ENTRY E1722 20050224 0000E172200000001 SUBENT E1722001 20050224 0000E172200100001 BIB 13 41 E172200100002 TITLE Reaction mechanism and characteristics of T20 in d+3He E172200100003 backward elastic scattering at intermediate energies E172200100004 AUTHOR (M.Tanifuji, S.Ishikawa, Y.Iseri, T.Uesaka, E172200100005 N.Sakamoto, Y.Satou, K.Itoh, H.Sakai, A.Tamii, E172200100006 T.Ohnishi, K.Sekiguchi, K.Yako, S.Sakoda, H.Okamura, E172200100007 K.Suda, T.Wakasa) E172200100008 INSTITUTE (2JPNHOS) Department of Physics E172200100009 (2JPNJPN) Department of Physics, Chiba-Keizai College, E172200100010 Chiba E172200100011 (2JPNIPC) E172200100012 (2JPNTOK) Department of Physics E172200100013 (2JPNSUU) Department of Physics E172200100014 (2JPNOSA) Research Center for Nuclear Physics E172200100015 REFERENCE (J,PR/C,61,(2),024602,200002) E172200100016 PART-DET (HE3) E172200100017 EN-SEC ANG is polar angle between beam and 3He in laboratory E172200100018 system E172200100019 INC-SOURCE (POLIS) POL-BM: High-Intensity polarized ion source E172200100020 [H.Okamura et al., in polarized ion source and E172200100021 polarized gas targets, edited by L.W.Anderson E172200100022 and Willy Haeberli, AIP Conf.Proc.No.293(AIP, E172200100023 New York, 1994), P.84] E172200100024 SAMPLE - Target enrichment is unknown. E172200100025 - Chemical-form of target is element. E172200100026 - Physical-form of target is gas. E172200100027 - Target-thickness: The size of target was 13mm(20mm) E172200100028 wide, 15mm(20mm)high, and 20mm(10mm)thick in the E172200100029 case of 270MeV(140,200MeV) measurement. The gas E172200100030 pressure is approximately 1 atm which was measured E172200100031 with Baratron gauge. E172200100032 FACILITY (CYCLO,2JPNIPC) E172200100033 DETECTOR (MAGSP) SMART [T.Ichihara et al., E172200100034 Nucl.Phys.A569(1994)287c]. E172200100035 (MWDC) E172200100036 (SCIN) Plastic scintillator E172200100037 ADD-RES (COMP) PWIA : Plane wave impulse approximation E172200100038 STATUS (TABLE) Data taken from Table 1, p024602-2 in E172200100039 reference E172200100040 HISTORY (20020905T) Data converted from NRDF D1722 E172200100041 (20041125A) INSTITUTE, REFERENCE and heading of E172200100042 systematic error corrected E172200100043 ENDBIB 41 0 E172200100044 COMMON 2 3 E172200100045 ANG-MIN ANG-MAX E172200100046 ADEG ADEG E172200100047 0. 1.4 E172200100048 ENDCOMMON 3 0 E172200100049 ENDSUBENT 48 0 E172200199999 SUBENT E1722002 20050224 0000E172200200001 BIB 2 4 E172200200002 REACTION (1-H-2(HE3,EL)1-H-2,,DA) E172200200003 ERR-ANALYS (ERR-S) Statistical error E172200200004 (ERR-SYS) Uncertainties mainly due to beam intensity E172200200005 and target thickness E172200200006 ENDBIB 4 0 E172200200007 COMMON 1 3 E172200200008 ERR-SYS E172200200009 PER-CENT E172200200010 10. E172200200011 ENDCOMMON 3 0 E172200200012 DATA 3 3 E172200200013 EN DATA ERR-S E172200200014 MEV MB/SR MB/SR E172200200015 140. 16.3 0.1 E172200200016 200. 8.56 0.03 E172200200017 270. 0.97 0.08 E172200200018 ENDDATA 5 0 E172200200019 ENDSUBENT 18 0 E172200299999 SUBENT E1722003 20050224 0000E172200300001 BIB 2 3 E172200300002 REACTION (1-H-2(HE3,EL)1-H-2,20,POL/DA,,TAP) E172200300003 ERR-ANALYS (ERR-S) Statistical error E172200300004 (ERR-SYS) Unncertainty mainly due to beam polarization E172200300005 ENDBIB 3 0 E172200300006 COMMON 1 3 E172200300007 ERR-SYS E172200300008 PER-CENT E172200300009 2. E172200300010 ENDCOMMON 3 0 E172200300011 DATA 3 3 E172200300012 EN-APRX DATA ERR-S E172200300013 MEV NO-DIM NO-DIM E172200300014 140. 0.07 0.02 E172200300015 200. 0.15 0.01 E172200300016 270. 0.17 0.03 E172200300017 ENDDATA 5 0 E172200300018 ENDSUBENT 17 0 E172200399999 ENDENTRY 3 0 E172299999999