ENTRY E1979 20061228 E041E197900000001 SUBENT E1979001 20061228 E041E197900100001 BIB 13 36 E197900100002 TITLE Measurements of evaporation residue cross sections for E197900100003 the fusion reactions 86Kr+134Ba and 86Kr+138Ba E197900100004 AUTHOR (K.Satou, H.Ikezoe, S.Mitsuoka, K.Nishio, C.J.Lin, E197900100005 S.C.Jeong) E197900100006 INSTITUTE (2JPNJAE) Quantum Beam Science Directorate E197900100007 (2JPNJAE) Advanced Science Research Center E197900100008 (3CPRAEP) E197900100009 (2JPNKEK) Institute of Particle and Nuclear Studies E197900100010 REFERENCE (J,PR/C,73,(3),034609,200603) E197900100011 INC-SOURCE Beam intensity is 15 particle-nA. E197900100012 SAMPLE - Chemical-form of target is element. E197900100013 - Physical-form of target is solid. E197900100014 - Target-thickness is 0.40 to 0.45 mg/cm**2. E197900100015 - Backing is aluminium. E197900100016 - Backing-thickness: 1.3 micro-meter E197900100017 METHOD (TOF) To distinguish incoming particles from E197900100018 subsequent alpha-decay E197900100019 FACILITY (VDGT,2JPNJAE) JAERI-tandem booster accelerator E197900100020 DETECTOR (SIBAR) To detect elastically scattered Kr beams to E197900100021 determine absolute value of evaporation E197900100022 residue cross sections E197900100023 (MAGSP) Recoil mass separator to separate evaporation E197900100024 residues (JAERI-RMS) E197900100025 (PS) To measure energies and positions of incoming E197900100026 particle and its subsequent alpha decays E197900100027 (MCPLT) To obtain time-of-flight signals of incoming E197900100028 particles E197900100029 ERR-ANALYS (ERR-T) Total uncertainty E197900100030 (ERR-SYS) Uncertainty in transport efficiency in E197900100031 JAERI-RMS and charge distribution of E197900100032 evaporation residues E197900100033 ADD-RES (COMP) Statistical model (Statistical model code E197900100034 HIVAP) E197900100035 STATUS (TABLE) Data taken from Table 1, p034609-3 in E197900100036 reference E197900100037 HISTORY (20061004C) Tt + On E197900100038 ENDBIB 36 0 E197900100039 COMMON 1 3 E197900100040 ERR-SYS E197900100041 PER-CENT E197900100042 40. E197900100043 ENDCOMMON 3 0 E197900100044 ENDSUBENT 43 0 E197900199999 SUBENT E1979002 20061228 E041E197900200001 BIB 4 6 E197900200002 REACTION ((56-BA-138(36-KR-86,N)92-U-223,,SIG)+ E197900200003 (56-BA-138(36-KR-86,X)90-TH-219,,SIG)+ E197900200004 (56-BA-138(36-KR-86,X)88-RA-215,,SIG)) E197900200005 DECAY-DATA (88-RA-215,,A) E197900200006 PART-DET (92-U-223,90-TH-219,88-RA-215) E197900200007 SAMPLE Target enrichment is 99.7%. E197900200008 ENDBIB 6 0 E197900200009 NOCOMMON 0 0 E197900200010 DATA 4 15 E197900200011 EN-CM DATA +ERR-T -ERR-T E197900200012 MEV NB NB NB E197900200013 205.9 3. 6. 3. E197900200014 208.0 12. 9. 7. E197900200015 209.3 37. 20. 18. E197900200016 210.5 18. 14. 11. E197900200017 211.3 11. 11. 8. E197900200018 213.3 20. 15. 12. E197900200019 214.3 8. 7. 5. E197900200020 218.6 8. 10. 6. E197900200021 221.1 18. 15. 10. E197900200022 222.9 23. 20. 15. E197900200023 225.3 50. 42. 32. E197900200024 226.6 21. 21. 15. E197900200025 228.5 150. 140. 100. E197900200026 229.4 46. 51. 29. E197900200027 232.3 22. 27. 17. E197900200028 ENDDATA 17 0 E197900200029 ENDSUBENT 28 0 E197900299999 SUBENT E1979003 20061228 E041E197900300001 BIB 4 6 E197900300002 REACTION ((56-BA-138(36-KR-86,2N)92-U-222,,SIG)+ E197900300003 (56-BA-138(36-KR-86,X)90-TH-218,,SIG)+ E197900300004 (56-BA-138(36-KR-86,X)88-RA-214,,SIG)) E197900300005 DECAY-DATA (88-RA-214,,A) E197900300006 PART-DET (92-U-222,90-TH-218,88-RA-214) E197900300007 SAMPLE Target enrichment is 99.7%. E197900300008 ENDBIB 6 0 E197900300009 NOCOMMON 0 0 E197900300010 DATA 4 12 E197900300011 EN-CM DATA +ERR-T -ERR-T E197900300012 MEV NB NB NB E197900300013 209.3 5. 11. 5. E197900300014 211.3 6. 12. 6. E197900300015 217.3 14. 18. 12. E197900300016 218.6 4. 9. 4. E197900300017 221.1 13. 12. 8. E197900300018 222.9 22. 22. 15. E197900300019 225.3 19. 38. 19. E197900300020 226.6 23. 47. 23. E197900300021 229.4 250. 170. 140. E197900300022 232.3 140. 120. 90. E197900300023 233.1 110. 140. 90. E197900300024 237.4 180. 130. 100. E197900300025 ENDDATA 14 0 E197900300026 ENDSUBENT 25 0 E197900399999 SUBENT E1979004 20061228 E041E197900400001 BIB 4 6 E197900400002 REACTION ((56-BA-138(36-KR-86,X)91-PA-222,,SIG)+ E197900400003 (56-BA-138(36-KR-86,X)89-AC-218,,SIG)) E197900400004 DECAY-DATA (91-PA-222,,A) E197900400005 (87-FR-214,,A) E197900400006 PART-DET (91-PA-222,89-AC-218) E197900400007 SAMPLE Target enrichment is 99.7%. E197900400008 ENDBIB 6 0 E197900400009 NOCOMMON 0 0 E197900400010 DATA 4 5 E197900400011 EN-CM DATA +ERR-T -ERR-T E197900400012 MEV NB NB NB E197900400013 222.9 3. 6. 3. E197900400014 225.3 13. 16. 10. E197900400015 226.6 7. 9. 6. E197900400016 229.4 6. 12. 6. E197900400017 237.4 8. 17. 8. E197900400018 ENDDATA 7 0 E197900400019 ENDSUBENT 18 0 E197900499999 SUBENT E1979005 20061228 E041E197900500001 BIB 4 6 E197900500002 REACTION ((56-BA-138(36-KR-86,3N)92-U-221,,SIG)+ E197900500003 (56-BA-138(36-KR-86,X)90-TH-217,,SIG)) E197900500004 DECAY-DATA (90-TH-217,,A) E197900500005 (88-RA-213,,A) E197900500006 PART-DET (92-U-221,90-TH-217) E197900500007 SAMPLE Target enrichment is 99.7%. E197900500008 ENDBIB 6 0 E197900500009 NOCOMMON 0 0 E197900500010 DATA 4 2 E197900500011 EN-CM DATA +ERR-T -ERR-T E197900500012 MEV NB NB NB E197900500013 237.4 79. 44. 40. E197900500014 240.8 33. 25. 20. E197900500015 ENDDATA 4 0 E197900500016 ENDSUBENT 15 0 E197900599999 SUBENT E1979006 20061228 E041E197900600001 BIB 4 7 E197900600002 REACTION ((56-BA-134(36-KR-86,N)92-U-219,,SIG)+ E197900600003 (56-BA-134(36-KR-86,X)90-TH-215,,SIG)) E197900600004 DECAY-DATA (90-TH-215,,A) E197900600005 (88-RA-211,,A) E197900600006 PART-DET (92-U-219,90-TH-215) E197900600007 SAMPLE Target enrichment is 88.1%. Contamination of Ba E197900600008 (135:5.31%, 136:1.21%, 137:1.07%, 138:4.26%) E197900600009 ENDBIB 7 0 E197900600010 NOCOMMON 0 0 E197900600011 DATA 4 1 E197900600012 EN-CM DATA +ERR-T -ERR-T E197900600013 MEV NB NB NB E197900600014 225.4 3. 6. 3. E197900600015 ENDDATA 3 0 E197900600016 ENDSUBENT 15 0 E197900699999 SUBENT E1979007 20061228 E041E197900700001 BIB 4 7 E197900700002 REACTION ((56-BA-134(36-KR-86,2N)92-U-218,,SIG)+ E197900700003 (56-BA-134(36-KR-86,X)90-TH-214,,SIG)) E197900700004 DECAY-DATA (90-TH-214,,A) E197900700005 (88-RA-210,,A) E197900700006 PART-DET (92-U-218,90-TH-214) E197900700007 SAMPLE Target enrichment is 88.1%. Contamination of Ba E197900700008 (135:5.31%, 136:1.21%, 137:1.07%, 138:4.26%) E197900700009 ENDBIB 7 0 E197900700010 NOCOMMON 0 0 E197900700011 DATA 4 1 E197900700012 EN-CM DATA +ERR-T -ERR-T E197900700013 MEV NB NB NB E197900700014 220.0 2. 5. 2. E197900700015 ENDDATA 3 0 E197900700016 ENDSUBENT 15 0 E197900799999 SUBENT E1979008 20061228 E041E197900800001 BIB 4 6 E197900800002 REACTION ((56-BA-134(36-KR-86,X)91-PA-218,,SIG)+ E197900800003 (56-BA-134(36-KR-86,X)89-AC-214,,SIG)) E197900800004 DECAY-DATA (89-AC-214,,A) E197900800005 PART-DET (91-PA-218,89-AC-214) E197900800006 SAMPLE Target enrichment is 88.1%. Contamination of Ba E197900800007 (135:5.31%, 136:1.21%, 137:1.07%, 138:4.26%) E197900800008 ENDBIB 6 0 E197900800009 NOCOMMON 0 0 E197900800010 DATA 4 2 E197900800011 EN-CM DATA +ERR-T -ERR-T E197900800012 MEV NB NB NB E197900800013 220.9 6. 12. 6. E197900800014 227.0 6. 13. 6. E197900800015 ENDDATA 4 0 E197900800016 ENDSUBENT 15 0 E197900899999 ENDENTRY 8 0 E197999999999