ENTRY E1658 20070514 E043E165800000001 SUBENT E1658001 20070514 E043E165800100001 BIB 7 18 E165800100002 TITLE Fusion and breakup at the barrier with 11Be E165800100003 AUTHOR (A.Yoshida, C.Signorini, T.Fukuda, Y.Watanabe, N.Aoi, E165800100004 M.Hirai, M.Ishihara, H.Kobinata, Y.Mizoi, L.Mueller, E165800100005 Y.Nagashima, J.Nakano, T.Nomura, Y.H.Pu, E165800100006 F.Scarlassara) E165800100007 INSTITUTE (2JPNIPC) E165800100008 (2ITYPAD) Physics Department of the University and E165800100009 INFN E165800100010 (2JPNTOK) Institute for Nuclear Study (INS) E165800100011 (2JPNTOK) Department of Physics E165800100012 (2JPNTSU) College of Medical Technology E165800100013 REFERENCE (J,PL/B,389,(3),457,199612) E165800100014 SAMPLE - Target enrichment is unknown. E165800100015 - Chemical-form of target is element. E165800100016 - Physical-form of target is solid. E165800100017 ADD-RES (COMP) Statistical model (Evaporation code CASCADE E165800100018 [E.Pulhofer, Nucl. Phys. A280(1977)267].) E165800100019 HISTORY (20030815T) Am + On. Data converted from NRDF D1658 E165800100020 ENDBIB 18 0 E165800100021 NOCOMMON 0 0 E165800100022 ENDSUBENT 21 0 E165800199999 SUBENT E1658002 20070514 E043E165800200001 BIB 8 21 E165800200002 REACTION (83-BI-209(4-BE-11,4N)87-FR-216,,SIG) E165800200003 DECAY-DATA (87-FR-216,700.NSEC,A,9000.) E165800200004 SAMPLE - Target-thickness is about 0.700 mg/cm**2. E165800200005 - Backing is mylar film. E165800200006 - Backing-thickness is 0.070 mg/cm**2. E165800200007 FACILITY (PRJFS,2JPNIPC) produced by a fragmentation reaction E165800200008 of a primary 13C beam, with 100 AMeV E165800200009 energy and about 100 pnA intensity, E165800200010 onto a 12 mm thick beryllium E165800200011 production target. E165800200012 DETECTOR E-RSL: originates primarily from the different energy E165800200013 losses of the alpha-particles in the Bi-target E165800200014 (SI) 0.3 mm thick silicon detectors, located at 90deg E165800200015 to the beam direction and with and active surface E165800200016 of about 48x48 mm2, covering approximately 33% of E165800200017 the solid angle. E165800200018 ERR-ANALYS possible systematic error are non relevant for the E165800200019 subsequent analysis E165800200020 (ERR-S) Statistical uncertainty E165800200021 STATUS (CURVE) Data scanned from Fig.2, p459 in reference E165800200022 HISTORY (20061113A) Mh. Re-digitized E165800200023 ENDBIB 21 0 E165800200024 COMMON 2 3 E165800200025 E-RSL EN-ERR E165800200026 KEV MEV E165800200027 150. 1.75 E165800200028 ENDCOMMON 3 0 E165800200029 DATA 3 10 E165800200030 EN-CM DATA ERR-S E165800200031 MEV MB MB E165800200032 3.738E+01 1.514E+01 7.368E+00 E165800200033 4.063E+01 1.882E+02 1.553E+01 E165800200034 4.399E+01 4.589E+02 2.134E+01 E165800200035 4.732E+01 5.227E+02 2.432E+01 E165800200036 5.058E+01 3.545E+02 2.120E+01 E165800200037 5.399E+01 2.367E+02 2.088E+01 E165800200038 5.744E+01 1.115E+02 1.575E+01 E165800200039 6.099E+01 5.681E+01 1.338E+01 E165800200040 6.450E+01 2.958E+01 1.393E+01 E165800200041 6.820E+01 1.667E+01 3.287E+01 E165800200042 ENDDATA 12 0 E165800200043 ENDSUBENT 42 0 E165800299999 SUBENT E1658003 20070514 E043E165800300001 BIB 8 21 E165800300002 REACTION (83-BI-209(4-BE-11,5N)87-FR-215,,SIG) E165800300003 DECAY-DATA (87-FR-215,90.NSEC,A,9400.) E165800300004 SAMPLE - Target-thickness is about 0.700 mg/cm**2. E165800300005 - Backing is mylar film. E165800300006 - Backing-thickness is 0.070 mg/cm**2. E165800300007 FACILITY (PRJFS,2JPNIPC) produced by a fragmentation reaction E165800300008 of a primary 13C beam, with 100 AMeV E165800300009 energy and about 100 pnA intensity, E165800300010 onto a 12 mm thick beryllium E165800300011 production target. E165800300012 DETECTOR E-RSL: originates primarily from the different energy E165800300013 losses of the alpha-particles in the Bi-target E165800300014 (SI) 0.3 mm thick silicon detectors, located at 90deg E165800300015 to the beam direction and with and active surface E165800300016 of about 48x48 mm2, covering approximately 33% of E165800300017 the solid angle. E165800300018 ERR-ANALYS possible systematic error are non relevant for the E165800300019 subsequent analysis E165800300020 (ERR-S) Statistical uncertainty E165800300021 STATUS (CURVE) Data scanned from Fig.2, p459 in reference E165800300022 HISTORY (20061113A) Mh. Re-digitized E165800300023 ENDBIB 21 0 E165800300024 COMMON 2 3 E165800300025 E-RSL EN-ERR E165800300026 KEV MEV E165800300027 150. 1.75 E165800300028 ENDCOMMON 3 0 E165800300029 DATA 3 9 E165800300030 EN-CM DATA ERR-S E165800300031 MEV MB MB E165800300032 4.063E+01 4.202E+00 5.386E+00 E165800300033 4.401E+01 5.565E+01 8.197E+00 E165800300034 4.731E+01 3.265E+02 2.009E+01 E165800300035 5.061E+01 6.939E+02 2.228E+01 E165800300036 5.402E+01 8.244E+02 3.838E+01 E165800300037 5.743E+01 5.004E+02 2.711E+01 E165800300038 6.097E+01 2.805E+02 2.155E+01 E165800300039 6.454E+01 1.104E+02 1.559E+01 E165800300040 6.822E+01 6.420E+01 1.811E+01 E165800300041 ENDDATA 11 0 E165800300042 ENDSUBENT 41 0 E165800399999 SUBENT E1658004 20070514 E043E165800400001 BIB 8 21 E165800400002 REACTION (83-BI-209(4-BE-10,3N)87-FR-216,,SIG) E165800400003 DECAY-DATA (87-FR-216,700.NSEC,A,9000.) E165800400004 SAMPLE - Target-thickness is about 0.700 mg/cm**2. E165800400005 - Backing is mylar film. E165800400006 - Backing-thickness is 0.070 mg/cm**2. E165800400007 FACILITY (PRJFS,2JPNIPC) produced by a fragmentation reaction E165800400008 of a primary 13C beam, with 100 AMeV E165800400009 energy and about 100 pnA intensity, E165800400010 onto a 12 mm thick beryllium E165800400011 production target. E165800400012 DETECTOR E-RSL: originates primarily from the different energy E165800400013 losses of the alpha-particles in the Bi-target E165800400014 (SI) 0.3 mm thick silicon detectors, located at 90deg E165800400015 to the beam direction and with and active surface E165800400016 of about 48x48 mm2, covering approximately 33% of E165800400017 the solid angle. E165800400018 ERR-ANALYS possible systematic error are non relevant for the E165800400019 subsequent analysis E165800400020 (ERR-S) Statistical uncertainty E165800400021 STATUS (CURVE) Data scanned from Fig.2, p459 in reference E165800400022 HISTORY (20061113A) Mh. Re-digitized E165800400023 ENDBIB 21 0 E165800400024 COMMON 2 3 E165800400025 E-RSL EN-ERR E165800400026 KEV MEV E165800400027 150. 1.75 E165800400028 ENDCOMMON 3 0 E165800400029 DATA 3 8 E165800400030 EN-CM DATA ERR-S E165800400031 MEV MB MB E165800400032 3.603E+01 7.891E+00 6.264E+00 E165800400033 3.928E+01 1.332E+02 1.233E+01 E165800400034 4.250E+01 3.872E+02 2.111E+01 E165800400035 4.571E+01 3.777E+02 2.297E+01 E165800400036 4.897E+01 3.068E+02 2.057E+01 E165800400037 5.239E+01 2.052E+02 1.766E+01 E165800400038 5.586E+01 8.555E+01 1.360E+01 E165800400039 5.930E+01 6.323E+01 1.684E+01 E165800400040 ENDDATA 10 0 E165800400041 ENDSUBENT 40 0 E165800499999 SUBENT E1658005 20070514 E043E165800500001 BIB 8 21 E165800500002 REACTION (83-BI-209(4-BE-10,4N)87-FR-215,,SIG) E165800500003 DECAY-DATA (87-FR-215,90.NSEC,A,9400.) E165800500004 SAMPLE - Target-thickness is about 0.700 mg/cm**2. E165800500005 - Backing is mylar film. E165800500006 - Backing-thickness is 0.070 mg/cm**2. E165800500007 FACILITY (PRJFS,2JPNIPC) produced by a fragmentation reaction E165800500008 of a primary 13C beam, with 100 AMeV E165800500009 energy and about 100 pnA intensity, E165800500010 onto a 12 mm thick beryllium E165800500011 production target. E165800500012 DETECTOR E-RSL: originates primarily from the different energy E165800500013 losses of the alpha-particles in the Bi-target E165800500014 (SI) 0.3 mm thick silicon detectors, located at 90deg E165800500015 to the beam direction and with and active surface E165800500016 of about 48x48 mm2, covering approximately 33% of E165800500017 the solid angle. E165800500018 ERR-ANALYS possible systematic error are non relevant for the E165800500019 subsequent analysis E165800500020 (ERR-S) Statistical uncertainty E165800500021 STATUS (CURVE) Data scanned from Fig.2, p459 in reference E165800500022 HISTORY (20061113A) Mh. Re-digitized E165800500023 ENDBIB 21 0 E165800500024 COMMON 2 3 E165800500025 E-RSL EN-ERR E165800500026 KEV MEV E165800500027 150. 1.75 E165800500028 ENDCOMMON 3 0 E165800500029 DATA 3 7 E165800500030 EN-CM DATA ERR-S E165800500031 MEV MB MB E165800500032 3.925E+01 4.343E+00 8.327E+00 E165800500033 4.245E+01 1.158E+02 1.075E+01 E165800500034 4.571E+01 4.812E+02 1.078E+01 E165800500035 4.896E+01 8.232E+02 2.782E+01 E165800500036 5.239E+01 7.237E+02 3.282E+01 E165800500037 5.585E+01 4.082E+02 2.566E+01 E165800500038 5.930E+01 1.784E+02 2.093E+01 E165800500039 ENDDATA 9 0 E165800500040 ENDSUBENT 39 0 E165800599999 SUBENT E1658006 20070514 E043E165800600001 BIB 8 21 E165800600002 REACTION (83-BI-209(4-BE-9,3N)87-FR-215,,SIG) E165800600003 DECAY-DATA (87-FR-215,90.NSEC,A,9400.) E165800600004 SAMPLE - Target-thickness is about 0.700 mg/cm**2. E165800600005 - Backing is mylar film. E165800600006 - Backing-thickness is 0.070 mg/cm**2. E165800600007 FACILITY (PRJFS,2JPNIPC) produced by a fragmentation reaction E165800600008 of a primary 13C beam, with 100 AMeV E165800600009 energy and about 100 pnA intensity, E165800600010 onto a 12 mm thick beryllium E165800600011 production target. E165800600012 DETECTOR E-RSL: originates primarily from the different energy E165800600013 losses of the alpha-particles in the Bi-target E165800600014 (SI) 0.3 mm thick silicon detectors, located at 90deg E165800600015 to the beam direction and with and active surface E165800600016 of about 48x48 mm2, covering approximately 33% of E165800600017 the solid angle. E165800600018 ERR-ANALYS possible systematic error are non relevant for the E165800600019 subsequent analysis E165800600020 (ERR-S) Statistical uncertainty E165800600021 STATUS (CURVE) Data scanned from Fig.3, p459 in reference E165800600022 HISTORY (20061113A) Mh. Re-digitized E165800600023 ENDBIB 21 0 E165800600024 COMMON 2 3 E165800600025 E-RSL EN-ERR E165800600026 KEV MEV E165800600027 150. 1.75 E165800600028 ENDCOMMON 3 0 E165800600029 DATA 3 5 E165800600030 EN-CM DATA ERR-S E165800600031 MEV MB MB E165800600032 3.719E+01 2.222E+01 7.337E+00 E165800600033 4.036E+01 1.397E+02 1.236E+01 E165800600034 4.363E+01 2.481E+02 1.576E+01 E165800600035 4.682E+01 1.303E+02 1.514E+01 E165800600036 5.020E+01 3.896E+01 1.078E+01 E165800600037 ENDDATA 7 0 E165800600038 ENDSUBENT 37 0 E165800699999 SUBENT E1658007 20070514 E043E165800700001 BIB 9 20 E165800700002 REACTION (83-BI-209(4-BE-9,3N)87-FR-215,,SIG) E165800700003 DECAY-DATA (87-FR-215,90.NSEC,A,9400.) E165800700004 SAMPLE - Target-thickness is 0.370 mg/cm**2. E165800700005 - Backing: Kapton foil, in order to stop all of the E165800700006 recoil evaporation residues produced by the E165800700007 reaction. E165800700008 - Backing-thickness is 2.0 mg/cm**2. E165800700009 FACILITY (VDGT,2JPNTSU) 12UD Tandem at Tandem Accelerator E165800700010 Center E165800700011 DETECTOR (SI) to measure alpha-particles, 150 mm2 silicon E165800700012 detector located 135 deg to the beam direction E165800700013 and 11 cm from the target E165800700014 ERR-ANALYS (ERR-T) Total uncertainty E165800700015 COMMENT Absolute cross-section normalization was deduced by E165800700016 the known Rutherford cross section and the ratio E165800700017 between the solid angles of the two detectors, E165800700018 measured with a point alpha-source positioned at the E165800700019 target site. E165800700020 STATUS (CURVE) Data scanned from Fig.3, p459 in reference E165800700021 HISTORY (20061113A) Mh. Re-digitized E165800700022 ENDBIB 20 0 E165800700023 COMMON 1 3 E165800700024 ERR-T E165800700025 PER-CENT E165800700026 5. E165800700027 ENDCOMMON 3 0 E165800700028 DATA 2 15 E165800700029 EN-CM DATA E165800700030 MEV MB E165800700031 3.643E+01 7.601E+00 E165800700032 3.838E+01 7.065E+01 E165800700033 3.931E+01 1.171E+02 E165800700034 4.027E+01 1.680E+02 E165800700035 4.121E+01 2.035E+02 E165800700036 4.218E+01 1.914E+02 E165800700037 4.315E+01 2.169E+02 E165800700038 4.411E+01 1.754E+02 E165800700039 4.504E+01 1.660E+02 E165800700040 4.602E+01 1.326E+02 E165800700041 4.793E+01 8.883E+01 E165800700042 4.891E+01 6.804E+01 E165800700043 4.986E+01 5.275E+01 E165800700044 5.179E+01 3.753E+01 E165800700045 5.370E+01 2.576E+01 E165800700046 ENDDATA 17 0 E165800700047 ENDSUBENT 46 0 E165800799999 SUBENT E1658008 20070514 E043E165800800001 BIB 9 21 E165800800002 REACTION (83-BI-209(4-BE-9,4N)87-FR-214,,SIG) E165800800003 DECAY-DATA (87-FR-214-G,5.0MSEC,A,8400.) E165800800004 (87-FR-214-M,3.35MSEC,A,8500.) E165800800005 SAMPLE - Target-thickness is 0.370 mg/cm**2. E165800800006 - Backing: Kapton foil, in order to stop all of the E165800800007 recoil evaporation residues produced by the E165800800008 reaction. E165800800009 - Backing-thickness is 2.0 mg/cm**2. E165800800010 FACILITY (VDGT,2JPNTSU) 12UD Tandem at Tandem Accelerator E165800800011 Center E165800800012 DETECTOR (SI) to measure alpha-particles, 150 mm2 silicon E165800800013 detector located 135 deg to the beam direction E165800800014 and 11 cm from the target E165800800015 ERR-ANALYS (ERR-T) Total uncertainty E165800800016 COMMENT Absolute cross-section normalization was deduced by E165800800017 the known Rutherford cross section and the ratio E165800800018 between the solid angles of the two detectors, E165800800019 measured with a point alpha-source positioned at the E165800800020 target site. E165800800021 STATUS (CURVE) Data scanned from Fig.3, p459 in reference E165800800022 HISTORY (20061113A) Mh. Re-digitized E165800800023 ENDBIB 21 0 E165800800024 COMMON 1 3 E165800800025 ERR-T E165800800026 PER-CENT E165800800027 5. E165800800028 ENDCOMMON 3 0 E165800800029 DATA 2 13 E165800800030 EN-CM DATA E165800800031 MEV MB E165800800032 3.935E+01 2.057E+00 E165800800033 4.030E+01 7.983E+00 E165800800034 4.127E+01 1.819E+01 E165800800035 4.221E+01 6.263E+01 E165800800036 4.314E+01 1.292E+02 E165800800037 4.409E+01 1.873E+02 E165800800038 4.509E+01 2.901E+02 E165800800039 4.603E+01 3.756E+02 E165800800040 4.792E+01 5.623E+02 E165800800041 4.889E+01 6.164E+02 E165800800042 4.986E+01 6.280E+02 E165800800043 5.179E+01 6.100E+02 E165800800044 5.372E+01 4.451E+02 E165800800045 ENDDATA 15 0 E165800800046 ENDSUBENT 45 0 E165800899999 SUBENT E1658009 20070514 E043E165800900001 BIB 9 20 E165800900002 REACTION (83-BI-209(4-BE-9,5N)87-FR-213,,SIG) E165800900003 DECAY-DATA (87-FR-213,34.3SEC,A,6800.) E165800900004 SAMPLE - Target-thickness is 0.370 mg/cm**2. E165800900005 - Backing: Kapton foil, in order to stop all of the E165800900006 recoil evaporation residues produced by the E165800900007 reaction. E165800900008 - Backing-thickness is 2.0 mg/cm**2. E165800900009 FACILITY (VDGT,2JPNTSU) 12UD Tandem at Tandem Accelerator E165800900010 Center E165800900011 DETECTOR (SI) to measure alpha-particles, 150 mm2 silicon E165800900012 detector located 135 deg to the beam direction E165800900013 and 11 cm from the target E165800900014 ERR-ANALYS (ERR-T) Total uncertainty E165800900015 COMMENT Absolute cross-section normalization was deduced by E165800900016 the known Rutherford cross section and the ratio E165800900017 between the solid angles of the two detectors, E165800900018 measured with a point alpha-source positioned at the E165800900019 target site. E165800900020 STATUS (CURVE) Data scanned from Fig.3, p459 in reference E165800900021 HISTORY (20061113A) Mh. Re-digitized E165800900022 ENDBIB 20 0 E165800900023 COMMON 1 3 E165800900024 ERR-T E165800900025 PER-CENT E165800900026 5. E165800900027 ENDCOMMON 3 0 E165800900028 DATA 2 2 E165800900029 EN-CM DATA E165800900030 MEV MB E165800900031 4.920E+01 3.395E+01 E165800900032 5.372E+01 2.965E+02 E165800900033 ENDDATA 4 0 E165800900034 ENDSUBENT 33 0 E165800999999 SUBENT E1658010 20070514 E043E165801000001 BIB 8 19 E165801000002 REACTION (83-BI-209(4-BE-9,F),,SIG) E165801000003 SAMPLE - Target-thickness is 0.370 mg/cm**2. E165801000004 - Backing: Kapton foil, in order to stop all of the E165801000005 recoil evaporation residues produced by the E165801000006 reaction. E165801000007 - Backing-thickness is 2.0 mg/cm**2. E165801000008 FACILITY (VDGT,2JPNTSU) 12UD Tandem at Tandem Accelerator E165801000009 Center E165801000010 DETECTOR (SI) to measure alpha-particles, 150 mm2 silicon E165801000011 detector located 135 deg to the beam direction E165801000012 and 11 cm from the target E165801000013 ERR-ANALYS (ERR-T) Total uncertainty E165801000014 COMMENT Absolute cross-section normalization was deduced by E165801000015 the known Rutherford cross section and the ratio E165801000016 between the solid angles of the two detectors, E165801000017 measured with a point alpha-source positioned at the E165801000018 target site. E165801000019 STATUS (CURVE) Data scanned from Fig.3, p459 in reference E165801000020 HISTORY (20061113A) Mh. Re-digitized E165801000021 ENDBIB 19 0 E165801000022 COMMON 1 3 E165801000023 ERR-T E165801000024 PER-CENT E165801000025 5. E165801000026 ENDCOMMON 3 0 E165801000027 DATA 2 5 E165801000028 EN-CM DATA E165801000029 MEV MB E165801000030 4.125E+01 8.038E+00 E165801000031 4.316E+01 1.806E+01 E165801000032 4.602E+01 3.557E+01 E165801000033 4.919E+01 7.084E+01 E165801000034 5.371E+01 1.577E+02 E165801000035 ENDDATA 7 0 E165801000036 ENDSUBENT 35 0 E165801099999 ENDENTRY 10 0 E165899999999