ENTRY E2360 20120614 E069E236000000001 SUBENT E2360001 20120614 E069E236000100001 BIB 12 33 E236000100002 TITLE Production and Decay Properties of 264Hs and 265Hs E236000100003 AUTHOR (N.Sato, H.Haba, T.Ichikawa, D.Kaji, Y.Kudou, E236000100004 K.Morimoto, K.Morita, K.Ozeki, T.Sumita, A.Yoneda, E236000100005 E.Ideguchi, H.Koura, A.Ozawa, T.Shinozuka, E236000100006 T.Yamaguchi, A.Yoshida) E236000100007 INSTITUTE (2JPNIPC) Nishina Center for Accelerator-Based Science E236000100008 (2JPNTOH) Department of Physics E236000100009 (2JPNSUT) Faculty of Science and Technology E236000100010 (2JPNTOK) Center for Nuclear Study E236000100011 (2JPNJAE) Advanced Science Research Center E236000100012 (2JPNTSU) Department of Physics E236000100013 (2JPNTOH) Cyclotron and Radioisotope Center E236000100014 (2JPNSUU) Department of Physics E236000100015 REFERENCE (J,JPJ,80,094201,201109) E236000100016 #doi:10.1143/JPSJ.80.094201 E236000100017 PART-DET (A) E236000100018 INC-SOURCE - Beam intensity is 4.5E+12 PPS. E236000100019 - Charge of incident ion is +13. E236000100020 SAMPLE - Chemical-form of target is element. E236000100021 - Physical-form of target is solid. E236000100022 - Backing is carbon. E236000100023 - Backing-thickness is 3.0E-02 mg/cm**2. E236000100024 METHOD (TOF) E236000100025 FACILITY (PRJFS,2JPNIPC) E236000100026 DETECTOR - E-RSL: for the alpha-particle detection E236000100027 - TOF detector E236000100028 (MAGSP) GARIS E236000100029 (PS) To determine the mass information of the E236000100030 implanted particles E236000100031 (SI) To detect alpha particles from the evaporation E236000100032 residues E236000100033 ERR-ANALYS (ERR-S) Statistical uncertainty E236000100034 HISTORY (20111207C) Tsubakihara E236000100035 ENDBIB 33 0 E236000100036 COMMON 1 3 E236000100037 E-RSL E236000100038 MEV E236000100039 0.04 E236000100040 ENDCOMMON 3 0 E236000100041 ENDSUBENT 40 0 E236000199999 SUBENT E2360002 20120614 E069E236000200001 BIB 3 7 E236000200002 REACTION (82-PB-208(26-FE-58,N)108-HS-265,,SIG) E236000200003 SAMPLE Target-thickness: 500 ug/cm2 for Eproj = 284.1, 287.0 E236000200004 and 294.1 MeV, 480 ug/cm2 for 285.5 MeV and 440 ug/cm2 E236000200005 for 290.0MeV, respectively E236000200006 (82-PB-208,ENR=0.984) E236000200007 1.07% 207Pb, 0.52% 206Pb, and 0.01% 204Pb E236000200008 STATUS (TABLE) Presented in TABLE II, J,JPJ,80,094201,201109 E236000200009 ENDBIB 7 0 E236000200010 NOCOMMON 0 0 E236000200011 DATA 4 5 E236000200012 EN DATA +ERR-S -ERR-S E236000200013 MEV PB PB PB E236000200014 284.1E+00 25.0E+00 1.300E+01 9.000E+00 E236000200015 285.5E+00 51.0E+00 4.600E+01 2.900E+01 E236000200016 287.0E+00 41.0E+00 1.200E+01 1.000E+01 E236000200017 290.0E+00 6.6E+00 1.520E+01 5.500E+00 E236000200018 294.1E+00 5.4E+00 7.400E+00 3.600E+00 E236000200019 ENDDATA 7 0 E236000200020 ENDSUBENT 19 0 E236000299999 SUBENT E2360003 20120614 E069E236000300001 BIB 3 5 E236000300002 REACTION (82-PB-208(26-FE-58,2N)108-HS-264,,SIG) E236000300003 SAMPLE Target-thickness is 5.0E-1 mg/cm**2. E236000300004 (82-PB-208,ENR=0.984) E236000300005 1.07% 207Pb, 0.52% 206Pb, and 0.01% 204Pb E236000300006 STATUS (TABLE) Presented in TABLE II, J,JPJ,80,094201,201109 E236000300007 ENDBIB 5 0 E236000300008 NOCOMMON 0 0 E236000300009 DATA 4 1 E236000300010 EN DATA +ERR-S -ERR-S E236000300011 MEV PB PB PB E236000300012 294.1E+00 2.8E+00 6.500E+00 2.300E+00 E236000300013 ENDDATA 3 0 E236000300014 ENDSUBENT 13 0 E236000399999 SUBENT E2360004 20120614 E069E236000400001 BIB 3 4 E236000400002 REACTION (82-PB-207(26-FE-58,N)108-HS-264,,SIG) E236000400003 SAMPLE Target-thickness is 4.30E-01 mg/cm**2. E236000400004 (82-PB-207,ENR=0.98) E236000400005 STATUS (TABLE) Presented in TABLE II, J,JPJ,80,094201,201109 E236000400006 ENDBIB 4 0 E236000400007 NOCOMMON 0 0 E236000400008 DATA 4 1 E236000400009 EN DATA +ERR-S -ERR-S E236000400010 MEV PB PB PB E236000400011 285.5E+00 6.9E+00 4.400E+00 3.100E+00 E236000400012 ENDDATA 3 0 E236000400013 ENDSUBENT 12 0 E236000499999 ENDENTRY 4 0 E236099999999