said about uncertainties D609300200009 STATUS (CURVE) Data were digitized from fig.1 D609300200010 ENDBIB 8 0 D609300200011 COMMON 2 3 D609300200012 ANG-ERR-D ERR-DIG D609300200013 ADEG NO-DIM D609300200014 0.12030 0.28756E-02 D609300200015 ENDCOMMON 3 0 D609300200016 DATA 4 10 D609300200017 EN ANG-CM DATA-CM DATA-ERR D609300200018 MEV ADEG NO-DIM NO-DIM D609300200019 50.0 100.64 1.0045 D609300200020 50.0 114.98 1.0448 D609300200021 50.0 135.00 1.1898 0.41234E-01 D609300200022 50.0 152.98 1.3265 D609300200023 50.0 170.93 1.4338 0.41234E-01 D609300200024 53.0 101.01 1.0096 D609300200025 53.0 115.79 1.0344 D609300200026 53.0 134.72 1.1919 0.40890E-01 D609300200027 53.0 152.62 1.3188 D609300200028 53.0 170.53 1.4815 0.40918E-01 D609300200029 ENDDATA 12 0 D609300200030 ENDSUBENT 29 0 D609300299999 SUBENT D6093003 20091203 D070D609300300001 BIB 4 8 D609300300002 REACTION (92-U-235(4-BE-9,F),,DA,FF,RSD) D609300300003 SAMPLE Enriched 235U (97.5%) target of thinknesses D609300300004 200 amicrogram/cm2 on Ni backing of thickness D609300300005 1 microgram/cm2 D609300300006 ERR-ANALYS (ANG-ERR-D) Digitizing error D609300300007 (ERR-DIG) Digitizing error D609300300008 (DATA-ERR) Nothing said about uncertainties D609300300009 STATUS (CURVE) Data were digitized from fig.1 D609300300010 ENDBIB 8 0 D609300300011 COMMON 2 3 D609300300012 ANG-ERR-D ERR-DIG D609300300013 ADEG NO-DIM D609300300014 0.12031 0.28756E-02 D609300300015 ENDCOMMON 3 0 D609300300016 DATA 4 12 D609300300017 EN ANG-CM DATA-CM DATA-ERR D609300300018 MEV ADEG NO-DIM NO-DIM D609300300019 50.0 85.919 1.0127 D609300300020 50.0 100.91 1.0264 D609300300021 50.0 115.35 1.0194 D609300300022 50.0 134.10 1.1521 0.31233E-01 D609300300023 50.0 152.72 1.1809 D609300300024 50.0 170.89 1.2617 0.41556E-01 D609300300025 53.0 85.442 1.0039 D609300300026 53.0 100.99 1.0037 D609300300027 53.0 116.03 1.0344 D609300300028 53.0 133.67 1.1322 0.25345E-02 D609300300029 53.0 153.34 1.2041 D609300300030 53.0 171.02 1.2812 0.46521E-01 D609300300031 ENDDATA 14 0 D609300300032 ENDSUBENT 31 0 D609300399999 SUBENT D6093004 20091203 D070D609300400001 BIB 4 7 D609300400002 REACTION (90-TH-232(4-BE-9,F),,SIG) D609300400003 SAMPLE Natural 232Th target of thickness 424 microgram/cm2 D609300400004 on Ni backing of thickness 1 microgram/cm2 D609300400005 were employed for the measurements. D609300400006 ANALYSIS (INTAD) D609300400007 STATUS (TABLE) Tbl.1 D609300400008 (DEP,D6093002) D609300400009 ENDBIB 7 0 D609300400010 NOCOMMON 0 0 D609300400011 DATA 2 2 D609300400012 EN DATA D609300400013 MEV MB D609300400014 50.0 598.00 D609300400015 53.0 789.00 D609300400016 ENDDATA 4 0 D609300400017 ENDSUBENT 16 0 D609300499999 SUBENT D6093005 20091203 D070D609300500001 BIB 4 7 D609300500002 REACTION (92-U-235(4-BE-9,F),,SIG) D609300500003 SAMPLE Enriched 235U (97.5%) target of thinknesses D609300500004 200 amicrogram/cm2 on Ni backing of thickness D609300500005 1 microgram/cm2 D609300500006 ANALYSIS (INTAD) D609300500007 STATUS (TABLE) Tbl.1 D609300500008 (DEP,D6093003) D609300500009 ENDBIB 7 0 D609300500010 NOCOMMON 0 0 D609300500011 DATA 2 2 D609300500012 EN DATA D609300500013 MEV MB D609300500014 50.0 602.00 D609300500015 53.0 802.00 D609300500016 ENDDATA 4 0 D609300500017 ENDSUBENT 16 0 D609300599999 ENDENTRY 5 0 D609399999999