ENTRY F1287 20161003 F063F128700000001 SUBENT F1287001 20161003 F063F128700100001 BIB 11 22 F128700100002 TITLE Excitation function of the Cr(nat)(P,X)Ti-44, F128700100003 Ni(nat)(P,X)Ti-44 and Nb-93(P,X)Ti-44 reactions at F128700100004 energies up to 2.6 GeV. F128700100005 AUTHOR (Yu.E.Titarenko,V.F.Batyaev,K.V.Pavlov,A.Yu.Titarenko, F128700100006 V.M.Zhivun,M.V.Chauzova,S.A.Balyuk,P.V.Bebenin, F128700100007 A.V.Ignatyuk,S.G.Mashnik,S.Leray,A.Boudard,J.C.David, F128700100008 D.Mancusi,J.Cugnon,Y.Yariv,K.Nishihara,N.Matsuda, F128700100009 H.Kumawat,A.Yu.Stankovskiy) F128700100010 INSTITUTE (4RUSITE,4RUSMIF,4RUSFEI,1USALAS,2FR SAC,2BLGLIE, F128700100011 3ISLSOR,2JPNJAE,3INDTRM,2BLGMOL) F128700100012 REFERENCE (J,NIM/A,821,136,2016) F128700100013 #doi:10.1016/j.nima.2016.03.046 F128700100014 FACILITY (SYNCH,4RUSITE) F128700100015 DETECTOR (SPEC,GE) Low energy detector with a resolution of F128700100016 500 eV at the 122 keV gamma-line of Co-57. F128700100017 METHOD (GSPEC) F128700100018 DECAY-DATA (22-TI-44,59.1YR,DG,67.868,0.93, F128700100019 DG,78.323,0.964) F128700100020 REL-REF (R,,J.Chen+,J,NDS,112,(9),2357,2011) Decay-data are F128700100021 presented. F128700100022 ERR-ANALYS (DATA-ERR) No source of uncertainties is given F128700100023 HISTORY (20161003C) F128700100024 ENDBIB 22 0 F128700100025 NOCOMMON 0 0 F128700100026 ENDSUBENT 25 0 F128700199999 SUBENT F1287002 20161003 F063F128700200001 BIB 4 20 F128700200002 REACTION (24-CR-0(P,X)22-TI-44,CUM,SIG) F128700200003 REL-REF (M,A0901001,Yu.E.Titarenko+,J,PAN,74,523,2011) F128700200004 Description of a sample is given. F128700200005 SAMPLE Samples with a diameter of 10.5-mm were made of F128700200006 natural chromium Cr-50 4.31%, Cr-52 87.76%, F128700200007 Cr-53 9.55% and Cr-54 2.38% F128700200008 Thicknesses: at 0.042-GeV protons -330.8 mg, F128700200009 at 0.066-GeV protons -332.3 mg, F128700200010 at 0.097-GeV protons -338.4 mg, F128700200011 at 0.148-GeV protons -336.9 mg, F128700200012 at 0.248-GeV protons -339.8 mg, F128700200013 at 0.399-GeV protons -322.2 mg, F128700200014 at 0.599-GeV protons -328.9 mg, F128700200015 at 0.799-GeV protons -337.4 mg, F128700200016 at 1.198-GeV protons -340.3 mg, F128700200017 at 1.598-GeV protons -338.6 mg, F128700200018 at 2.605-GeV protons -366.1 mg. F128700200019 The total amount of chemical impurities in Cr samples F128700200020 were no more than 0.19%. F128700200021 STATUS (TABLE) Table 1. F128700200022 ENDBIB 20 0 F128700200023 NOCOMMON 0 0 F128700200024 DATA 3 10 F128700200025 EN DATA DATA-ERR F128700200026 GEV MB MB F128700200027 0.07 0.405 0.038 F128700200028 0.1 1.40 0.12 F128700200029 0.15 1.63 0.15 F128700200030 0.25 1.59 0.15 F128700200031 0.4 1.74 0.17 F128700200032 0.6 1.91 0.16 F128700200033 0.8 1.55 0.16 F128700200034 1.2 1.39 0.12 F128700200035 1.6 1.24 0.11 F128700200036 2.6 0.753 0.072 F128700200037 ENDDATA 12 0 F128700200038 ENDSUBENT 37 0 F128700299999 SUBENT F1287003 20161003 F063F128700300001 BIB 4 20 F128700300002 REACTION (26-FE-56(P,X)22-TI-44,CUM,SIG) F128700300003 REL-REF (M,A0901001,Yu.E.Titarenko+,J,PAN,74,523,2011) F128700300004 Description of a sample is given. F128700300005 SAMPLE Samples with a diameter of 10.5-mm were made of F128700300006 enriched iron Fe-54 0.3%,Fe-56 99.5+-0.1, Fe-57 0.2% F128700300007 and less than 0.05 of Fe-58. F128700300008 Thicknesses: at 0.046-GeV protons -240.1 mg, F128700300009 at 0.068-GeV protons -239.6 mg, F128700300010 at 0.099-GeV protons -259.2 mg, F128700300011 at 0.149-GeV protons -216.4 mg, F128700300012 at 0.249-GeV protons -244.7 mg, F128700300013 at 0.400-GeV protons -270.4 mg, F128700300014 at 0.600-GeV protons -239.8 mg, F128700300015 at 0.799-GeV protons -245.4 mg, F128700300016 at 1.199-GeV protons -243.0 mg, F128700300017 at 1.598-GeV protons -247.4 mg, F128700300018 at 2.605-GeV protons -243.3 mg. F128700300019 The total amount of chemical impurities in Fe samples F128700300020 were no more than 0.00001%. F128700300021 STATUS (TABLE) Table 2. F128700300022 ENDBIB 20 0 F128700300023 NOCOMMON 0 0 F128700300024 DATA 3 11 F128700300025 EN DATA DATA-ERR F128700300026 GEV MB MB F128700300027 0.1 0.073 0.031 F128700300028 0.15 0.284 0.047 F128700300029 0.25 0.641 0.064 F128700300030 0.3 0.994 0.079 F128700300031 0.4 1.12 0.11 F128700300032 0.6 1.38 0.13 F128700300033 0.75 1.59 0.14 F128700300034 0.8 1.32 0.12 F128700300035 1.2 1.36 0.13 F128700300036 1.6 1.40 0.13 F128700300037 2.6 0.95 0.10 F128700300038 ENDDATA 13 0 F128700300039 ENDSUBENT 38 0 F128700399999 SUBENT F1287004 20161003 F063F128700400001 BIB 4 20 F128700400002 REACTION (28-NI-0(P,X)22-TI-44,CUM,SIG) F128700400003 REL-REF (M,A0906001,Yu.E.Titarenko+,J,PAN,74,537,2011) F128700400004 Description ofa sample is given. F128700400005 SAMPLE Thin Ni-nat samples in assembly with Al monitors were F128700400006 used. The samples were manufactured by cutting from F128700400007 a metallic foil. The total amount of chemical F128700400008 impurities in Ni samples were no more than 0.013%. F128700400009 Ni-nat(mg) Monitor mass(mg)F128700400010 Thicknesses: at 0.043-GeV protons -205.7 mg, 48.0 F128700400011 at 0.066-GeV protons -205.6 mg, 49.8 F128700400012 at 0.097-GeV protons -203.5 mg, 48.5 F128700400013 at 0.148-GeV protons -206.6 mg, 24.7 F128700400014 at 0.249-GeV protons -206.5 mg, 49.1 F128700400015 at 0.399-GeV protons -206.8 mg, 58.2 F128700400016 at 0.599-GeV protons -206.7 mg, 58.8 F128700400017 at 0.799-GeV protons -205.4 mg, 58.9 F128700400018 at 1.199-GeV protons -205.4 mg, 59.0 F128700400019 at 1.598-GeV protons -205.4 mg, 59.3 F128700400020 at 2.605-GeV protons -205.9 mg. 58.9 F128700400021 STATUS (TABLE) Table 3. F128700400022 ENDBIB 20 0 F128700400023 NOCOMMON 0 0 F128700400024 DATA 3 9 F128700400025 EN DATA DATA-ERR F128700400026 GEV MB MB F128700400027 0.1 0.089 0.020 F128700400028 0.15 0.248 0.044 F128700400029 0.25 0.643 0.074 F128700400030 0.4 1.37 0.17 F128700400031 0.6 2.40 0.25 F128700400032 0.8 2.39 0.24 F128700400033 1.2 2.59 0.24 F128700400034 1.6 2.18 0.21 F128700400035 2.6 1.68 0.17 F128700400036 ENDDATA 11 0 F128700400037 ENDSUBENT 36 0 F128700499999 SUBENT F1287005 20161003 F063F128700500001 BIB 4 20 F128700500002 REACTION (41-NB-93(P,X)22-TI-44,CUM,SIG) F128700500003 REL-REF (M,A0906001,Yu.E.Titarenko+,J,PAN,74,537,2011) F128700500004 Description of a sample is given. F128700500005 SAMPLE Thin Nb-93 samples in assembly with Al monitors were F128700500006 used. The samples were manufactured by cutting from F128700500007 a metallic foil. The total amount of chemical F128700500008 impurities in Nb samples were no more than 0.026%. F128700500009 Nb-93(mg) Monitor mass(mg) F128700500010 Thicknesses: at 0.046-GeV protons -189.4 mg, 48.3 F128700500011 at 0.068-GeV protons -186.9 mg, 48.3 F128700500012 at 0.099-GeV protons -189.7 mg, 49.7 F128700500013 at 0.149-GeV protons -190.9 mg, 48.0 F128700500014 at 0.249-GeV protons -189.0 mg, 49.0 F128700500015 at 0.400-GeV protons -189.9 mg, 58.3 F128700500016 at 0.600-GeV protons -189.5 mg, 58.4 F128700500017 at 0.799-GeV protons -189.3 mg, 59.0 F128700500018 at 1.199-GeV protons -190.1 mg, 59.0 F128700500019 at 1.599-GeV protons -189.5 mg, 59.0 F128700500020 at 2.605-GeV protons -189.2 mg. 59.2 F128700500021 STATUS (TABLE) Table 4. F128700500022 ENDBIB 20 0 F128700500023 NOCOMMON 0 0 F128700500024 DATA 3 3 F128700500025 EN DATA DATA-ERR F128700500026 GEV MB MB F128700500027 1.2 0.015 0.015 F128700500028 1.6 0.084 0.039 F128700500029 2.6 0.109 0.037 F128700500030 ENDDATA 5 0 F128700500031 ENDSUBENT 30 0 F128700599999 ENDENTRY 5 0 F128799999999