ENTRY E2200 20120614 E069E220000000001 SUBENT E2200001 20120614 E069E220000100001 BIB 12 47 E220000100002 TITLE Identification of 45 new neutron-rich isotopes E220000100003 produced by in-flight fission of a 238U beam at 345 E220000100004 MeV/nucleon E220000100005 AUTHOR (T.Ohnishi, T.Kubo, K.Kusaka, A.Yoshida, K.Yoshida, E220000100006 M.Ohtake, N.Fukuda, H.Takeda, D.Kameda, K.Tanaka, E220000100007 N.Inabe, Y.Yanagisawa, Y.Gono, H.Watanabe, H.Otsu, E220000100008 H.Baba, T.Ichihara, Y.Yamaguchi, M.Takechi, E220000100009 S.Nishimura, H.Ueno, A.Yoshimi, H.Sakurai, E220000100010 T.Motobayashi, T.Nakao, Y.Mizoi, M.Matsushita, K.Ieki,E220000100011 N.Kobayashi, K.Tanaka, Y.Kawada, N.Tanaka, S.Deguchi, E220000100012 Y.Satou, Y.Kondo, T.Nakamura, K.Yoshinaga, C.Ishii, E220000100013 H.Yoshii, Y.Miyashita, N.Uematsu, Y.Shiraki, E220000100014 T.Sumikama, J.Chiba, E.Ideguchi, A.Saito, T.Yamaguchi,E220000100015 I.Hachiuma, T.Suzuki, T.Moriguchi, A.Ozawa, T.Ohtsubo,E220000100016 M.A.Famiano, H.Geissel, A.S.Nettleton, O.B.Tarasov, E220000100017 D.P.Bazin, B.M.Sherrill, S.L.Manikonda, J.A.Nolen) E220000100018 INSTITUTE (2JPNIPC) RIKEN Nishina Center E220000100019 (2JPNTOK) Department of Physics E220000100020 (2JPNOEC) Department of Engineering Science E220000100021 (2JPNYOK) Department of Physics E220000100022 (2JPNTIT) Department of Physics E220000100023 (2JPNSUT) Faculty of Science and Technology E220000100024 (2JPNTOK) Center for Nuclear Study E220000100025 (2JPNSUU) Department of Physics E220000100026 (2JPNTSU) Institute of Physics E220000100027 (2JPNNII) Institute of Physics E220000100028 (1USAWMU) Department of Physics E220000100029 (2GERGSI) E220000100030 (1USAMSU) National Superconducting Cyclotron E220000100031 Laboratory(NSCL) E220000100032 (1USAANL) E220000100033 REFERENCE (J,JPJ,79,(7),073201,201007) E220000100034 INC-SOURCE - Charge of incident ion is 86+. E220000100035 - Ion source: 238U E220000100036 SAMPLE - Chemical-form of target is element. E220000100037 - Physical-form of target is solid. E220000100038 METHOD (ASEP,TOF,EDEG) E220000100039 FACILITY (LINAC,2JPNIPC) RILAC at RIBF E220000100040 (CYCLO,2JPNIPC) RRC, fRC, IRC and SRC cyclotron at E220000100041 RIBF E220000100042 DETECTOR (MAGSP,SCIN,GE,PPAC) BigRIPS separator, plastic E220000100043 scintillation counters used E220000100044 ERR-ANALYS (ERR-SYS) Uncertainty due to transmission efficiency E220000100045 and beam intensity. E220000100046 REL-REF (M,E2116001,T.Ohonishi+,J,JPJ,77,(8),083201,200808) E220000100047 HISTORY (20101125C) Ayano Makinaga E220000100048 (20120225U) On. INSTITUTE corrected. E220000100049 ENDBIB 47 0 E220000100050 COMMON 1 3 E220000100051 EN E220000100052 MEV/A E220000100053 345. E220000100054 ENDCOMMON 3 0 E220000100055 ENDSUBENT 54 0 E220000199999 SUBENT E2200002 20110518 E065E220000200001 BIB 5 8 E220000200002 REACTION (4-BE-9(92-U-238,F)ELEM/MASS,,SIG) E220000200003 INC-SOURCE Beam intensity: 0.20 particle-nA for G1, 0.25 E220000200004 particle-nA for G2 settings E220000200005 SAMPLE Target-thickness: Be target of 5.1 mm for G1, 2.9 mm E220000200006 for G2 setting E220000200007 FLAG (1.) G1 setting (Systematic uncertainty is about 50%.) E220000200008 (2.) G2 setting (Systematic uncertainty is about 40%.) E220000200009 STATUS (TABLE) Table.II of JPJ,vol.79,p073201,2010 E220000200010 ENDBIB 8 0 E220000200011 NOCOMMON 0 0 E220000200012 DATA 5 39 E220000200013 ELEMENT MASS DATA ERR-SYS FLAG E220000200014 NO-DIM NO-DIM PB PER-CENT NO-DIM E220000200015 25. 71. 4. 50. 1. E220000200016 26. 73. 6. 50. 1. E220000200017 26. 74. 1. 50. 1. E220000200018 27. 76. 8. 50. 1. E220000200019 28. 79. 5. 50. 1. E220000200020 29. 81. 70. 50. 1. E220000200021 29. 82. 3. 50. 1. E220000200022 30. 84. 43. 50. 1. E220000200023 30. 85. 2. 50. 1. E220000200024 31. 87. 19. 50. 1. E220000200025 32. 90. 6. 50. 1. E220000200026 34. 95. 20. 50. 1. E220000200027 35. 98. 10. 50. 1. E220000200028 36. 101. 10. 50. 1. E220000200029 37. 103. 110. 40. 2. E220000200030 38. 106. 15. 40. 2. E220000200031 38. 107. 1. 40. 2. E220000200032 39. 108. 97. 40. 2. E220000200033 39. 109. 4. 40. 2. E220000200034 40. 111. 20. 40. 2. E220000200035 40. 112. 7. 40. 2. E220000200036 41. 114. 11. 40. 2. E220000200037 41. 115. 3. 40. 2. E220000200038 42. 115. 1150. 40. 2. E220000200039 42. 116. 72. 40. 2. E220000200040 42. 117. 4. 40. 2. E220000200041 43. 119. 24. 40. 2. E220000200042 43. 120. 2. 40. 2. E220000200043 44. 121. 170. 40. 2. E220000200044 44. 122. 13. 40. 2. E220000200045 44. 123. 2. 40. 2. E220000200046 44. 124. 0.6 40. 2. E220000200047 45. 123. 1470. 40. 2. E220000200048 45. 124. 110. 40. 2. E220000200049 45. 125. 11. 40. 2. E220000200050 45. 126. 0.7 40. 2. E220000200051 46. 127. 80. 40. 2. E220000200052 46. 128. 12. 40. 2. E220000200053 48. 133. 26. 40. 2. E220000200054 ENDDATA 41 0 E220000200055 ENDSUBENT 54 0 E220000299999 SUBENT E2200003 20110518 E065E220000300001 BIB 5 6 E220000300002 REACTION (82-PB-0(92-U-238,F)ELEM/MASS,,SIG) E220000300003 INC-SOURCE Beam intensity is 0.22 particle-nA. E220000300004 SAMPLE Target-thickness: Pb target of 0.95 mm + Al 0.3 mm for E220000300005 G3 setting E220000300006 FLAG (3.) G3 setting (Systematic uncertainty is about 30%.) E220000300007 STATUS (TABLE) Table.II of JPJ,vol.79,p073201,2010 E220000300008 ENDBIB 6 0 E220000300009 NOCOMMON 0 0 E220000300010 DATA 5 6 E220000300011 ELEMENT MASS DATA ERR-SYS FLAG E220000300012 NO-DIM NO-DIM PB PER-CENT NO-DIM E220000300013 48. 133. 40. 30. 3. E220000300014 50. 138. 600. 30. 3. E220000300015 51. 140. 4300. 30. 3. E220000300016 52. 143. 300. 30. 3. E220000300017 53. 145. 3100. 30. 3. E220000300018 54. 148. 70. 30. 3. E220000300019 ENDDATA 8 0 E220000300020 ENDSUBENT 19 0 E220000399999 ENDENTRY 3 0 E220099999999