ENTRY E2542 20171212 E112E254200000001 SUBENT E2542001 20171212 E112E254200100001 BIB 11 24 E254200100002 TITLE Decay measurement of 283Cn produced in the E254200100003 238U(48Ca,3n) reaction using GARIS-ll E254200100004 AUTHOR (D.Kaji, K.Morimoto, H.Haba, Y.Wakabayashi, M.Takeyama,E254200100005 S.Yamaki, Y.Komori, S.Yanou, S.Goto, K.Morita) E254200100006 INSTITUTE (2JPNIPC) RIKEN Nishina Center for Accelerator-Based E254200100007 Science E254200100008 (2JPNYMG) Department of Physics E254200100009 (2JPNSUU) Department of Physics E254200100010 (2JPNNII) Graduate School of Science and Technology E254200100011 (2JPNKYU) Department of Physics E254200100012 REFERENCE (J,JPJ,86,085001,2017) E254200100013 DECAY-DATA (112-CN-283,6.9SEC,A,9450.,, E254200100014 SF) E254200100015 INC-SOURCE Charge of incident ion is 11. E254200100016 SAMPLE - Chemical-form of target: 238U3O8 E254200100017 - Physical-form of target is solid. E254200100018 - Target-thickness is 0.312 mg/cm2. E254200100019 - Backing: Ti E254200100020 - Backing-thickness: 3 micro g E254200100021 METHOD (TOF) E254200100022 FACILITY (LINAC,2JPNIPC) RILAC at Nishina Center E254200100023 DETECTOR (SI) Double sided Si detector E254200100024 (MAGSP) GARIS-II E254200100025 HISTORY (20171212C) Ichiko E254200100026 ENDBIB 24 0 E254200100027 COMMON 1 3 E254200100028 EN E254200100029 MEV E254200100030 251.8 E254200100031 ENDCOMMON 3 0 E254200100032 ENDSUBENT 31 0 E254200199999 SUBENT E2542002 20171212 E112E254200200001 BIB 3 3 E254200200002 REACTION (92-U-238(20-CA-48,3N)112-CN-283,,SIG) E254200200003 ERR-ANALYS (DATA-ERR) No information on source of uncertainties E254200200004 STATUS (TABLE) Presented in J,Phys. Soc.Jpn 86,085001,2017 E254200200005 ENDBIB 3 0 E254200200006 NOCOMMON 0 0 E254200200007 DATA 3 1 E254200200008 DATA +DATA-ERR -DATA-ERR E254200200009 PB PB PB E254200200010 2.0 2.7 1.3 E254200200011 ENDDATA 3 0 E254200200012 ENDSUBENT 11 0 E254200299999 ENDENTRY 2 0 E254299999999